EA033450B1 - Система и способ рентгеновского досмотра физических лиц с определением дозы облучения, превышающей пороговое значение - Google Patents

Система и способ рентгеновского досмотра физических лиц с определением дозы облучения, превышающей пороговое значение

Info

Publication number
EA033450B1
EA033450B1 EA201300364A EA201300364A EA033450B1 EA 033450 B1 EA033450 B1 EA 033450B1 EA 201300364 A EA201300364 A EA 201300364A EA 201300364 A EA201300364 A EA 201300364A EA 033450 B1 EA033450 B1 EA 033450B1
Authority
EA
Eurasian Patent Office
Prior art keywords
radiant energy
source
data
dose
conveyance
Prior art date
Application number
EA201300364A
Other languages
English (en)
Other versions
EA033450B9 (ru
EA201300364A1 (ru
Inventor
Axel Scholling
Original Assignee
Smiths Heimann Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smiths Heimann Gmbh filed Critical Smiths Heimann Gmbh
Publication of EA201300364A1 publication Critical patent/EA201300364A1/ru
Publication of EA033450B1 publication Critical patent/EA033450B1/ru
Publication of EA033450B9 publication Critical patent/EA033450B9/ru

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Предлагаются способы и системы рентгеновского досмотра. Система может включать в себя источник энергии излучения, выполненный так, чтобы энергия излучения пересекала объём сканирования. Система может дополнительно включать в себя фильтр между источником и объёмом сканирования, устройство транспортировки, выполненное с возможностью придания относительного движения объекту с ограничением по экспозиции и объёму сканирования, монитор транспортировки, выполненный с возможностью генерирования данных транспортировки, отражающих состояние транспортировки объекта с ограничением по экспозиции, датчик энергии излучения, выполненный с возможностью измерения энергия излучения от источника и генерирования данных энергии излучения источника, и контроллер дозы, выполненный с возможностью получения данных транспортировки, данных энергии излучения источника и сигнала, соответствующего данным дозы объекта, и генерирования показателя получения по меньшей мере частью объекта с ограничением по экспозиции дозы энергии излучения выше порогового значения дозы.
EA201300364A 2010-09-17 2011-09-16 Система и способ рентгеновского досмотра физических лиц с определением дозы облучения, превышающей пороговое значение EA033450B9 (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US38423010P 2010-09-17 2010-09-17
PCT/IB2011/002752 WO2012035440A2 (en) 2010-09-17 2011-09-16 System and method for x-ray inspection

Publications (3)

Publication Number Publication Date
EA201300364A1 EA201300364A1 (ru) 2013-08-30
EA033450B1 true EA033450B1 (ru) 2019-10-31
EA033450B9 EA033450B9 (ru) 2020-04-10

Family

ID=45373720

Family Applications (1)

Application Number Title Priority Date Filing Date
EA201300364A EA033450B9 (ru) 2010-09-17 2011-09-16 Система и способ рентгеновского досмотра физических лиц с определением дозы облучения, превышающей пороговое значение

Country Status (5)

Country Link
US (1) US8971486B2 (ru)
EP (1) EP2616798B1 (ru)
CN (1) CN103403534B (ru)
EA (1) EA033450B9 (ru)
WO (1) WO2012035440A2 (ru)

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US8971486B2 (en) 2010-09-17 2015-03-03 Smiths Heimann Gmbh System and method for x-ray inspection
CN104865281B (zh) 2014-02-24 2017-12-12 清华大学 人体背散射检查方法和系统
WO2016195684A1 (en) * 2015-06-04 2016-12-08 Siemens Healthcare Gmbh Apparatus and methods for a projection display device on x-ray imaging devices
CN105137499B (zh) * 2015-09-28 2018-09-21 同方威视技术股份有限公司 局部图像增强扫描系统及方法
CA167870S (en) * 2015-12-11 2016-11-30 Univ Tsinghua Human body safety inspection instrument
CN105717548A (zh) * 2015-12-28 2016-06-29 同方威视技术股份有限公司 人体安全检查系统及使用该系统的人体安全检查方法
GB2556117B (en) * 2016-11-22 2020-09-02 Smiths Heimann Gmbh Method and apparatus
WO2019090054A1 (en) 2017-11-02 2019-05-09 Idss Holdings, Inc. Method and apparatus to reduce radiation emissions on a parcel scanning system
JP7308827B2 (ja) * 2017-11-17 2023-07-14 フォト・ダイアグノスティック・システムズ,インコーポレイテッド 高められたx線遮蔽を伴うコンピュータ断層撮影(ct)セキュリティ検査システム
US20190346379A1 (en) * 2018-05-10 2019-11-14 Voti Inc. X-ray screening system and method
CN109031285B (zh) * 2018-09-03 2020-12-08 嘉兴腓特烈太赫科技有限公司 一种带有人像存储与分析功能的便于车载式太赫兹安检仪
WO2020082171A1 (en) 2018-10-22 2020-04-30 Voti Inc. Tray insert for screening tray
US11039808B2 (en) * 2019-02-13 2021-06-22 Analogic Corporation Scanning systems configured to inspect conveyed objects and related systems and methods
US10976467B2 (en) * 2019-06-28 2021-04-13 Fisher Research Labs, Llc Walk-through detector systems and methods
US11193898B1 (en) * 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
US11885752B2 (en) 2021-06-30 2024-01-30 Rapiscan Holdings, Inc. Calibration method and device therefor
CN113848219A (zh) * 2021-09-09 2021-12-28 齐鲁中科电工先进电磁驱动技术研究院 一种基于造布生产的调控方法、装置及造布调控系统

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US20050089137A1 (en) * 2003-10-27 2005-04-28 Toth Thomas L. System and method of collecting imaging subject positioning information for x-ray flux control
WO2010044774A1 (en) * 2008-10-14 2010-04-22 Analogic Corporation Radiation modulation in a security examination apparatus
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WO2010044774A1 (en) * 2008-10-14 2010-04-22 Analogic Corporation Radiation modulation in a security examination apparatus
US20110274249A1 (en) * 2010-03-14 2011-11-10 Stephen Gray Personnel Screening System

Also Published As

Publication number Publication date
WO2012035440A3 (en) 2012-05-24
CN103403534B (zh) 2016-06-29
EP2616798A2 (en) 2013-07-24
EP2616798B1 (en) 2017-12-27
EA033450B9 (ru) 2020-04-10
CN103403534A (zh) 2013-11-20
US20120069964A1 (en) 2012-03-22
WO2012035440A2 (en) 2012-03-22
EA201300364A1 (ru) 2013-08-30
US8971486B2 (en) 2015-03-03

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