DK1789773T3 - Method for improving optical measurement of gas concentration - Google Patents
Method for improving optical measurement of gas concentration Download PDFInfo
- Publication number
- DK1789773T3 DK1789773T3 DK05779676.5T DK05779676T DK1789773T3 DK 1789773 T3 DK1789773 T3 DK 1789773T3 DK 05779676 T DK05779676 T DK 05779676T DK 1789773 T3 DK1789773 T3 DK 1789773T3
- Authority
- DK
- Denmark
- Prior art keywords
- gas concentration
- optical measurement
- improving optical
- improving
- measurement
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3144—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths for oxymetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/396—Type of laser source
- G01N2021/399—Diode laser
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
- G01N2201/0612—Laser diodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0691—Modulated (not pulsed supply)
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20041197A FI20041197A0 (fi) | 2004-09-15 | 2004-09-15 | Menetelmä optisen kaasunpitoisuuden mittauksen parantamiseksi |
| PCT/FI2005/000383 WO2006030058A1 (en) | 2004-09-15 | 2005-09-07 | Method for improving optical measurement of gas concentration |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DK1789773T3 true DK1789773T3 (da) | 2017-02-20 |
| DK1789773T5 DK1789773T5 (en) | 2017-06-19 |
Family
ID=33041535
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK05779676.5T DK1789773T5 (en) | 2004-09-15 | 2005-09-07 | Method for improving optical measurement of gas concentration |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7586613B2 (da) |
| EP (1) | EP1789773B1 (da) |
| JP (1) | JP5258294B2 (da) |
| DK (1) | DK1789773T5 (da) |
| FI (1) | FI20041197A0 (da) |
| WO (1) | WO2006030058A1 (da) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8830469B2 (en) | 2008-07-09 | 2014-09-09 | Siemens Aktiengesellschaft | Method for detection of gases by laser spectroscopy, and gas sensor |
| JP5137740B2 (ja) * | 2008-08-08 | 2013-02-06 | 日立造船株式会社 | 袋状容器内における酸素濃度の非破壊検査装置 |
| US7957001B2 (en) * | 2008-10-10 | 2011-06-07 | Ge Infrastructure Sensing, Inc. | Wavelength-modulation spectroscopy method and apparatus |
| US7943915B2 (en) * | 2008-10-10 | 2011-05-17 | Ge Infrastructure Sensing, Inc. | Method of calibrating a wavelength-modulation spectroscopy apparatus |
| US8358417B2 (en) * | 2010-10-21 | 2013-01-22 | Spectrasensors, Inc. | Spectrometer with validation cell |
| CN102621074B (zh) * | 2012-03-06 | 2014-06-18 | 昆明斯派特光谱科技有限责任公司 | 一种基于非色散型甲烷气体分析仪的气体浓度定量测定方法 |
| DE102012215594B3 (de) * | 2012-09-03 | 2013-08-01 | Sick Ag | Verfahren zur Laserspektroskopie von Gasen |
| CN103196852B (zh) * | 2013-04-10 | 2015-05-13 | 中煤科工集团重庆研究院有限公司 | 一种具有自动线性校正功能的激光气体检测方法 |
| EP2803975B1 (de) | 2013-05-17 | 2015-07-08 | Sick Ag | Verfahren zur Laserspektroskopie von Gasen |
| JP6210195B2 (ja) * | 2013-06-12 | 2017-10-11 | 富士電機株式会社 | レーザ式酸素ガス分析計 |
| EP3112846B1 (de) * | 2015-06-29 | 2017-05-17 | Sick Ag | Verfahren zur bestimmung der konzentration einer gaskomponente und spektrometer dafür |
| DE102016226215A1 (de) | 2016-12-23 | 2018-06-28 | Siemens Aktiengesellschaft | Verfahren zur Korrektur der Wellenlänge und des Abstimmbereichs eines Laserspektrometers |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4730112A (en) | 1986-03-07 | 1988-03-08 | Hibshman Corporation | Oxygen measurement using visible radiation |
