DK3485519T3 - Skalerbar kvantebegrænset indretning og fremgangsmåde til produktion af den samme - Google Patents
Skalerbar kvantebegrænset indretning og fremgangsmåde til produktion af den samme Download PDFInfo
- Publication number
- DK3485519T3 DK3485519T3 DK17745859.3T DK17745859T DK3485519T3 DK 3485519 T3 DK3485519 T3 DK 3485519T3 DK 17745859 T DK17745859 T DK 17745859T DK 3485519 T3 DK3485519 T3 DK 3485519T3
- Authority
- DK
- Denmark
- Prior art keywords
- producing
- same
- limited device
- scalable quantum
- scalable
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission
- H01L27/153—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission in a repetitive configuration, e.g. LED bars
- H01L27/156—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission in a repetitive configuration, e.g. LED bars two-dimensional arrays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
- H01L33/24—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate of the light emitting region, e.g. non-planar junction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
- H01L33/32—Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/515—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics
- C04B35/58—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides
- C04B35/583—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides based on boron nitride
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB1612419.0A GB201612419D0 (en) | 2016-07-18 | 2016-07-18 | A scalable quantum-confined device |
PCT/GB2017/052110 WO2018015738A1 (en) | 2016-07-18 | 2017-07-18 | A scalable quantum-confined device |
Publications (1)
Publication Number | Publication Date |
---|---|
DK3485519T3 true DK3485519T3 (da) | 2021-02-15 |
Family
ID=56890568
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK17745859.3T DK3485519T3 (da) | 2016-07-18 | 2017-07-18 | Skalerbar kvantebegrænset indretning og fremgangsmåde til produktion af den samme |
Country Status (6)
Country | Link |
---|---|
US (1) | US10700238B2 (da) |
EP (1) | EP3485519B1 (da) |
CN (1) | CN109844969B (da) |
DK (1) | DK3485519T3 (da) |
GB (1) | GB201612419D0 (da) |
WO (1) | WO2018015738A1 (da) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110823845B (zh) * | 2018-08-08 | 2021-05-25 | 京东方科技集团股份有限公司 | 光谱仪及其制作方法 |
CN109390439A (zh) * | 2018-09-26 | 2019-02-26 | 杭州电子科技大学 | 一种光强可调的发光器件的制备方法 |
US10784431B2 (en) | 2018-10-29 | 2020-09-22 | International Business Machines Corporation | Dielectric holder for quantum devices |
CN109817770B (zh) * | 2019-01-25 | 2021-03-02 | 上海电力学院 | 一种利用局部应力制备二维柔性发光阵列的方法 |
US10879445B2 (en) * | 2019-02-12 | 2020-12-29 | University Of Oregon | Deterministic quantum emitter formation in hexagonal boron nitride via controlled edge creation |
WO2020181362A1 (en) * | 2019-03-08 | 2020-09-17 | Infinite Potential Laboratories Lp | Quantum control devices and methods |
US11145772B2 (en) | 2019-03-11 | 2021-10-12 | At&T Intellectual Property I, L.P. | Device for photo spectroscopy having an atomic-scale bilayer |
CN110044469B (zh) * | 2019-03-19 | 2022-04-22 | 深圳大学 | 一种运动检测装置及制备方法与应用 |
WO2020203746A1 (ja) * | 2019-04-02 | 2020-10-08 | ローム株式会社 | 単一光子源及び単一光子の出力方法 |
US11705535B2 (en) * | 2019-08-05 | 2023-07-18 | The Government Of The United States Of America, As Represented By The Secretary Of The Navy | Nano-indent process for creating single photon emitters in a two-dimensional materials platform |
EP4010747B1 (de) * | 2019-09-20 | 2023-03-08 | Humboldt-Universität zu Berlin | Vorrichtung zur erzeugung von einzelphotonen |
