DK2702556T3 - Fremgangsmåde og anordning til tilvejebringelse af billeddata til fremstilling af et billede af et område af en målgentand - Google Patents
Fremgangsmåde og anordning til tilvejebringelse af billeddata til fremstilling af et billede af et område af en målgentandInfo
- Publication number
- DK2702556T3 DK2702556T3 DK12717463.9T DK12717463T DK2702556T3 DK 2702556 T3 DK2702556 T3 DK 2702556T3 DK 12717463 T DK12717463 T DK 12717463T DK 2702556 T3 DK2702556 T3 DK 2702556T3
- Authority
- DK
- Denmark
- Prior art keywords
- area
- preparing
- image data
- image
- target area
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
- G06T1/0007—Image acquisition
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20172—Image enhancement details
- G06T2207/20208—High dynamic range [HDR] image processing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB1107053.9A GB201107053D0 (en) | 2011-04-27 | 2011-04-27 | Improvements in providing image data |
| PCT/GB2012/050929 WO2012146929A1 (en) | 2011-04-27 | 2012-04-27 | A method and apparatus for providing image data for constructing an image of a region of a target object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK2702556T3 true DK2702556T3 (da) | 2017-11-13 |
Family
ID=44168625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK12717463.9T DK2702556T3 (da) | 2011-04-27 | 2012-04-27 | Fremgangsmåde og anordning til tilvejebringelse af billeddata til fremstilling af et billede af et område af en målgentand |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US9448160B2 (enExample) |
| EP (1) | EP2702556B1 (enExample) |
| JP (1) | JP6012710B2 (enExample) |
| KR (1) | KR101892321B1 (enExample) |
| CN (1) | CN103503022B (enExample) |
| DK (1) | DK2702556T3 (enExample) |
| GB (1) | GB201107053D0 (enExample) |
| IL (1) | IL228898A (enExample) |
| WO (1) | WO2012146929A1 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201215558D0 (en) * | 2012-08-31 | 2012-10-17 | Phase Focus Ltd | Improvements in phase retrieval |
| US10652444B2 (en) | 2012-10-30 | 2020-05-12 | California Institute Of Technology | Multiplexed Fourier ptychography imaging systems and methods |
| US9864184B2 (en) | 2012-10-30 | 2018-01-09 | California Institute Of Technology | Embedded pupil function recovery for fourier ptychographic imaging devices |
| CN108761752A (zh) | 2012-10-30 | 2018-11-06 | 加州理工学院 | 傅立叶重叠关联成像系统、设备和方法 |
| US9426455B2 (en) | 2013-07-31 | 2016-08-23 | California Institute Of Technology | Aperture scanning fourier ptychographic imaging |
| CN105765690B (zh) | 2013-08-22 | 2019-01-18 | 加州理工学院 | 可变照明傅立叶重叠关联成像设备、系统以及方法 |
| US11468557B2 (en) | 2014-03-13 | 2022-10-11 | California Institute Of Technology | Free orientation fourier camera |
| US10162161B2 (en) * | 2014-05-13 | 2018-12-25 | California Institute Of Technology | Ptychography imaging systems and methods with convex relaxation |
| JP2018504577A (ja) | 2014-12-22 | 2018-02-15 | カリフォルニア インスティチュート オブ テクノロジー | 厚膜サンプル用落射照明フーリエタイコグラフィ撮像 |
| US10665001B2 (en) | 2015-01-21 | 2020-05-26 | California Institute Of Technology | Fourier ptychographic tomography |
| CN107209123B (zh) | 2015-01-26 | 2020-08-11 | 加州理工学院 | 多孔傅立叶重叠关联和荧光成像 |
| JP2018509622A (ja) | 2015-03-13 | 2018-04-05 | カリフォルニア インスティチュート オブ テクノロジー | フーリエタイコグラフィ手法を用いるインコヒーレント撮像システムにおける収差補正 |
| US9993149B2 (en) | 2015-03-25 | 2018-06-12 | California Institute Of Technology | Fourier ptychographic retinal imaging methods and systems |
