DE69826094D1 - Bestimmung von Metallverunreinigungen in einem Gas mittels Röntgenfluoreszenz - Google Patents

Bestimmung von Metallverunreinigungen in einem Gas mittels Röntgenfluoreszenz

Info

Publication number
DE69826094D1
DE69826094D1 DE69826094T DE69826094T DE69826094D1 DE 69826094 D1 DE69826094 D1 DE 69826094D1 DE 69826094 T DE69826094 T DE 69826094T DE 69826094 T DE69826094 T DE 69826094T DE 69826094 D1 DE69826094 D1 DE 69826094D1
Authority
DE
Germany
Prior art keywords
determination
gas
ray fluorescence
metal contaminants
contaminants
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69826094T
Other languages
English (en)
Other versions
DE69826094T2 (de
Inventor
Ce Ma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Linde LLC
Original Assignee
BOC Group Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BOC Group Inc filed Critical BOC Group Inc
Application granted granted Critical
Publication of DE69826094D1 publication Critical patent/DE69826094D1/de
Publication of DE69826094T2 publication Critical patent/DE69826094T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/0606—Investigating concentration of particle suspensions by collecting particles on a support
    • G01N15/0618—Investigating concentration of particle suspensions by collecting particles on a support of the filter type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69826094T 1997-11-05 1998-10-02 Bestimmung von Metallverunreinigungen in einem Gas mittels Röntgenfluoreszenz Expired - Fee Related DE69826094T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US964615 1997-11-05
US08/964,615 US6012325A (en) 1997-11-05 1997-11-05 Method and apparatus for measuring metallic impurities contained within a fluid

Publications (2)

Publication Number Publication Date
DE69826094D1 true DE69826094D1 (de) 2004-10-14
DE69826094T2 DE69826094T2 (de) 2005-05-19

Family

ID=25508767

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69826094T Expired - Fee Related DE69826094T2 (de) 1997-11-05 1998-10-02 Bestimmung von Metallverunreinigungen in einem Gas mittels Röntgenfluoreszenz

Country Status (4)

Country Link
US (1) US6012325A (de)
EP (1) EP0916940B1 (de)
DE (1) DE69826094T2 (de)
ES (1) ES2224336T3 (de)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996028729A1 (fr) * 1995-03-14 1996-09-19 Nippon Steel Corporation Dispositif et technique d'evaluation de la proprete du metal
EP1232388A2 (de) 1999-11-19 2002-08-21 Battelle Memorial Institute Vorrichtung zur maschinenflüssigkeitsmessung
EP1251935A1 (de) * 2000-01-14 2002-10-30 Pall Corporation Gasanalysefilter
US6858148B2 (en) * 2003-07-16 2005-02-22 The Regents Of The University Of California Method and apparatus for detecting chemical binding
US6668039B2 (en) 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis
US7016462B1 (en) * 2002-11-08 2006-03-21 Interscience, Inc. Ionic pre-concentration XRF identification and analysis device, system and method
US6859517B2 (en) * 2003-04-22 2005-02-22 Battelle Memorial Institute Dual x-ray fluorescence spectrometer and method for fluid analysis
US7184515B2 (en) * 2004-09-24 2007-02-27 Battelle Memorial Institute Component specific machine wear determination with x-ray fluorescence spectrometry
EP1811291B1 (de) * 2004-11-08 2014-04-30 Hitachi High-Tech Science Corporation Fluoreszenzröntgenanalysevorrichtung
US7539282B2 (en) * 2005-04-07 2009-05-26 Cooper Environmental Services Llc XRF analyzer
US7474730B2 (en) * 2006-10-17 2009-01-06 Oxford Instruments Analytical Oy Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser
DE102007039000B4 (de) * 2007-05-21 2009-01-22 Terrachem Gmbh Analysenlabor Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper
RU2479836C2 (ru) * 2007-11-30 2013-04-20 Икс-Рей Оптикал Системс, Инк. Предварительно покрытые пленкой ячейки точного дозирования для рентгеноструктурного анализатора
WO2009108628A2 (en) * 2008-02-25 2009-09-03 X-Ray Optical Systems, Inc. Sample module with sample stream spaced from window, for x-ray analysis system
CN102042991A (zh) * 2009-10-09 2011-05-04 株式会社堀场制作所 荧光x射线分析用试样室和试样室组装用具
JP2011145162A (ja) * 2010-01-14 2011-07-28 Japan Atomic Energy Agency 流体中微粒子のｘ線検出法
WO2011100222A2 (en) 2010-02-09 2011-08-18 X-Ray Optical Systems, Inc. Sample module with sample stream supported and spaced from window, for x-ray analysis system
WO2011100437A2 (en) * 2010-02-10 2011-08-18 Schlumberger Norge As X-ray fluorescence analyzer
US9244026B2 (en) 2010-02-10 2016-01-26 Schlumberger Norge As X-ray fluorescence analyzer
US8701465B2 (en) * 2011-04-28 2014-04-22 Honeywell International Inc. Photoacoustic sensor diffusion membrane attachment structure
US20140060738A1 (en) * 2012-08-31 2014-03-06 Semes Co., Ltd. Apparatus for treating substrate
US10133173B2 (en) * 2012-09-27 2018-11-20 SCREEN Holdings Co., Ltd. Processing fluid supply device, substrate processing device, processing fluid supply method, substrate processing method, processing fluid processing device, and processing fluid processing method
DE102012110321A1 (de) * 2012-10-29 2014-04-30 Dr. Ing. H.C. F. Porsche Aktiengesellschaft System zum Untersuchen von Motorenöl
JP6081260B2 (ja) * 2013-03-28 2017-02-15 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
GB201315024D0 (en) 2013-08-22 2013-10-02 Univ Leicester Lubricant analysis
CN103995009A (zh) * 2014-05-06 2014-08-20 黄冈师范学院 一种扫描电镜专用电池测试密封盒
CN105319230A (zh) * 2015-12-10 2016-02-10 黄冈师范学院 原位xrd电池测试密封盒
US10794820B2 (en) * 2016-08-24 2020-10-06 Ying Wang Methods for analyzing ultra-trace amounts of metals in liquids
AU2019322935B2 (en) * 2018-08-17 2022-03-10 MicroTrace Pty. Ltd. Apparatus for the measurement of mineral slurries
US20230018020A1 (en) * 2019-12-13 2023-01-19 Schlumberger Technology Corporation Measurement of metal or alloy coating
US11892421B2 (en) 2021-12-06 2024-02-06 Schlumberger Technology Corporation System and method for cleaning electrical stability probe

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1110284A (en) * 1965-06-22 1968-04-18 Nat Res Dev Improvements in or relating to the continuous analysis of the solid component of a slurry
US4544386A (en) * 1983-05-23 1985-10-01 Environmental Safety Products, Inc. Filter cassette
USH188H (en) * 1986-02-03 1987-01-06 The United States Of America As Represented By The Secretary Of The Army Monitor for airborne dusts
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
US5563929A (en) * 1994-02-18 1996-10-08 The Electric Power Research Institute On-line monitor for particulate analyte in a moving liquid
US5618996A (en) * 1996-03-01 1997-04-08 American Air Liquide Inc. Metal sampling method and system for non-hydrolyzable gases

Also Published As

Publication number Publication date
DE69826094T2 (de) 2005-05-19
EP0916940B1 (de) 2004-09-08
EP0916940A1 (de) 1999-05-19
ES2224336T3 (es) 2005-03-01
US6012325A (en) 2000-01-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee