DK606585D0 - Fremgangsmaade og apparat til maaling af kvantitativ straalings absorption - Google Patents
Fremgangsmaade og apparat til maaling af kvantitativ straalings absorptionInfo
- Publication number
- DK606585D0 DK606585D0 DK606585A DK606585A DK606585D0 DK 606585 D0 DK606585 D0 DK 606585D0 DK 606585 A DK606585 A DK 606585A DK 606585 A DK606585 A DK 606585A DK 606585 D0 DK606585 D0 DK 606585D0
- Authority
- DK
- Denmark
- Prior art keywords
- radiation absorption
- measuring quantitative
- quantitative radiation
- measuring
- absorption
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8500600A FR2576102B1 (fr) | 1985-01-16 | 1985-01-16 | Procede et dispositif de tomodensitometrie quantitative |
| FR8500600 | 1985-01-16 |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| DK606585D0 true DK606585D0 (da) | 1985-12-23 |
| DK606585A DK606585A (da) | 1986-07-17 |
| DK164416B DK164416B (da) | 1992-06-22 |
| DK164416C DK164416C (da) | 1992-11-16 |
Family
ID=9315344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK606585A DK164416C (da) | 1985-01-16 | 1985-12-23 | Fremgangsmaade til industriel kvantitativ maaling af et emnes taethedsfordeling |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5039856A (da) |
| EP (1) | EP0190067B1 (da) |
| JP (1) | JPS61167849A (da) |
| CA (1) | CA1257014A (da) |
| DE (1) | DE3669592D1 (da) |
| DK (1) | DK164416C (da) |
| ES (1) | ES8702653A1 (da) |
| FR (1) | FR2576102B1 (da) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1301371C (en) * | 1988-08-23 | 1992-05-19 | Jan Erik Aune | Log scanner |
| DD298677A5 (de) * | 1989-11-16 | 1992-03-05 | ��������`������������@�������@�������@M�������]k�� | Verfahren zur bestimmung des volumenflusses |
| JP3142079B2 (ja) * | 1992-03-19 | 2001-03-07 | 株式会社日立製作所 | 光ｃｔ装置 |
| GB2452187B (en) * | 2004-11-26 | 2009-05-20 | Nuctech Co Ltd | Computed Tomography apparatus for detecting unsafe liquids |
| US7551708B2 (en) * | 2007-02-07 | 2009-06-23 | General Electric Company | Method of iterative reconstruction for energy discriminating computed tomography systems |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2222642B1 (da) * | 1973-03-19 | 1976-05-21 | Commissariat Energie Atomique | |
| DE2556012A1 (de) * | 1975-12-12 | 1977-06-16 | Philips Patentverwaltung | Verfahren und anordnung zur ermittlung der raeumlichen verteilung einer strahlung in einer ebene eines koerpers |
| DE2846702C2 (de) * | 1978-10-26 | 1983-11-17 | Habermehl, Adolf, Prof. Dr., 3550 Marburg | Verfahren und Vorrichtung für die zerstörungsfreie Materialprüfung, insbesondere zum Feststellen der Rotfäule und anderer Baumerkrankungen in den Stämmen lebender Bäume |
| NL7902015A (nl) * | 1979-03-14 | 1980-09-16 | Philips Nv | Werkwijze en inrichting voor het bepalen van een stralingsabsorptieverdeling in een deel van een lichaam. |
| JPS6042401B2 (ja) * | 1979-09-26 | 1985-09-21 | 富士電機株式会社 | 管状材の管壁厚み測定方法 |
| FR2496934A1 (fr) * | 1980-12-18 | 1982-06-25 | Thomson Csf | Appareil de tomographie axiale transverse a calculateur analogique |
| FR2512553A1 (fr) * | 1981-09-10 | 1983-03-11 | Commissariat Energie Atomique | Systeme de controle non destructif de la structure interne d'objets |
| US4511801A (en) * | 1982-07-19 | 1985-04-16 | Bethlehem Steel Corporation | Radiation scanning and measuring device |
-
1985
- 1985-01-16 FR FR8500600A patent/FR2576102B1/fr not_active Expired
- 1985-12-23 DK DK606585A patent/DK164416C/da not_active IP Right Cessation
- 1985-12-31 ES ES551181A patent/ES8702653A1/es not_active Expired
-
1986
- 1986-01-08 CA CA000499231A patent/CA1257014A/fr not_active Expired
- 1986-01-09 US US06/817,415 patent/US5039856A/en not_active Expired - Fee Related
- 1986-01-13 EP EP86400059A patent/EP0190067B1/fr not_active Expired - Lifetime
- 1986-01-13 DE DE8686400059T patent/DE3669592D1/de not_active Expired - Fee Related
- 1986-01-14 JP JP61004424A patent/JPS61167849A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR2576102B1 (fr) | 1987-02-06 |
| ES8702653A1 (es) | 1987-01-01 |
| EP0190067A1 (fr) | 1986-08-06 |
| EP0190067B1 (fr) | 1990-03-14 |
| DK164416C (da) | 1992-11-16 |
| DK606585A (da) | 1986-07-17 |
| ES551181A0 (es) | 1987-01-01 |
| US5039856A (en) | 1991-08-13 |
| DK164416B (da) | 1992-06-22 |
| JPS61167849A (ja) | 1986-07-29 |
| DE3669592D1 (de) | 1990-04-19 |
| CA1257014A (fr) | 1989-07-04 |
| FR2576102A1 (fr) | 1986-07-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PBP | Patent lapsed |