DK0550300T3 - Kompakt optisk sensor med høj opløsning til analyse af tredimensionale former - Google Patents

Kompakt optisk sensor med høj opløsning til analyse af tredimensionale former

Info

Publication number
DK0550300T3
DK0550300T3 DK92403280.8T DK92403280T DK0550300T3 DK 0550300 T3 DK0550300 T3 DK 0550300T3 DK 92403280 T DK92403280 T DK 92403280T DK 0550300 T3 DK0550300 T3 DK 0550300T3
Authority
DK
Denmark
Prior art keywords
analysis
optical sensor
dimensional shapes
resolution optical
compact high
Prior art date
Application number
DK92403280.8T
Other languages
Danish (da)
English (en)
Inventor
Eric Cosnard
Jan Steuperaert
Original Assignee
Kreon Ind Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kreon Ind Sa filed Critical Kreon Ind Sa
Application granted granted Critical
Publication of DK0550300T3 publication Critical patent/DK0550300T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DK92403280.8T 1991-12-30 1992-12-04 Kompakt optisk sensor med høj opløsning til analyse af tredimensionale former DK0550300T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9116305A FR2685764B1 (fr) 1991-12-30 1991-12-30 Capteur optique compact et a haute resolution pour l'analyse de formes tridimensionnelles.

Publications (1)

Publication Number Publication Date
DK0550300T3 true DK0550300T3 (da) 1995-07-31

Family

ID=9420628

Family Applications (1)

Application Number Title Priority Date Filing Date
DK92403280.8T DK0550300T3 (da) 1991-12-30 1992-12-04 Kompakt optisk sensor med høj opløsning til analyse af tredimensionale former

Country Status (12)

Country Link
US (1) US5424835A (zh)
EP (1) EP0550300B1 (zh)
KR (1) KR0155388B1 (zh)
CN (1) CN1039603C (zh)
CA (1) CA2086378C (zh)
DE (2) DE69201639T2 (zh)
DK (1) DK0550300T3 (zh)
ES (1) ES2042451T3 (zh)
FR (1) FR2685764B1 (zh)
GR (1) GR930300104T1 (zh)
HK (1) HK155595A (zh)
TW (1) TW209285B (zh)