| WO2016187591A1 (en) | 2015-05-21 | 2016-11-24 | California Institute Of Technology | Laser-based fourier ptychographic imaging systems and methods |
| EP3106862B1 (en) * | 2015-06-18 | 2019-01-16 | FEI Company | Method of ptychographic imaging |
| US10568507B2 (en) | 2016-06-10 | 2020-02-25 | California Institute Of Technology | Pupil ptychography methods and systems |
| US11092795B2 (en) | 2016-06-10 | 2021-08-17 | California Institute Of Technology | Systems and methods for coded-aperture-based correction of aberration obtained from Fourier ptychography |
| WO2019090149A1 (en) | 2017-11-03 | 2019-05-09 | California Institute Of Technology | Parallel digital imaging acquisition and restoration methods and systems |
| US12198300B2 (en) | 2021-02-25 | 2025-01-14 | California Institute Of Technology | Computational refocusing-assisted deep learning |
| US12367563B2 (en) * | 2021-03-25 | 2025-07-22 | Government Of The United States Of America, As Represented By The Secretary Of Commerce | Tomographic reconstruction apparatus and removing diffraction effects in a tomographic image |
| KR102789554B1 (ko) * | 2023-05-03 | 2025-04-04 | 고려대학교 산학협력단 | 반사 행렬 데이터에 기반한 켤레 적응광학 알고리즘을 이용하여 타겟 이미지를 보정 및 복원하는 이미징 장치 및 방법 |
Family Cites Families (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5570180A (en) | 1993-08-27 | 1996-10-29 | Minolta Co., Ltd. | Spectrometer provided with an optical shutter |
| US5717733A (en) | 1995-05-31 | 1998-02-10 | Quanta Vision, Inc. | X-ray and neutron diffractometric imaging of the internal structure of objects |
| US6809829B1 (en) | 1999-05-19 | 2004-10-26 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for evaluating aberrations of optical element and method and apparatus for adjusting optical unit and lens |
| US6304330B1 (en) | 1999-10-06 | 2001-10-16 | Metrolaser, Inc. | Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry |
| US6545790B2 (en) | 1999-11-08 | 2003-04-08 | Ralph W. Gerchberg | System and method for recovering phase information of a wave front |
| US6809845B1 (en) | 2002-09-25 | 2004-10-26 | University Of South Florida | Phase imaging using multi-wavelength digital holography |
| US7057735B2 (en) | 2002-11-14 | 2006-06-06 | Fitel U.S.A. Corp. | Method for measuring the optical and physical thickness of optically transparent objects |
| GB0314444D0 (en) | 2003-06-20 | 2003-07-23 | Univ Heriot Watt | Novel wavefront sensor |
| GB2403616A (en) | 2003-06-30 | 2005-01-05 | Univ Sheffield Hallam | Diffraction pattern imaging using moving aperture. |
| EP1723607B1 (en) | 2004-03-02 | 2018-11-07 | Philips Intellectual Property & Standards GmbH | Motion compensation |
| GB0409572D0 (en) | 2004-04-29 | 2004-06-02 | Univ Sheffield | High resolution imaging |
| US20050280813A1 (en) | 2004-06-16 | 2005-12-22 | Jones Howland D T | Infrared spectroscopy as an assist for cytological investigation |
| ES2279665B2 (es) | 2004-12-23 | 2008-04-16 | Universidade De Santiago De Compostela | Interferometro de difraccion por orificio, ido, para inspeccion y medida de componentes opticos oftalmicos. |
| JP3762420B2 (ja) | 2004-12-28 | 2006-04-05 | 株式会社リコー | 屈折率分布の測定方法及び装置 |
| JP3932303B2 (ja) * | 2005-05-13 | 2007-06-20 | 独立行政法人放射線医学総合研究所 | 臓器動態の定量化方法、装置、臓器位置の予測方法、装置、放射線照射方法、装置及び臓器異常検出装置 |
| US7626708B2 (en) | 2006-04-28 | 2009-12-01 | Chao-Wen Liang | Phase shifting grating-slit test for optical surface reconstruction |
| US20080048102A1 (en) | 2006-08-22 | 2008-02-28 | Eastman Kodak Company | Optically enhanced multi-spectral detector structure |