US20210091240A1 (en) * | 2019-09-20 | 2021-03-25 | Triad National Security, Llc | Single photon generation through mechanical deformation |
CN111403567B (zh) * | 2020-04-01 | 2021-05-14 | 中国科学院半导体研究所 | 量子点单光子源及其微透镜阵列的湿法腐蚀制备方法 |
CN112420872B (zh) * | 2020-11-12 | 2023-06-16 | 苏州科技大学 | 基于WSe2/KTaO3范德华异质结的光电探测器及其制备方法 |
WO2022109854A1 (zh) * | 2020-11-25 | 2022-06-02 | 苏州晶湛半导体有限公司 | 复合衬底、光电器件及其制备方法 |
EP4044261A1 (en) | 2021-02-12 | 2022-08-17 | ETH Zurich | Confinement of neutral excitons in a semiconductor layer structure |
WO2022178580A1 (en) * | 2021-02-24 | 2022-09-01 | University Of Technology Sydney | Scalable and deterministic fabrication of quantum emitter arrays |
US11892529B2 (en) * | 2021-03-01 | 2024-02-06 | Rensselaer Polytechnic Institute | Monolayer transition metal dichalcogenides having giant valley-polarized Rydberg excitons revealed by magneto-photocurrent spectroscopy |
CN113160906B (zh) * | 2021-04-21 | 2024-01-02 | 南京信息工程大学 | 一种MXenes材料稳定性分类系统及其运行方法 |
KR102573861B1 (ko) * | 2022-06-27 | 2023-09-04 | 한국화학연구원 | 옵티컬 솔더링을 이용한 결함 구조에서 이차원 박막 반도체 물질의 광특성 생성 및 제어하는 방법 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5844930A (en) * | 1996-11-13 | 1998-12-01 | Lucent Technologies Inc. | Quantum wire lasers |
GB2386470B (en) * | 2002-03-11 | 2004-06-16 | Toshiba Res Europ Ltd | A photon source and method of operating a photon source |
US7618905B1 (en) * | 2007-04-23 | 2009-11-17 | The United States Of America As Represented By The Secretary Of The Air Force | Heterostructure self-assembled quantum dot |
CN101540357B (zh) * | 2008-03-19 | 2010-09-01 | 中国科学院半导体研究所 | 控制自组织铟镓砷量子点成核的生长方法 |
US20090321781A1 (en) * | 2008-06-27 | 2009-12-31 | Victoria Broadley | Quantum dot device and method of making the same |
EP2459975A4 (en) * | 2009-07-30 | 2013-10-23 | Hewlett Packard Development Co | NANODRAHT BASED SYSTEMS FOR RAMAN SPECTROSCOPY |
US8969890B2 (en) * | 2010-11-04 | 2015-03-03 | Koninklijke Philips N.V. | Solid state light emitting devices based on crystallographically relaxed structures |
US20140027710A1 (en) * | 2010-12-03 | 2014-01-30 | University Of Utah Research Foundation | Quantum dot and nanowire synthesis |
JP2012209315A (ja) * | 2011-03-29 | 2012-10-25 | Fujitsu Ltd | 光半導体装置 |
EP2743966B1 (en) * | 2012-12-14 | 2020-11-25 | Seoul Viosys Co., Ltd. | Epitaxial layer wafer having void for separating growth substrate therefrom and semiconductor device fabricated using the same |
KR101790275B1 (ko) * | 2013-10-24 | 2017-10-26 | 한국과학기술원 | 고품질 그래핀 양자점 및 이의 제조방법 |
CN103560157B (zh) * | 2013-11-19 | 2016-02-24 | 中国科学院上海微系统与信息技术研究所 | 应变结构及其制作方法 |
KR102214833B1 (ko) * | 2014-06-17 | 2021-02-10 | 삼성전자주식회사 | 그래핀과 양자점을 포함하는 전자 소자 |
US9711683B2 (en) * | 2014-09-26 | 2017-07-18 | Epistar Corporation | Semiconductor device and the method of manufacturing the same |
-
2016
- 2016-07-18 GB GBGB1612419.0A patent/GB201612419D0/en not_active Ceased
-
2017
- 2017-07-18 US US16/318,269 patent/US10700238B2/en active Active
- 2017-07-18 EP EP17745859.3A patent/EP3485519B1/en active Active
- 2017-07-18 CN CN201780057375.3A patent/CN109844969B/zh active Active
- 2017-07-18 WO PCT/GB2017/052110 patent/WO2018015738A1/en unknown
- 2017-07-18 DK DK17745859.3T patent/DK3485519T3/da active
Also Published As
Publication number | Publication date |
---|---|
EP3485519A1 (en) | 2019-05-22 |
WO2018015738A1 (en) | 2018-01-25 |
US10700238B2 (en) | 2020-06-30 |
CN109844969A (zh) | 2019-06-04 |
US20190288160A1 (en) | 2019-09-19 |
GB201612419D0 (en) | 2016-08-31 |
EP3485519B1 (en) | 2020-12-02 |
CN109844969B (zh) | 2022-02-01 |
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