DE69927552T2 - Mehrkanalige Integrationskugel - Google Patents

Mehrkanalige Integrationskugel Download PDF

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Publication number
DE69927552T2
DE69927552T2 DE69927552T DE69927552T DE69927552T2 DE 69927552 T2 DE69927552 T2 DE 69927552T2 DE 69927552 T DE69927552 T DE 69927552T DE 69927552 T DE69927552 T DE 69927552T DE 69927552 T2 DE69927552 T2 DE 69927552T2
Authority
DE
Germany
Prior art keywords
integration sphere
multichannel integration
multichannel
sphere
integration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69927552T
Other languages
English (en)
Other versions
DE69927552D1 (de
Inventor
William L Weber
Aken R Van
Perry A Palumbo
Joseph Corrado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GretagMacbeth LLC
Original Assignee
GretagMacbeth LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GretagMacbeth LLC filed Critical GretagMacbeth LLC
Application granted granted Critical
Publication of DE69927552D1 publication Critical patent/DE69927552D1/de
Publication of DE69927552T2 publication Critical patent/DE69927552T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0251—Colorimeters making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0294—Multi-channel spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/555—Measuring total reflection power, i.e. scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
DE69927552T 1998-06-12 1999-06-14 Mehrkanalige Integrationskugel Expired - Lifetime DE69927552T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/097,312 US6424413B1 (en) 1998-06-12 1998-06-12 Multi-channel integrating sphere

Publications (2)

Publication Number Publication Date
DE69927552D1 DE69927552D1 (de) 2006-02-16
DE69927552T2 true DE69927552T2 (de) 2006-06-14

Family

ID=22262735

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69927552T Expired - Lifetime DE69927552T2 (de) 1998-06-12 1999-06-14 Mehrkanalige Integrationskugel

Country Status (3)

Country Link
US (1) US6424413B1 (de)
EP (1) EP0964244B1 (de)
DE (1) DE69927552T2 (de)

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US6846085B2 (en) * 2001-01-19 2005-01-25 Dbm Optics, Incorporated Mitigating the effects of miniaturizing integrating spheres for fiber optic measurement
US6536736B2 (en) * 2001-07-16 2003-03-25 Agilent Technologies, Inc. Optomechanical mount for precisely steering/positioning a light beam
EP1314972B1 (de) 2001-11-26 2010-07-14 X-Rite Europe GmbH Spektralphotometer und Verwendung desselben
US6700657B1 (en) * 2002-05-10 2004-03-02 Schmitt Measurement Systems, Inc. System and method for detecting surface roughness
WO2004076992A2 (en) * 2003-02-24 2004-09-10 Gretagmacbeth, Llc Spectrophotometer and subassemblies thereof
JP4639179B2 (ja) 2003-02-28 2011-02-23 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 面を観察するスキャタロメータ及び方法
US20050078911A1 (en) * 2003-10-14 2005-04-14 Mikes Thomas L. System and method for using a concentric spectrometer to multiplex or demultiplex optical signals
ATE525637T1 (de) * 2005-03-04 2011-10-15 Sun Chemical Corp Verfahren zur messung der trübung eines films
US7365925B2 (en) * 2006-03-30 2008-04-29 Agilent Technologies, Inc. Method of aligning optical elements
EP2074408A1 (de) * 2006-10-05 2009-07-01 Koninklijke Philips Electronics N.V. Vorrichtung und verfahren zur beobachtung der oberfläche einer probe
DE102009011381A1 (de) * 2009-03-05 2010-09-09 Flore, Ingo, Dr. Diagnostische Messvorrichtung
DE102009040642B3 (de) * 2009-09-09 2011-03-10 Von Ardenne Anlagentechnik Gmbh Verfahren und Vorrichtung zur Messung von optischen Kenngrößen transparenter, streuender Messobjekte
US8854734B2 (en) * 2009-11-12 2014-10-07 Vela Technologies, Inc. Integrating optical system and methods
US8426800B2 (en) * 2010-09-09 2013-04-23 Vela Technologies, Inc. Integrating optical systems and methods
JP5985629B2 (ja) * 2012-06-15 2016-09-06 パイオニア株式会社 測光装置
JP6185864B2 (ja) * 2013-06-07 2017-08-23 本田技研工業株式会社 積分球
WO2015151233A1 (ja) * 2014-04-01 2015-10-08 株式会社島津製作所 分光測定装置及び積分球
JP6790828B2 (ja) * 2014-12-10 2020-11-25 コニカミノルタ株式会社 照明装置及び反射特性測定装置
WO2016208456A1 (ja) * 2015-06-26 2016-12-29 コニカミノルタ株式会社 マルチアングル測色計
CN108369137B (zh) * 2015-10-20 2021-06-29 光谱化有限公司 全太阳光谱装置和方法
TWI560432B (en) * 2015-12-31 2016-12-01 Mpi Corp Integrating sphere cover and integrating sphere module
US10983045B2 (en) 2016-10-11 2021-04-20 Victoria Link Limited Spectrometer apparatus for measuring spectra of a liquid sample using an integrating cavity
USD860825S1 (en) * 2018-08-06 2019-09-24 Li-Chuan Chen Integrating sphere
US10591354B1 (en) 2018-10-30 2020-03-17 Datacolor Inc. Simultaneous SCE and SCI measurements
JP7261473B2 (ja) * 2019-06-12 2023-04-20 公立大学法人大阪 照明装置
CN114364953B (zh) * 2019-09-12 2024-03-29 柯尼卡美能达株式会社 测色装置
CN111983831A (zh) * 2020-08-07 2020-11-24 深圳市华星光电半导体显示技术有限公司 一种液晶面板反射率检测装置和检测方法
DE102020122041A1 (de) * 2020-08-24 2022-02-24 Claas Selbstfahrende Erntemaschinen Gmbh Optische Messeinrichtung
WO2023186538A1 (en) * 2022-03-30 2023-10-05 ams Sensors Germany GmbH Optical arrangement for optoelectronic reflective measurement

