DK1625368T3 - Kredslöbsindretning og fremgangsmåde til udlæsning af elektroniske signaler fra termiske sensorer med höj opklösningsevne - Google Patents

Kredslöbsindretning og fremgangsmåde til udlæsning af elektroniske signaler fra termiske sensorer med höj opklösningsevne

Info

Publication number
DK1625368T3
DK1625368T3 DK04738533T DK04738533T DK1625368T3 DK 1625368 T3 DK1625368 T3 DK 1625368T3 DK 04738533 T DK04738533 T DK 04738533T DK 04738533 T DK04738533 T DK 04738533T DK 1625368 T3 DK1625368 T3 DK 1625368T3
Authority
DK
Denmark
Prior art keywords
thermal sensors
electronic signals
sub
circuit arrangement
reading electronic
Prior art date
Application number
DK04738533T
Other languages
English (en)
Inventor
Christian Wennmacher
Reinhard Mikuta
Edmund P Burte
Original Assignee
X Fab Semiconductor Foundries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Fab Semiconductor Foundries filed Critical X Fab Semiconductor Foundries
Application granted granted Critical
Publication of DK1625368T3 publication Critical patent/DK1625368T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22Electrical features thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14Electrical features thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/28Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using photoemissive or photovoltaic cells
    • G01J5/30Electrical features thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4446Type of detector
    • G01J2001/448Array [CCD]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Facsimile Heads (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
DK04738533T 2003-05-21 2004-05-21 Kredslöbsindretning og fremgangsmåde til udlæsning af elektroniske signaler fra termiske sensorer med höj opklösningsevne DK1625368T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10322860A DE10322860B4 (de) 2003-05-21 2003-05-21 Schaltungsanordnung zum Auslesen elektronischer Signale aus hochauflösenden thermischen Sensoren
PCT/DE2004/001063 WO2004106875A1 (de) 2003-05-21 2004-05-21 Schaltungsanordnung und verfahren zum auslesen elektronischer signale aus hochaufloesenden thermischen sensoren

Publications (1)

Publication Number Publication Date
DK1625368T3 true DK1625368T3 (da) 2007-07-16

Family

ID=33482068

Family Applications (1)

Application Number Title Priority Date Filing Date
DK04738533T DK1625368T3 (da) 2003-05-21 2004-05-21 Kredslöbsindretning og fremgangsmåde til udlæsning af elektroniske signaler fra termiske sensorer med höj opklösningsevne

Country Status (6)

Country Link
US (1) US20070187602A1 (da)
EP (1) EP1625368B1 (da)
AT (1) ATE358814T1 (da)
DE (3) DE10322860B4 (da)
DK (1) DK1625368T3 (da)
WO (1) WO2004106875A1 (da)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7842922B2 (en) 2005-05-17 2010-11-30 Heimann Sensor Gmbh Thermopile infrared sensor array
US8136984B1 (en) * 2009-04-20 2012-03-20 Fluke Corporation Portable IR thermometer having thermal imaging capability
KR102100228B1 (ko) 2015-10-05 2020-04-13 하이만 센서 게엠베하 모놀리식 집적된 신호 처리를 갖는 고분해능 서모파일 적외선 센서 어레이
DE102017102833A1 (de) 2017-01-18 2018-07-19 Heimann Sensor Gmbh Hochauflösendes Thermopile Infrarot Sensorarray
WO2023184068A1 (zh) * 2022-03-28 2023-10-05 京东方科技集团股份有限公司 瞳孔信息采集电路及方法、显示装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2101444B (en) * 1981-05-29 1984-10-31 Marconi Co Ltd Scan conversion circuit
US4806761A (en) * 1985-04-08 1989-02-21 Irvine Sensors Corporation Thermal imager incorporating electronics module having focal plane sensor mosaic
AU2888092A (en) * 1991-10-28 1993-06-07 Critikon, Inc. Filter selection and gas concentration computation for shutterless optically stabilized capnograph
US5926217A (en) * 1993-07-27 1999-07-20 Drs Technologies, Inc. Focal plane array integrated circuit with individual pixel signal processing
US5373151A (en) * 1993-10-04 1994-12-13 Raytheon Company Optical system including focal plane array compensation technique for focusing and periodically defocusing a beam
US6757018B1 (en) * 1998-12-18 2004-06-29 Agilent Technologies, Inc. CMOS image sensor with pixel level gain control
DE19962938A1 (de) * 1999-12-24 2001-07-19 Perkinelmer Optoelectronics Verfahren zum Korrigieren des Ausgangssignals eines Infrarotstrahlungsmehrelementsensors, Infrarotstrahlungsmehrelementsensor und Infrarotstrahlungsmehrelementsensorsystem
DE10040399A1 (de) * 2000-08-18 2002-03-07 Infineon Technologies Ag Schaltbarer Operationsverstärker für Switched-Opamp-Anwendungen

Also Published As

Publication number Publication date
DE10322860B4 (de) 2005-11-03
DE10322860A1 (de) 2004-12-23
EP1625368B1 (de) 2007-04-04
EP1625368A1 (de) 2006-02-15
DE112004000742D2 (de) 2006-01-12
DE502004003410D1 (de) 2007-05-16
WO2004106875A1 (de) 2004-12-09
ATE358814T1 (de) 2007-04-15
US20070187602A1 (en) 2007-08-16

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