CL2018000146A1 - Dispositivo y sistema de medida óptica del coeficiente de reflexión de una superficie - Google Patents

Dispositivo y sistema de medida óptica del coeficiente de reflexión de una superficie

Info

Publication number
CL2018000146A1
CL2018000146A1 CL2018000146A CL2018000146A CL2018000146A1 CL 2018000146 A1 CL2018000146 A1 CL 2018000146A1 CL 2018000146 A CL2018000146 A CL 2018000146A CL 2018000146 A CL2018000146 A CL 2018000146A CL 2018000146 A1 CL2018000146 A1 CL 2018000146A1
Authority
CL
Chile
Prior art keywords
reflection coefficient
optical measurement
measurement system
photodetector
optical
Prior art date
Application number
CL2018000146A
Other languages
English (en)
Inventor
Vila Carlos Heras
Ariz Iñigo Salinas
Esteban Rafael Alonso
Nuñez David Izquierdo
Sanz Noelia Martinez
Garcia Carlos Alcañiz
Gil Cristina Pelayo
Escobar Víctor Zarza
Original Assignee
Abengoa Solar New Tech Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abengoa Solar New Tech Sa filed Critical Abengoa Solar New Tech Sa
Publication of CL2018000146A1 publication Critical patent/CL2018000146A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Abstract

<p>DISPOSITIVO DE MEDIDA ÓPTICA DEL COEFICIENTE DE REFLEXIÓN DE UNA SUPERFICIE QUE COMPRENDE UNO O MÁS CANALES ÓPTICOS, UN PRIMER FOTODETECTOR, UN DIAFRAGMA, UNA LENTE Y UN SEGUNDO FOTODETECTOR PARA MEDIR LA SEÑAL DEL HAZ DE ILUMINACIÓN REFLEJADO POR LA SUPERFICIE A MEDIR; SISTEMA; PROCEDIMIENTO.</p>
CL2018000146A 2015-07-30 2018-01-18 Dispositivo y sistema de medida óptica del coeficiente de reflexión de una superficie CL2018000146A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201531138A ES2603650B1 (es) 2015-07-30 2015-07-30 Dispositivo y sistema de medida óptica del coeficiente de reflexión de una superficie

Publications (1)

Publication Number Publication Date
CL2018000146A1 true CL2018000146A1 (es) 2018-05-18

Family

ID=57885354

Family Applications (1)

Application Number Title Priority Date Filing Date
CL2018000146A CL2018000146A1 (es) 2015-07-30 2018-01-18 Dispositivo y sistema de medida óptica del coeficiente de reflexión de una superficie

Country Status (6)

Country Link
CN (1) CN108449967A (es)
CL (1) CL2018000146A1 (es)
ES (1) ES2603650B1 (es)
MA (1) MA41924B1 (es)
WO (1) WO2017017297A1 (es)
ZA (1) ZA201800744B (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3073943B1 (fr) * 2017-11-22 2020-05-29 Commissariat A L'energie Atomique Et Aux Energies Alternatives Systeme de surveillance de la degradation et de l'encrassement d'un miroir
EP3736550A1 (en) * 2019-05-10 2020-11-11 X-Rite Switzerland GmbH Illumination device for a spectrophotometer having integrated mixing optics, and method for illuminating a sample
CN110646169B (zh) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 曲面光学薄膜元件反射率测量方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2560377B1 (fr) * 1984-02-29 1988-05-13 Commissariat Energie Atomique Dispositif optique de mesure de proximite de surface et son application au releve du profil d'une surface
JPH04329334A (ja) * 1991-05-01 1992-11-18 Olympus Optical Co Ltd 屈折率分布測定装置
ES2372191B1 (es) * 2010-02-25 2012-09-06 Abengoa Solar New Technologies, S.A. Espectrofotómetro portátil y método de caracterización de tubos de colectores solares.
ES2375386B1 (es) * 2010-07-21 2012-09-27 Abengoa Solar New Technologies, S.A. Reflectómetro portátil y método de caracterización de espejos de centrales termosolares.
ES2366290B1 (es) * 2010-10-20 2012-08-27 Abengoa Solar New Technologies S.A. Espectrofotómetro para caracterización óptica automatizada de tubos colectores solares y método de funcionamiento.
CN102539387A (zh) * 2011-12-28 2012-07-04 北京奥博泰科技有限公司 一种测量玻璃反射比的方法和装置
ES2533778B1 (es) * 2013-09-13 2016-02-02 Abengoa Solar New Technologies S.A. Espectrofotómetro para caracterización de receptores de colectores solares
CN204255502U (zh) * 2015-01-14 2015-04-08 中国计量学院 一种基于led光源的反射光谱测量仪
CN104792710B (zh) * 2015-04-13 2018-08-03 杭州远方光电信息股份有限公司 一种物体光学特性测量装置

Also Published As

Publication number Publication date
CN108449967A (zh) 2018-08-24
WO2017017297A1 (es) 2017-02-02
ES2603650B1 (es) 2017-09-05
MA41924A1 (fr) 2018-09-28
ES2603650A1 (es) 2017-02-28
ZA201800744B (en) 2018-12-19
MA41924B1 (fr) 2019-03-29

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