DE9210985U1 - - Google Patents

Info

Publication number
DE9210985U1
DE9210985U1 DE9210985U DE9210985U DE9210985U1 DE 9210985 U1 DE9210985 U1 DE 9210985U1 DE 9210985 U DE9210985 U DE 9210985U DE 9210985 U DE9210985 U DE 9210985U DE 9210985 U1 DE9210985 U1 DE 9210985U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9210985U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FISCHER ROLF-DIETER 7401 PLIEZHAUSEN DE
Original Assignee
FISCHER ROLF-DIETER 7401 PLIEZHAUSEN DE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FISCHER ROLF-DIETER 7401 PLIEZHAUSEN DE filed Critical FISCHER ROLF-DIETER 7401 PLIEZHAUSEN DE
Priority to DE9210985U priority Critical patent/DE9210985U1/de
Publication of DE9210985U1 publication Critical patent/DE9210985U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
DE9210985U 1992-08-17 1992-08-17 Expired - Lifetime DE9210985U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9210985U DE9210985U1 (en) 1992-08-17 1992-08-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9210985U DE9210985U1 (en) 1992-08-17 1992-08-17

Publications (1)

Publication Number Publication Date
DE9210985U1 true DE9210985U1 (en) 1992-12-24

Family

ID=6882728

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9210985U Expired - Lifetime DE9210985U1 (en) 1992-08-17 1992-08-17

Country Status (1)

Country Link
DE (1) DE9210985U1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19580814T1 (en) * 1994-06-15 1997-01-02 Advantest Corp IC carrier for use with an IC handler
DE102019007618A1 (en) * 2019-10-31 2021-05-06 Yamaichi Electronics Deutschland Gmbh Connection system, method and use of a connection system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19580814T1 (en) * 1994-06-15 1997-01-02 Advantest Corp IC carrier for use with an IC handler
DE19580814B4 (en) * 1994-06-15 2004-06-24 Advantest Corp. IC handler with IC carrier
DE102019007618A1 (en) * 2019-10-31 2021-05-06 Yamaichi Electronics Deutschland Gmbh Connection system, method and use of a connection system

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