DK385174A - - Google Patents

Info

Publication number
DK385174A
DK385174A DK385174A DK385174A DK385174A DK 385174 A DK385174 A DK 385174A DK 385174 A DK385174 A DK 385174A DK 385174 A DK385174 A DK 385174A DK 385174 A DK385174 A DK 385174A
Authority
DK
Denmark
Application number
DK385174A
Other languages
Danish (da)
Inventor
O Eberspecher
H Pfisterer
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of DK385174A publication Critical patent/DK385174A/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21FPROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00Shielding characterised by the composition of the materials
    • G21F1/02Selection of uniform shielding materials
    • G21F1/08Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Metallurgy (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK385174A 1973-07-18 1974-07-17 DK385174A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19732336652 DE2336652A1 (de) 1973-07-18 1973-07-18 Schichtsystem zur absorption von roentgenstrahlen

Publications (1)

Publication Number Publication Date
DK385174A true DK385174A (fr) 1975-03-10

Family

ID=5887354

Family Applications (1)

Application Number Title Priority Date Filing Date
DK385174A DK385174A (fr) 1973-07-18 1974-07-17

Country Status (9)

Country Link
US (1) US3925678A (fr)
JP (1) JPS5044882A (fr)
BE (1) BE817811A (fr)
DE (1) DE2336652A1 (fr)
DK (1) DK385174A (fr)
FR (1) FR2238218B3 (fr)
IT (1) IT1017127B (fr)
LU (1) LU70538A1 (fr)
NL (1) NL7409479A (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
WO1986002164A1 (fr) * 1984-10-05 1986-04-10 Kawasaki Steel Corporation Procede permettant de determiner l'epaisseur et la composition d'un film en alliage
US4821301A (en) * 1986-02-28 1989-04-11 Duke University X-ray reflection method and apparatus for chemical analysis of thin surface layers
WO2002006792A2 (fr) * 2000-07-18 2002-01-24 Uop Llc Procede de preparation d'echantillons en parallele
US6806093B2 (en) * 2000-07-18 2004-10-19 Uop Llc Process of parallel sample preparation
US6677162B1 (en) 2000-07-18 2004-01-13 Uop Llc Process of parallel sample preparation
US7341414B2 (en) * 2005-05-02 2008-03-11 Cummins Inc. Fastener and method for reducing stress failure in an engine component
DE102011109822B4 (de) * 2011-08-09 2019-10-10 Ketek Gmbh Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung
US20230251214A1 (en) * 2020-07-14 2023-08-10 Shimadzu Corporation X ray fluorescence analyzer

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644736A (en) * 1968-11-05 1972-02-22 Giken Kogyo Kk Back-scattering absorber materials for gamma-rays

Also Published As

Publication number Publication date
FR2238218B3 (fr) 1977-05-06
DE2336652A1 (de) 1975-01-30
IT1017127B (it) 1977-07-20
NL7409479A (nl) 1975-01-21
LU70538A1 (fr) 1974-11-28
BE817811A (fr) 1974-11-18
FR2238218A1 (fr) 1975-02-14
US3925678A (en) 1975-12-09
JPS5044882A (fr) 1975-04-22

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