| US7734084B2 (en) * | 2006-10-20 | 2010-06-08 | Hewlett-Packard Development Company, L.P. | Method and system for offset estimation and alignment |
| GB0709796D0 (en) * | 2007-05-22 | 2007-06-27 | Phase Focus Ltd | Three dimensional imaging |
| US8233682B2 (en) * | 2007-06-05 | 2012-07-31 | General Electric Company | Methods and systems for improving spatial and temporal resolution of computed images of moving objects |
| EP2183546B1 (en) | 2007-08-17 | 2015-10-21 | Renishaw PLC | Non-contact probe |
| EP2063260A1 (en) | 2007-11-19 | 2009-05-27 | Lambda-X | Fourier transform deflectometry system and method |
| GB0817650D0 (en) | 2008-09-26 | 2008-11-05 | Phase Focus Ltd | Improvements in the field of imaging |
| GB0822149D0 (en) * | 2008-12-04 | 2009-01-14 | Univ Sheffield | Provision of image data |
| JP5008650B2 (ja) | 2008-12-25 | 2012-08-22 | キヤノン株式会社 | 屈折率分布計測方法及び屈折率分布計測装置 |
| JP2010204755A (ja) | 2009-02-27 | 2010-09-16 | Tohoku Univ | 画像処理装置、画像再構成システム、画像処理方法およびプログラム |
| JP5328437B2 (ja) | 2009-03-25 | 2013-10-30 | キヤノン株式会社 | 透過波面測定方法、屈折率分布測定方法、光学素子の製造方法、及び透過波面測定装置 |
| GB0906449D0 (en) | 2009-04-15 | 2009-05-20 | Phase Focus Ltd | Improvements in imaging |
| CA2774082A1 (en) | 2009-09-15 | 2011-03-24 | The University Of Sheffield | Method and apparatus for retrieving a phase of a wavefield |
| WO2011044218A1 (en) | 2009-10-08 | 2011-04-14 | Massachusetts Institute Of Technology | Phase from defocused color images |
| JP4968965B2 (ja) | 2009-11-18 | 2012-07-04 | キヤノン株式会社 | 屈折率分布の計測方法および計測装置 |
| JP4968966B2 (ja) | 2009-12-07 | 2012-07-04 | キヤノン株式会社 | 屈折率分布の計測方法および計測装置 |
| GB201006593D0 (en) | 2010-04-20 | 2010-06-02 | Phase Focus Ltd | Characteristic determination |
| JP5021054B2 (ja) | 2010-05-25 | 2012-09-05 | キヤノン株式会社 | 屈折率分布計測方法および屈折率分布計測装置 |
| JP4895409B2 (ja) | 2010-05-25 | 2012-03-14 | キヤノン株式会社 | 屈折率分布計測方法および屈折率分布計測装置 |
| GB2481589B (en) | 2010-06-28 | 2014-06-11 | Phase Focus Ltd | Calibration of a probe in ptychography |
| GB201016088D0 (en) | 2010-09-24 | 2010-11-10 | Phase Focus Ltd | Improvements in imaging |
| US9182289B2 (en) | 2011-10-14 | 2015-11-10 | Canon Kabushiki Kaisha | Apparatus and method for estimating wavefront parameters |
-
2011
- 2011-04-27 GB GBGB1107053.9A patent/GB201107053D0/en not_active Ceased
-
2012
- 2012-04-27 JP JP2014506932A patent/JP6012710B2/ja active Active
- 2012-04-27 DK DK12717463.9T patent/DK2702556T3/da active
- 2012-04-27 KR KR1020137031217A patent/KR101892321B1/ko not_active Expired - Fee Related
- 2012-04-27 US US14/114,086 patent/US9448160B2/en active Active
- 2012-04-27 WO PCT/GB2012/050929 patent/WO2012146929A1/en not_active Ceased
- 2012-04-27 EP EP12717463.9A patent/EP2702556B1/en active Active
- 2012-04-27 CN CN201280020664.3A patent/CN103503022B/zh active Active
-
2013
- 2013-10-15 IL IL228898A patent/IL228898A/en active IP Right Grant
Also Published As
| Publication number | Publication date |
|---|---|
| EP2702556B1 (en) | 2017-10-18 |
| EP2702556A1 (en) | 2014-03-05 |
| IL228898A0 (en) | 2013-12-31 |
| CN103503022B (zh) | 2017-06-30 |
| IL228898A (en) | 2017-09-28 |
| WO2012146929A1 (en) | 2012-11-01 |
| GB201107053D0 (en) | 2011-06-08 |
| US9448160B2 (en) | 2016-09-20 |
| KR20140053006A (ko) | 2014-05-07 |
| CN103503022A (zh) | 2014-01-08 |
| KR101892321B1 (ko) | 2018-09-28 |
| JP6012710B2 (ja) | 2016-10-25 |
| JP2014517268A (ja) | 2014-07-17 |
| US20140043616A1 (en) | 2014-02-13 |
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