DE69807861D1 - Restspannungsmessverfahren - Google Patents
RestspannungsmessverfahrenInfo
- Publication number
- DE69807861D1 DE69807861D1 DE69807861T DE69807861T DE69807861D1 DE 69807861 D1 DE69807861 D1 DE 69807861D1 DE 69807861 T DE69807861 T DE 69807861T DE 69807861 T DE69807861 T DE 69807861T DE 69807861 D1 DE69807861 D1 DE 69807861D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring method
- voltage measuring
- rest voltage
- rest
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/11—Analysing solids by measuring attenuation of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
- G01N29/346—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with amplitude characteristics, e.g. modulated signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
- G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
- G01N29/40—Detecting the response signal, e.g. electronic circuits specially adapted therefor by amplitude filtering, e.g. by applying a threshold or by gain control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
- G01N29/42—Detecting the response signal, e.g. electronic circuits specially adapted therefor by frequency filtering or by tuning to resonant frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/50—Processing the detected response signal, e.g. electronic circuits specially adapted therefor using auto-correlation techniques or cross-correlation techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/048—Transmission, i.e. analysed material between transmitter and receiver
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Acoustics & Sound (AREA)
- Mathematical Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP97201471A EP0878710A1 (de) | 1997-05-15 | 1997-05-15 | Restspannungsmessverfahren |
PCT/EP1998/003003 WO1998052032A1 (en) | 1997-05-15 | 1998-05-15 | Method for residual stress measuring |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69807861D1 true DE69807861D1 (de) | 2002-10-17 |
DE69807861T2 DE69807861T2 (de) | 2003-05-22 |
Family
ID=8228323
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69807861T Expired - Lifetime DE69807861T2 (de) | 1997-05-15 | 1998-05-15 | Restspannungsmessverfahren |
Country Status (7)
Country | Link |
---|---|
US (1) | US6234020B1 (de) |
EP (2) | EP0878710A1 (de) |
JP (1) | JP3413603B2 (de) |
CN (1) | CN1129793C (de) |
AU (1) | AU8105698A (de) |
DE (1) | DE69807861T2 (de) |
WO (1) | WO1998052032A1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101320018B (zh) * | 2008-07-21 | 2010-12-08 | 哈尔滨工业大学 | 基于焊接结构残余应力超声波无损测量装置的超声波无损测量方法 |
WO2012056913A1 (en) * | 2010-10-26 | 2012-05-03 | Sintokogio, Ltd. | Evaluation method and evaluation system for impact force of laser irradiation during laser peening and laser peening method and laser peening system |
CN103017953A (zh) * | 2011-09-22 | 2013-04-03 | 北京理工大学 | 金属材料近表面残余应力检测装置 |
JP5955301B2 (ja) * | 2013-11-14 | 2016-07-20 | 株式会社神戸製鋼所 | 残留応力算出方法 |
CN103616129A (zh) * | 2013-12-09 | 2014-03-05 | 北京理工大学 | 一种用于拉压残余应力超声检测系统的自动校准方法 |
CN103884591B (zh) * | 2014-03-05 | 2016-01-13 | 上海交通大学 | 连续纤维增强金属基复合材料残余应力单调加载测试方法 |
CN104048785B (zh) * | 2014-06-09 | 2016-02-24 | 中国航空工业集团公司北京航空材料研究院 | 一种超声无损评价铝合金锻件内部残余应力水平的方法 |
WO2016090589A1 (zh) * | 2014-12-11 | 2016-06-16 | 烟台富润实业有限公司 | 一种激光超声金属材料残余应力的无损测量方法及设备 |
CN104990656B (zh) * | 2015-06-17 | 2017-04-26 | 广西南南铝加工有限公司 | 一种超声波无损评估铝合金预拉伸板残余应力的方法 |
CN105628276B (zh) * | 2015-12-24 | 2018-11-20 | 中北大学 | 一种超超临界锅炉用耐热钢管残余应力测试方法 |
CN109541035A (zh) * | 2018-12-19 | 2019-03-29 | 中钢集团邢台机械轧辊有限公司 | 一种钢铁铸件与钢铁锻件的甄别方法 |
CN109682502B (zh) * | 2018-12-31 | 2023-11-03 | 浙江大学 | 一种定量评估导电游丝残余应力变化的装置 |
CN109764986B (zh) * | 2019-01-08 | 2020-11-27 | 哈尔滨工业大学(深圳) | 一种基于超声横波相位谱的钢构件平面应力检测方法 |
CN110632177B (zh) * | 2019-10-24 | 2020-07-14 | 大连理工大学 | 一种平面残余应力电磁超声检测方法 |
CN112880895B (zh) * | 2019-11-29 | 2022-09-20 | 哈尔滨工业大学 | 一种基于非线性超声波的大型高速回转装备叶片残余应力测量方法 |
CN112067183B (zh) * | 2020-09-23 | 2022-10-25 | 南昌航空大学 | 一种带耦合剂的超声波复合材料残余应力测试方法 |
CN115629130B (zh) * | 2022-12-21 | 2023-04-28 | 国网天津市电力公司电力科学研究院 | 盆式绝缘子残余应力的成像方法、系统及试块制备方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3991607A (en) * | 1975-09-08 | 1976-11-16 | Krautkramer-Branson, Incorporated | High resolution pulse-echo ultrasonic method and apparatus |
JPS60122367A (ja) * | 1983-12-07 | 1985-06-29 | Terumo Corp | 超音波測定方法およびその装置 |
FR2646239B1 (fr) * | 1989-04-24 | 1991-08-16 | Dassault Avions | Procede et dispositif acoustique de localisation de defauts du materiau constituant une piece et emetteur acoustique utilisable dans ce dispositif |
US5305239A (en) * | 1989-10-04 | 1994-04-19 | The Texas A&M University System | Ultrasonic non-destructive evaluation of thin specimens |
US5474070A (en) * | 1989-11-17 | 1995-12-12 | The Board Of Regents Of The University Of Texas System | Method and apparatus for elastographic measurement and imaging |
DE69106209T2 (de) * | 1990-04-27 | 1995-08-31 | Mitsubishi Electric Corp | Aufsichtsvorrichtung. |
-
1997
- 1997-05-15 EP EP97201471A patent/EP0878710A1/de not_active Withdrawn
-
1998
- 1998-05-15 JP JP54882098A patent/JP3413603B2/ja not_active Expired - Fee Related
- 1998-05-15 DE DE69807861T patent/DE69807861T2/de not_active Expired - Lifetime
- 1998-05-15 WO PCT/EP1998/003003 patent/WO1998052032A1/en active IP Right Grant
- 1998-05-15 CN CN98806517.7A patent/CN1129793C/zh not_active Expired - Lifetime
- 1998-05-15 US US09/402,901 patent/US6234020B1/en not_active Expired - Lifetime
- 1998-05-15 AU AU81056/98A patent/AU8105698A/en not_active Abandoned
- 1998-05-15 EP EP98930717A patent/EP0981740B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2002509607A (ja) | 2002-03-26 |
CN1261434A (zh) | 2000-07-26 |
DE69807861T2 (de) | 2003-05-22 |
WO1998052032A1 (en) | 1998-11-19 |
US6234020B1 (en) | 2001-05-22 |
AU8105698A (en) | 1998-12-08 |
EP0981740A1 (de) | 2000-03-01 |
EP0878710A1 (de) | 1998-11-18 |
EP0981740B1 (de) | 2002-09-11 |
JP3413603B2 (ja) | 2003-06-03 |
CN1129793C (zh) | 2003-12-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |