DK0832491T3 - Flerkanals-totalreflektionsoptik med styrbar divergens - Google Patents

Flerkanals-totalreflektionsoptik med styrbar divergens

Info

Publication number
DK0832491T3
DK0832491T3 DK96923286T DK96923286T DK0832491T3 DK 0832491 T3 DK0832491 T3 DK 0832491T3 DK 96923286 T DK96923286 T DK 96923286T DK 96923286 T DK96923286 T DK 96923286T DK 0832491 T3 DK0832491 T3 DK 0832491T3
Authority
DK
Denmark
Prior art keywords
total reflection
reflection optics
multichannel
divergence
controllable
Prior art date
Application number
DK96923286T
Other languages
Danish (da)
English (en)
Inventor
M Gibson David
Gregory Downing Robert
Original Assignee
X Ray Optical Sys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Ray Optical Sys Inc filed Critical X Ray Optical Sys Inc
Application granted granted Critical
Publication of DK0832491T3 publication Critical patent/DK0832491T3/da

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/068—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Lenses (AREA)
DK96923286T 1995-06-12 1996-06-11 Flerkanals-totalreflektionsoptik med styrbar divergens DK0832491T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/489,503 US5604353A (en) 1995-06-12 1995-06-12 Multiple-channel, total-reflection optic with controllable divergence
PCT/US1996/010075 WO1996042088A1 (fr) 1995-06-12 1996-06-11 Dispositif optique a reflexion totale et a canaux multiples avec une divergence controlable

Publications (1)

Publication Number Publication Date
DK0832491T3 true DK0832491T3 (da) 2002-06-17

Family

ID=23944143

Family Applications (1)

Application Number Title Priority Date Filing Date
DK96923286T DK0832491T3 (da) 1995-06-12 1996-06-11 Flerkanals-totalreflektionsoptik med styrbar divergens

Country Status (9)

Country Link
US (1) US5604353A (fr)
EP (1) EP0832491B1 (fr)
JP (1) JP3069865B2 (fr)
KR (1) KR100256849B1 (fr)
CN (1) CN1147876C (fr)
AU (1) AU6383996A (fr)
DE (1) DE69619671T2 (fr)
DK (1) DK0832491T3 (fr)
WO (1) WO1996042088A1 (fr)

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US5838757A (en) * 1995-10-20 1998-11-17 Michael H. Vartanian & Co., Inc. Hard x-ray polycapillary telescope
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DE69920656T2 (de) * 1998-10-21 2005-10-13 Koninklijke Philips Electronics N.V. Röntgenquelle enthaltende röntgen-bestrahlungsvorrichtung mit einem kapillaren optischen system
US6345086B1 (en) 1999-09-14 2002-02-05 Veeco Instruments Inc. X-ray fluorescence system and method
DE60213994T2 (de) * 2001-06-19 2006-12-07 X-Ray Optical Systems, Inc., East Greenbush Wellenlängen-dispersives röntgenfluoreszenz-system mit fokusierender anregungsoptik und einem fokusierenden monochromator zum auffangen
US6781060B2 (en) 2002-07-26 2004-08-24 X-Ray Optical Systems Incorporated Electrical connector, a cable sleeve, and a method for fabricating an electrical connection
DE10259696B4 (de) * 2002-12-18 2018-07-05 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Vorrichtung zum Messen der Dicke dünner Schichten
DE10317679B4 (de) * 2003-04-17 2005-03-31 Bruker Axs Gmbh Röntgen-optische Vorrichtung mit Wobbel-Einrichtung
US7023955B2 (en) * 2003-08-12 2006-04-04 X-Ray Optical System, Inc. X-ray fluorescence system with apertured mask for analyzing patterned surfaces
JP4837964B2 (ja) * 2005-09-28 2011-12-14 株式会社島津製作所 Ｘ線集束装置
JP4900660B2 (ja) * 2006-02-21 2012-03-21 独立行政法人物質・材料研究機構 Ｘ線集束素子及びｘ線照射装置
US7412131B2 (en) * 2007-01-02 2008-08-12 General Electric Company Multilayer optic device and system and method for making same
US7366374B1 (en) 2007-05-22 2008-04-29 General Electric Company Multilayer optic device and an imaging system and method using same
US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
US7742566B2 (en) * 2007-12-07 2010-06-22 General Electric Company Multi-energy imaging system and method using optic devices
US8488743B2 (en) 2008-04-11 2013-07-16 Rigaku Innovative Technologies, Inc. Nanotube based device for guiding X-ray photons and neutrons
CA2720776C (fr) * 2008-04-11 2013-07-02 Rigaku Innovative Technologies, Inc. Generateur de rayons x avec optique polycapillaire
WO2010051469A1 (fr) * 2008-10-30 2010-05-06 Kenneth Oosting Processeur de faisceaux de rayons x
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
US8369674B2 (en) * 2009-05-20 2013-02-05 General Electric Company Optimizing total internal reflection multilayer optics through material selection
US8208602B2 (en) * 2010-02-22 2012-06-26 General Electric Company High flux photon beams using optic devices
US8311184B2 (en) 2010-08-30 2012-11-13 General Electric Company Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices
US8744048B2 (en) 2010-12-28 2014-06-03 General Electric Company Integrated X-ray source having a multilayer total internal reflection optic device
JP5751665B2 (ja) * 2011-03-01 2015-07-22 国立研究開発法人理化学研究所 Ｘ線分配装置およびｘ線分配システム
US8761346B2 (en) 2011-07-29 2014-06-24 General Electric Company Multilayer total internal reflection optic devices and methods of making and using the same
EP2745101B1 (fr) 2011-08-15 2019-11-06 X-Ray Optical Systems, Inc. Appareil d'analyse à rayons x
CN103946693B (zh) 2011-10-06 2017-05-03 X射线光学系统公司 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置
WO2013063253A1 (fr) 2011-10-26 2013-05-02 X-Ray Optical Systems, Inc. Structure de support et dispositifs optiques de rayons x monochromateurs hautement alignés pour moteurs d'analyse de rayons x et analyseurs
US9488605B2 (en) 2012-09-07 2016-11-08 Carl Zeiss X-ray Microscopy, Inc. Confocal XRF-CT system for mining analysis
WO2015019232A2 (fr) * 2013-08-08 2015-02-12 Controlrad Systems Inc. Système de réduction des rayons x
US9883793B2 (en) 2013-08-23 2018-02-06 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
EP3480586B1 (fr) * 2017-11-06 2021-02-24 Bruker Nano GmbH Spectromètre de fluorescence de rayons x
DE102019208834B3 (de) * 2019-06-18 2020-10-01 Bruker Axs Gmbh Vorrichtung zum Justieren und Wechseln von Strahlfängern
US20220201830A1 (en) 2020-12-23 2022-06-23 X-Ray Optical Systems, Inc. X-ray source assembly with enhanced temperature control for output stability
US20240035990A1 (en) 2022-07-29 2024-02-01 X-Ray Optical Systems, Inc. Polarized, energy dispersive x-ray fluorescence system and method

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US4143273A (en) * 1977-04-11 1979-03-06 Ohio-Nuclear, Inc. Variable collimator
US4277684A (en) * 1977-08-18 1981-07-07 U.S. Philips Corporation X-Ray collimator, particularly for use in computerized axial tomography apparatus
US4158143A (en) * 1978-04-07 1979-06-12 Bbc Brown, Boveri & Company Limited Tube for irradiation equipment
JPS5630295A (en) * 1979-08-21 1981-03-26 Oobayashi Seisakusho:Kk Stop device for x-ray
US4450578A (en) * 1982-03-03 1984-05-22 The United States Of America As Represented By The United States Department Of Energy Variable aperture collimator for high energy radiation
NL8500244A (nl) * 1985-01-29 1986-08-18 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie.
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US4910759A (en) * 1988-05-03 1990-03-20 University Of Delaware Xray lens and collimator
US5001737A (en) * 1988-10-24 1991-03-19 Aaron Lewis Focusing and guiding X-rays with tapered capillaries
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Also Published As

Publication number Publication date
CN1192821A (zh) 1998-09-09
JP3069865B2 (ja) 2000-07-24
EP0832491A4 (fr) 1998-07-29
DE69619671T2 (de) 2002-09-12
EP0832491B1 (fr) 2002-03-06
KR100256849B1 (ko) 2000-05-15
WO1996042088A1 (fr) 1996-12-27
DE69619671D1 (de) 2002-04-11
KR19990022893A (ko) 1999-03-25
JPH11502933A (ja) 1999-03-09
AU6383996A (en) 1997-01-09
EP0832491A1 (fr) 1998-04-01
CN1147876C (zh) 2004-04-28
US5604353A (en) 1997-02-18

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