DE69920143D1 - Verfahren für die Feststellung des Schwärzens einer Lampe - Google Patents

Verfahren für die Feststellung des Schwärzens einer Lampe

Info

Publication number
DE69920143D1
DE69920143D1 DE69920143T DE69920143T DE69920143D1 DE 69920143 D1 DE69920143 D1 DE 69920143D1 DE 69920143 T DE69920143 T DE 69920143T DE 69920143 T DE69920143 T DE 69920143T DE 69920143 D1 DE69920143 D1 DE 69920143D1
Authority
DE
Germany
Prior art keywords
blackening
lamp
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69920143T
Other languages
English (en)
Other versions
DE69920143T2 (de
Inventor
Tetsuji Arai
Shinji Suzuki
Yoshiki Mimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ushio Denki KK
Original Assignee
Ushio Denki KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ushio Denki KK filed Critical Ushio Denki KK
Application granted granted Critical
Publication of DE69920143D1 publication Critical patent/DE69920143D1/de
Publication of DE69920143T2 publication Critical patent/DE69920143T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
DE69920143T 1998-12-01 1999-12-01 Verfahren für die Feststellung des Schwärzens einer Lampe Expired - Lifetime DE69920143T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP34129398 1998-12-01
JP34129398A JP3438624B2 (ja) 1998-12-01 1998-12-01 ランプの黒化検出方法

Publications (2)

Publication Number Publication Date
DE69920143D1 true DE69920143D1 (de) 2004-10-21
DE69920143T2 DE69920143T2 (de) 2005-09-22

Family

ID=18344940

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69920143T Expired - Lifetime DE69920143T2 (de) 1998-12-01 1999-12-01 Verfahren für die Feststellung des Schwärzens einer Lampe

Country Status (6)

Country Link
US (1) US6365899B1 (de)
EP (1) EP1006553B1 (de)
JP (1) JP3438624B2 (de)
KR (1) KR20000047843A (de)
DE (1) DE69920143T2 (de)
TW (1) TW449659B (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3438624B2 (ja) * 1998-12-01 2003-08-18 ウシオ電機株式会社 ランプの黒化検出方法
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
DE102004060592A1 (de) * 2004-12-16 2006-07-06 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH Verfahren und Vorrichtung zur Bestimmung der Kolbentemperatur von Hochdruck-Entladungslampen
US8179532B1 (en) * 2011-02-02 2012-05-15 Christie Digital Systems Usa, Inc. Method and apparatus for monitoring the condition of a projector lamp
JP5834257B2 (ja) * 2011-05-25 2015-12-16 パナソニックＩｐマネジメント株式会社 可変色発光装置及びそれを用いた照明器具
CN104006878B (zh) * 2014-06-16 2015-12-02 中国工程物理研究院应用电子学研究所 激光能量计校准用大功率卤钨灯残余能量辐射效率测量系统及测量方法
US11213423B2 (en) 2015-03-31 2022-01-04 Zoll Circulation, Inc. Proximal mounting of temperature sensor in intravascular temperature management catheter

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4252443A (en) * 1979-08-09 1981-02-24 Domtar Inc. Blackening sensor
US4271358A (en) * 1979-11-13 1981-06-02 Frank Schwarz Selective infrared detector
JPS57142548A (en) 1981-02-27 1982-09-03 Dainippon Screen Mfg Co Ltd Photographic density detector for film
US5092677A (en) 1989-08-02 1992-03-03 Artel, Inc. Photometer having a long lamp life, reduced warm-up period and resonant frequency mixing
JPH04351832A (ja) 1991-05-28 1992-12-07 Matsushita Electric Works Ltd 蛍光灯の黒化度測定方法及びその装置
US5399856A (en) * 1993-10-06 1995-03-21 Miles Inc. Ambient temperature reference device
JP3438624B2 (ja) * 1998-12-01 2003-08-18 ウシオ電機株式会社 ランプの黒化検出方法

Also Published As

Publication number Publication date
DE69920143T2 (de) 2005-09-22
US6365899B1 (en) 2002-04-02
TW449659B (en) 2001-08-11
JP2000162090A (ja) 2000-06-16
JP3438624B2 (ja) 2003-08-18
EP1006553B1 (de) 2004-09-15
KR20000047843A (ko) 2000-07-25
EP1006553A1 (de) 2000-06-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition