DE8528346U1 - - Google Patents

Info

Publication number
DE8528346U1
DE8528346U1 DE8528346U DE8528346U DE8528346U1 DE 8528346 U1 DE8528346 U1 DE 8528346U1 DE 8528346 U DE8528346 U DE 8528346U DE 8528346 U DE8528346 U DE 8528346U DE 8528346 U1 DE8528346 U1 DE 8528346U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8528346U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pantuc Ing-Buero Stephan Roethele 3392 Clausthal-Zellerfeld De
Original Assignee
Pantuc Ing-Buero Stephan Roethele 3392 Clausthal-Zellerfeld De
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pantuc Ing-Buero Stephan Roethele 3392 Clausthal-Zellerfeld De filed Critical Pantuc Ing-Buero Stephan Roethele 3392 Clausthal-Zellerfeld De
Priority to DE8528346U priority Critical patent/DE8528346U1/de
Publication of DE8528346U1 publication Critical patent/DE8528346U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J2001/161—Ratio method, i.e. Im/Ir
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
DE8528346U 1985-10-04 1985-10-04 Expired DE8528346U1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8528346U DE8528346U1 (fr) 1985-10-04 1985-10-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE8528346U DE8528346U1 (fr) 1985-10-04 1985-10-04

Publications (1)

Publication Number Publication Date
DE8528346U1 true DE8528346U1 (fr) 1987-02-12

Family

ID=6785965

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8528346U Expired DE8528346U1 (fr) 1985-10-04 1985-10-04

Country Status (1)

Country Link
DE (1) DE8528346U1 (fr)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4201274A1 (de) * 1992-01-18 1993-07-22 Ver Glaswerke Gmbh Vorrichtung zum messen der reflexionseigenschaften einer mit einer teilreflektierenden schicht versehenen glasscheibe
DE19616245A1 (de) * 1996-04-15 1997-10-16 Zam Zentrum Fuer Angewandte Mi Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien
DE10127239A1 (de) * 2001-05-28 2002-12-12 Inst Mikroelektronik Und Mecha Verfahren und Computerprogrammprodukt zur Auswertung von durch Meßgeräte aufgenommenen Daten
DE102008002247A1 (de) * 2008-06-05 2009-12-10 Carl Zeiss Smt Ag Verfahren und Vorrichtung zum Bestimmen einer optischen Eigenschaft eines optischen Systems

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4201274A1 (de) * 1992-01-18 1993-07-22 Ver Glaswerke Gmbh Vorrichtung zum messen der reflexionseigenschaften einer mit einer teilreflektierenden schicht versehenen glasscheibe
DE19616245A1 (de) * 1996-04-15 1997-10-16 Zam Zentrum Fuer Angewandte Mi Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien
DE19616245C2 (de) * 1996-04-15 1998-06-18 Zam Zentrum Fuer Angewandte Mi Verfahren und Anordnung zum zerstörungsfreien, berührungslosen Prüfen und/oder Bewerten von Festkörpern, Flüssigkeiten, Gasen und Biomaterialien
DE10127239A1 (de) * 2001-05-28 2002-12-12 Inst Mikroelektronik Und Mecha Verfahren und Computerprogrammprodukt zur Auswertung von durch Meßgeräte aufgenommenen Daten
US7050948B2 (en) 2001-05-28 2006-05-23 Dr. Johannes Heidenhain Gmbh Method and computer program product for evaluation of data recorded by measuring instruments
DE102008002247A1 (de) * 2008-06-05 2009-12-10 Carl Zeiss Smt Ag Verfahren und Vorrichtung zum Bestimmen einer optischen Eigenschaft eines optischen Systems

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