| JPS639843A (ja) * | 1986-06-30 | 1988-01-16 | Fujitsu Ltd | ガス検出装置 |
| JPS6395343A (ja) * | 1986-10-09 | 1988-04-26 | Fujitsu Ltd | ガスセンサ |
| US5060505A (en) * | 1989-09-12 | 1991-10-29 | Sensors, Inc. | Non-dispersive infrared gas analyzer system |
| US5636035A (en) * | 1991-09-30 | 1997-06-03 | The Trustees Of The Stevens Institute Of Technology | Method and apparatus for dual modulation laser spectroscopy |
| US5317156A (en) * | 1992-01-29 | 1994-05-31 | Sri International | Diagnostic tests using near-infrared laser absorption spectroscopy |
| JP2844506B2 (ja) * | 1992-03-27 | 1999-01-06 | 東京瓦斯株式会社 | ガス濃度測定方法および装置 |
| US5527031A (en) | 1994-06-15 | 1996-06-18 | Coin Bill Validator, Inc. | Mechanism for insuring alignment of currency in currency validators |
| US5572031A (en) * | 1994-11-23 | 1996-11-05 | Sri International | Pressure- and temperature-compensating oxygen sensor |
| US5973782A (en) * | 1997-01-09 | 1999-10-26 | Southwest Sciences Incorporated | Phaseless wavelength modulation spectroscopy |
| US5930000A (en) * | 1998-02-11 | 1999-07-27 | Monitor Labs, Inc. | Line-locked diode laser for gas spectroscopy |
| US6107631A (en) * | 1998-03-13 | 2000-08-22 | Alliedsignal Inc. | Self-calibration approach for tunable laser spectral absorption sensors |
| US6522402B1 (en) * | 1998-04-30 | 2003-02-18 | California Institute Of Technology | Apparatus and method for analyzing microscopic samples based on optical parametric oscillation |
| US6269110B1 (en) | 1998-10-05 | 2001-07-31 | Lambda Physik Ag | Internal wavelength calibration for tunable ArF-excimer laser using atomic carbon and molecular oxygen absorption lines |
| JP4038631B2 (ja) * | 1998-08-28 | 2008-01-30 | 株式会社堀場製作所 | 半導体レーザ分光法を用いた温度・濃度・化学種の高速計測方法および計測システム |
| US7004909B1 (en) | 2001-03-19 | 2006-02-28 | Pranalytica, Inc. | Diagnostic method for high sensitivity detection of component concentrations in human gas emissions |
| DE60202362T2 (de) * | 2001-05-11 | 2005-12-08 | Steris Inc., Temecula | Nicht-dispersiver infrarotsensor für verdampftes wasserstoffperoxid |
| DE602004000374T2 (de) * | 2003-09-12 | 2006-09-28 | Ir Microsystems S.A. | Gasdetektionsverfahren und gasdetektoreinrichtung |
| US7304742B1 (en) * | 2004-10-09 | 2007-12-04 | United States Of America As Represented By The Secretary Of The Army | Flow-through aerosol photoacoustic systems and methods |
-
2004
- 2004-09-15 FI FI20041197A patent/FI20041197A0/fi not_active Application Discontinuation
-
2005
- 2005-09-07 US US11/662,899 patent/US7586613B2/en active Active
- 2005-09-07 DK DK05779676.5T patent/DK1789773T5/da active
- 2005-09-07 EP EP05779676.5A patent/EP1789773B1/en active Active
- 2005-09-07 WO PCT/FI2005/000383 patent/WO2006030058A1/en active Application Filing
- 2005-09-07 JP JP2007531778A patent/JP5258294B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP1789773A4 (en) | 2012-05-16 |
| US7586613B2 (en) | 2009-09-08 |
| FI20041197A0 (fi) | 2004-09-15 |
| EP1789773A1 (en) | 2007-05-30 |
| WO2006030058A1 (en) | 2006-03-23 |
| US20070295908A1 (en) | 2007-12-27 |
| JP5258294B2 (ja) | 2013-08-07 |
| DK1789773T5 (en) | 2017-06-19 |
| EP1789773B1 (en) | 2017-01-25 |
| JP2008513755A (ja) | 2008-05-01 |
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