DK3623789T3 - Fremgangsmåde til ikke-linearitetsmåling og indretning til ikke-linearitetsmåling - Google Patents

Fremgangsmåde til ikke-linearitetsmåling og indretning til ikke-linearitetsmåling Download PDF

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Publication number
DK3623789T3
DK3623789T3 DK18798419.0T DK18798419T DK3623789T3 DK 3623789 T3 DK3623789 T3 DK 3623789T3 DK 18798419 T DK18798419 T DK 18798419T DK 3623789 T3 DK3623789 T3 DK 3623789T3
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DK
Denmark
Prior art keywords
linearity measurement
facility
procedure
linearity
measurement
Prior art date
Application number
DK18798419.0T
Other languages
English (en)
Inventor
Takemi Hasegawa
Tetsuya Hayashi
Original Assignee
Sumitomo Electric Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries filed Critical Sumitomo Electric Industries
Application granted granted Critical
Publication of DK3623789T3 publication Critical patent/DK3623789T3/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/02—Optical fibres with cladding with or without a coating
    • G02B6/02042—Multicore optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/088—Testing mechanical properties of optical fibres; Mechanical features associated with the optical testing of optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/39—Testing of optical devices, constituted by fibre optics or optical waveguides in which light is projected from both sides of the fiber or waveguide end-face
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/02—Optical fibres with cladding with or without a coating
    • G02B6/02004—Optical fibres with cladding with or without a coating characterised by the core effective area or mode field radius
    • G02B6/02009—Large effective area or mode field radius, e.g. to reduce nonlinear effects in single mode fibres

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DK18798419.0T 2017-05-11 2018-05-11 Fremgangsmåde til ikke-linearitetsmåling og indretning til ikke-linearitetsmåling DK3623789T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017094730 2017-05-11
PCT/JP2018/018333 WO2018207915A1 (ja) 2017-05-11 2018-05-11 非線形性測定方法および非線形性測定装置

Publications (1)

Publication Number Publication Date
DK3623789T3 true DK3623789T3 (da) 2022-04-04

Family

ID=64104567

Family Applications (1)

Application Number Title Priority Date Filing Date
DK18798419.0T DK3623789T3 (da) 2017-05-11 2018-05-11 Fremgangsmåde til ikke-linearitetsmåling og indretning til ikke-linearitetsmåling

Country Status (6)

Country Link
US (1) US11156529B2 (da)
EP (1) EP3623789B1 (da)
JP (1) JP7200932B2 (da)
CN (1) CN110582694B (da)
DK (1) DK3623789T3 (da)
WO (1) WO2018207915A1 (da)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11624681B2 (en) * 2020-01-16 2023-04-11 Saudi Arabian Oil Company Overcoming OTDR dead zones using a few-mode fiber
US20230026901A1 (en) * 2020-02-27 2023-01-26 Nec Corporation Monitoring device, monitoring method, and optical transmission system
JP7294518B2 (ja) * 2020-02-27 2023-06-20 日本電気株式会社 モニタ装置、モニタ方法、光増幅器、及び光伝送システム

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5724126A (en) * 1994-05-06 1998-03-03 Nippon Telegraph And Telephone Corporation Method for measuring distribution of zero dispersion wavelengths in an optical fiber and apparatus therefor
FR2751746B1 (fr) * 1996-07-24 1998-10-23 Boitel Michel Procede et dispositif de mesure par reflectometrie pour connexion de fibre optique
JP3414257B2 (ja) * 1998-05-19 2003-06-09 安藤電気株式会社 多心光ファイバの測定データ集計方法及び装置ならびに集計処理プログラムを記録した記録媒体
FR2782799B1 (fr) * 1998-08-27 2000-11-17 France Telecom Appareil de mesure de paradiaphotie lineique des fibres multicoeurs
DE10028144C1 (de) * 2000-06-07 2001-11-29 Siemens Ag Messverfahren zur Bestimmung der Nichtlinearitäten einer optischen Faser
DE10047901C2 (de) 2000-09-27 2003-04-30 Siemens Ag Verfahren und Vorrichtung zur Messung der Fasernichtlinerarität einer Lichtleitfaser in einer Datenübertragungsstrecke
JP3976733B2 (ja) * 2001-11-13 2007-09-19 株式会社アドバンテスト 波長分散測定システムおよび方法
GB0202159D0 (en) * 2002-01-30 2002-03-20 Sensor Highway Ltd OPtical time domain reflectometry
US7003202B2 (en) * 2003-04-28 2006-02-21 The Furukawa Electric Co., Ltd. Method and system for measuring the wavelength dispersion and nonlinear coefficient of an optical fiber, method of manufacturing optical fibers, method of measuring wavelength-dispersion distribution, method of compensating for measurement errors, and method of specifying conditions of measurement
JP2007101508A (ja) * 2005-10-07 2007-04-19 Sumitomo Electric Ind Ltd 温度測定方法及び温度測定装置
JP4679455B2 (ja) 2006-07-13 2011-04-27 富士通株式会社 光増幅方法、光増幅器および光伝送システム
US7504618B2 (en) * 2007-07-03 2009-03-17 Schlumberger Technology Corporation Distributed sensing in an optical fiber using brillouin scattering
EP2545400B1 (en) * 2010-03-10 2017-12-06 Ofs Fitel Llc, A Delaware Limited Liability Company Multicore fibers and associated structures and techniques
US8737793B2 (en) * 2010-03-16 2014-05-27 Furukawa Electric Co., Ltd. Multi-core optical fiber and method of manufacturing the same
JP5685763B2 (ja) 2011-03-25 2015-03-18 国立大学法人東北大学 マルチコア光ファイバ用モード結合測定方法および測定装置
JP5761791B2 (ja) 2011-04-15 2015-08-12 国立大学法人東京工業大学 光伝送路接続システム及び光伝送路接続方法
JP6237615B2 (ja) * 2012-02-29 2017-12-06 住友電気工業株式会社 マルチコア光ファイバ、マルチコア光ファイバケーブル、およびマルチコア光ファイバ伝送システム
JP6132332B2 (ja) 2013-02-06 2017-05-24 国立大学法人東北大学 マルチモード光ファイバ用モード結合測定装置
CN103900796B (zh) * 2014-03-21 2016-11-02 上海大学 应用级联双包层光纤测量光纤非线性折射率系数装置
JP5948368B2 (ja) 2014-06-05 2016-07-06 株式会社フジクラ 光ファイバの特性評価方法
JP6475591B2 (ja) 2015-08-11 2019-02-27 日本電信電話株式会社 モード分散係数測定装置及びモード分散係数測定方法
WO2017144667A1 (en) * 2016-02-24 2017-08-31 Koninklijke Philips N.V. Methods and systems for correcting for nonlinear twist response in optical shape sensing with spun multicore fibers
JP6429287B2 (ja) * 2016-08-31 2018-11-28 株式会社フジクラ 測定方法、測定装置、及び測定プログラム

Also Published As

Publication number Publication date
US20200056958A1 (en) 2020-02-20
EP3623789A1 (en) 2020-03-18
EP3623789A4 (en) 2020-05-06
EP3623789B1 (en) 2022-03-16
JPWO2018207915A1 (ja) 2020-05-14
CN110582694B (zh) 2022-05-06
CN110582694A (zh) 2019-12-17
US11156529B2 (en) 2021-10-26
WO2018207915A1 (ja) 2018-11-15
JP7200932B2 (ja) 2023-01-10

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