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US5870220A (en) * 1996-07-12 1999-02-09 Real-Time Geometry Corporation Portable 3-D scanning system and method for rapid shape digitizing and adaptive mesh generation
US5912768A (en) * 1996-12-31 1999-06-15 Cognex Corporation Depth-from-defocus optical apparatus with invariance to surface reflectance properties
US6025905A (en) * 1996-12-31 2000-02-15 Cognex Corporation System for obtaining a uniform illumination reflectance image during periodic structured illumination
US5878152A (en) * 1997-05-21 1999-03-02 Cognex Corporation Depth from focal gradient analysis using object texture removal by albedo normalization
US6219461B1 (en) 1997-07-29 2001-04-17 Cognex Corporation Determining a depth
US6148120A (en) * 1997-10-30 2000-11-14 Cognex Corporation Warping of focal images to correct correspondence error
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
FR2777441B1 (fr) 1998-04-21 2000-09-15 Kreon Ind Systeme de releve d'une forme tridimensionnelle, notamment d'une voute plantaire, et procede de realisation d'une chaussure ou d'une semelle orthopedique mettant en oeuvre le systeme
AU3991799A (en) 1998-05-14 1999-11-29 Metacreations Corporation Structured-light, triangulation-based three-dimensional digitizer
IT1304910B1 (it) * 1998-10-14 2001-04-05 Giovanni Fattori Macchina chiodatrice
US6297488B1 (en) 1999-04-29 2001-10-02 National Research Council Of Canada Position sensitive light spot detector
DE19941028A1 (de) * 1999-08-28 2001-04-05 Willing Gmbh Dr Ing Beleuchtungsvorrichtung mit blattförmiger Lichtverteilung zur Oberflächeninspektion
JP2001094841A (ja) * 1999-09-21 2001-04-06 Asahi Optical Co Ltd アオリ撮影機能を有するデジタルスチルカメラ
US7065242B2 (en) 2000-03-28 2006-06-20 Viewpoint Corporation System and method of three-dimensional image capture and modeling
CA2327894A1 (en) * 2000-12-07 2002-06-07 Clearview Geophysics Inc. Method and system for complete 3d object and area digitizing
WO2003012371A1 (en) 2001-08-01 2003-02-13 National Research Council Of Canada System and method of light spot position and color detection
US6925722B2 (en) * 2002-02-14 2005-08-09 Faro Technologies, Inc. Portable coordinate measurement machine with improved surface features
US6973734B2 (en) * 2002-02-14 2005-12-13 Faro Technologies, Inc. Method for providing sensory feedback to the operator of a portable measurement machine
US6952882B2 (en) * 2002-02-14 2005-10-11 Faro Technologies, Inc. Portable coordinate measurement machine
US7073271B2 (en) * 2002-02-14 2006-07-11 Faro Technologies Inc. Portable coordinate measurement machine
US7519493B2 (en) * 2002-02-14 2009-04-14 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
US7881896B2 (en) 2002-02-14 2011-02-01 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
USRE42082E1 (en) 2002-02-14 2011-02-01 Faro Technologies, Inc. Method and apparatus for improving measurement accuracy of a portable coordinate measurement machine
US6957496B2 (en) * 2002-02-14 2005-10-25 Faro Technologies, Inc. Method for improving measurement accuracy of a portable coordinate measurement machine
US7246030B2 (en) * 2002-02-14 2007-07-17 Faro Technologies, Inc. Portable coordinate measurement machine with integrated line laser scanner
IL154345A0 (en) * 2003-02-06 2003-09-17 Fitracks Ltd Method and apparatus for determining the three-dimensional shape and dimensions of an object
US7257248B2 (en) * 2003-03-27 2007-08-14 General Electric Company Non-contact measurement system and method
JP2008512672A (ja) * 2004-09-07 2008-04-24 ペトロモデル・イーエイチエフ 鉱物および岩石小片のサイズ、形状、アンギュラリティの解析のため、および組成解析のための装置および方法
AR052910A1 (es) * 2005-02-17 2007-04-11 Syngenta Participations Ag Aparato y metodo para contar y medir la frecuencia de semillas
CN1296676C (zh) * 2005-03-17 2007-01-24 上海交通大学 同时测量弯曲曲率和弯曲方向的弯曲传感器
US7908757B2 (en) 2008-10-16 2011-03-22 Hexagon Metrology, Inc. Articulating measuring arm with laser scanner
CN101619967B (zh) * 2009-08-07 2012-07-04 上海建工股份有限公司 建筑工程中格构柱垂直度的实时测量和监控系统
US8099877B2 (en) 2009-11-06 2012-01-24 Hexagon Metrology Ab Enhanced position detection for a CMM
IT1397220B1 (it) * 2009-12-29 2013-01-04 Associazione La Nostra Famiglia I R C C S E Medea Sistema per scansioni tridimensionali
TWI490077B (zh) * 2012-11-30 2015-07-01 Ind Tech Res Inst 校準裝置及多軸機械之補償方法
JP6098731B2 (ja) * 2013-11-15 2017-03-22 株式会社島津製作所 表面形状測定装置
ES2967886T3 (es) 2014-09-19 2024-05-06 Hexagon Metrology Inc Máquina de medición por coordenadas portátil multimodo
JP7179844B2 (ja) 2017-11-13 2022-11-29 ヘキサゴン メトロロジー,インコーポレイテッド 光学スキャニング装置の熱管理

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US3506334A (en) * 1966-02-17 1970-04-14 Zenith Radio Corp Phased array-type beam scanning
US3498693A (en) * 1967-01-24 1970-03-03 Zenith Radio Corp Radiation translating devices
JPS6079204A (ja) * 1983-10-07 1985-05-07 Nippon Telegr & Teleph Corp <Ntt> 外径測定装置
US4815842A (en) * 1986-05-29 1989-03-28 Acton Research Corporation Spectrograph for evaluating contamination of optical components in space
US5027424A (en) * 1986-08-29 1991-06-25 Asahi Kogaku Kogyo K.K. Image reader
FR2627047B1 (fr) * 1988-02-09 1990-07-27 Vision 3D Procede de numerisation de la surface d'un objet tridimensionnel et appareil de releve en vue de sa mise en oeuvre
GB8826224D0 (en) * 1988-11-09 1988-12-14 Gersan Anstalt Sensing shape of object
US4979815A (en) * 1989-02-17 1990-12-25 Tsikos Constantine J Laser range imaging system based on projective geometry
US5270560A (en) * 1989-05-26 1993-12-14 Ann F. Koo Method and apparatus for measuring workpiece surface topography

Also Published As

Publication number Publication date
US5424835A (en) 1995-06-13
EP0550300B1 (fr) 1995-03-08
DE69201639T2 (de) 1995-07-27
ES2042451T3 (es) 1995-07-16
KR930013685A (ko) 1993-07-22
HK155595A (en) 1995-10-06
FR2685764B1 (fr) 1995-03-17
FR2685764A1 (fr) 1993-07-02
CA2086378A1 (fr) 1993-07-01
CN1039603C (zh) 1998-08-26
EP0550300A1 (fr) 1993-07-07
CN1074754A (zh) 1993-07-28
DE69201639D1 (de) 1995-04-13
CA2086378C (en) 1997-06-17
GR930300104T1 (en) 1993-10-29
DE550300T1 (de) 1993-09-23
TW209285B (zh) 1993-07-11
ES2042451T1 (es) 1993-12-16
KR0155388B1 (ko) 1998-12-01

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