DK120164B - Elektrisk apparat til afprøvning af komponenter. - Google Patents

Elektrisk apparat til afprøvning af komponenter.

Info

Publication number
DK120164B
DK120164B DK204369AA DK204369A DK120164B DK 120164 B DK120164 B DK 120164B DK 204369A A DK204369A A DK 204369AA DK 204369 A DK204369 A DK 204369A DK 120164 B DK120164 B DK 120164B
Authority
DK
Denmark
Prior art keywords
electrical device
testing components
testing
components
electrical
Prior art date
Application number
DK204369AA
Other languages
English (en)
Inventor
A Heather
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of DK120164B publication Critical patent/DK120164B/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
DK204369AA 1968-04-17 1969-04-14 Elektrisk apparat til afprøvning af komponenter. DK120164B (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08157/68A GB1209554A (en) 1968-04-17 1968-04-17 Improvements in electrical component test apparatus

Publications (1)

Publication Number Publication Date
DK120164B true DK120164B (da) 1971-04-19

Family

ID=10107621

Family Applications (1)

Application Number Title Priority Date Filing Date
DK204369AA DK120164B (da) 1968-04-17 1969-04-14 Elektrisk apparat til afprøvning af komponenter.

Country Status (8)

Country Link
US (1) US3633102A (da)
BE (1) BE731607A (da)
DE (1) DE1919159A1 (da)
DK (1) DK120164B (da)
FR (1) FR2006355A1 (da)
GB (1) GB1209554A (da)
NL (1) NL6905674A (da)
SE (1) SE350128B (da)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT7830665A0 (it) * 1977-12-12 1978-12-06 Leonid Valentinovich Dukhovsko Dispositivo di controllo dei parametri eletrtrici di circuiti elettronici.
DE3525325A1 (de) * 1985-07-16 1987-01-22 Papst Motoren Gmbh & Co Kg Automatische kontaktklemme
GB2236630A (en) * 1989-10-02 1991-04-10 Tektronix Inc Twist lock probe tip
US7015066B2 (en) * 2001-09-05 2006-03-21 Taiwan Semiconductor Manufacturing Co., Ltd. Method for stress reduction in flip chip bump during flip chip mounting and underfill process steps of making a microelectronic assembly

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2850714A (en) * 1954-11-16 1958-09-02 Sylvania Electric Prod High voltage tube socket
US3239760A (en) * 1962-01-08 1966-03-08 Philco Corp Transistor socket having two uniaxially aligned and electrically isolated contacting terminals for each inserted lead
US3517144A (en) * 1969-01-23 1970-06-23 Us Army Integrated circuit package programmable test socket

Also Published As

Publication number Publication date
GB1209554A (en) 1970-10-21
DE1919159A1 (de) 1969-10-23
US3633102A (en) 1972-01-04
NL6905674A (da) 1969-10-21
BE731607A (da) 1969-10-16
SE350128B (da) 1972-10-16
FR2006355A1 (da) 1969-12-26

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