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US4487504A (en) * 1982-09-01 1984-12-11 Pacific Scientific Instruments Company Reflectance measuring instrument with integrating sphere
US4991106A (en) * 1983-03-02 1991-02-05 Alfa-Laval Ab Method and apparatus for aligning and analyzing sample and control signals
US4583860A (en) * 1983-11-30 1986-04-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Optical multiple sample vacuum integrating sphere
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US4673818A (en) * 1985-11-25 1987-06-16 Polaroid Corporation Roughness measuring apparatus
US4995727A (en) * 1987-05-22 1991-02-26 Minolta Camera Kabushiki Kaisha Compact diffusion light mixing box and colorimeter
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DE3818815A1 (de) * 1988-06-03 1989-12-14 Zeiss Carl Fa Remissionsmessgeraet
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US5258363A (en) * 1989-03-21 1993-11-02 Troy Investments Inc. Superconducting integrating spheres
DE4030836A1 (de) * 1990-09-28 1992-04-02 Kim Yoon Ok Vorrichtung zur qualitativen und/oder quantitativen bestimmung der zusammensetzung einer zu analysierenden probe
US5272518A (en) * 1990-12-17 1993-12-21 Hewlett-Packard Company Colorimeter and calibration system
US5268749A (en) * 1991-07-26 1993-12-07 Kollmorgen Corporation Apparatus and method for providing uniform illumination of a sample plane
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JP3117565B2 (ja) * 1992-11-27 2000-12-18 松下電器産業株式会社 光束計
JP2745102B2 (ja) * 1992-12-02 1998-04-28 ローレルバンクマシン株式会社 硬貨判別装置
US5377000A (en) * 1993-04-29 1994-12-27 Color And Appearance Technology, Inc. Portable appearance measuring apparatus
JPH07301598A (ja) * 1993-10-07 1995-11-14 Masato Mamiya 光センサープローブ
JP3464824B2 (ja) * 1994-03-07 2003-11-10 株式会社リコー 光学測定装置
DE4423698A1 (de) * 1994-06-24 1996-01-04 Ingo Hennig Meßanordnung zur optoelektronischen Bestimmung des gerichteten und gestreuten Anteils der Reflexion von Körperoberflächen
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Also Published As

Publication number Publication date
US6424413B1 (en) 2002-07-23
DE69927552D1 (de) 2006-02-16
EP0964244B1 (de) 2005-10-05
EP0964244A1 (de) 1999-12-15

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