DE69802856D1 - Vorrichtung und Methode zur Detektion von elektromagnetischer Strahlung oder ionisierender Teilchen - Google Patents

Vorrichtung und Methode zur Detektion von elektromagnetischer Strahlung oder ionisierender Teilchen

Info

Publication number
DE69802856D1
DE69802856D1 DE69802856T DE69802856T DE69802856D1 DE 69802856 D1 DE69802856 D1 DE 69802856D1 DE 69802856 T DE69802856 T DE 69802856T DE 69802856 T DE69802856 T DE 69802856T DE 69802856 D1 DE69802856 D1 DE 69802856D1
Authority
DE
Germany
Prior art keywords
detection
electromagnetic radiation
ionizing particles
ionizing
particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69802856T
Other languages
English (en)
Other versions
DE69802856T2 (de
Inventor
Andrea Castoldi
Emilio Gatti
Chiara Guazzoni
Antonio Longoni
Pavel Rehak
Lothar Strueder
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Instituto Nazionale di Fisica Nucleare INFN
Original Assignee
Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Instituto Nazionale di Fisica Nucleare INFN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft zur Foerderung der Wissenschaften eV, Instituto Nazionale di Fisica Nucleare INFN filed Critical Max Planck Gesellschaft zur Foerderung der Wissenschaften eV
Application granted granted Critical
Publication of DE69802856D1 publication Critical patent/DE69802856D1/de
Publication of DE69802856T2 publication Critical patent/DE69802856T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Light Receiving Elements (AREA)
DE69802856T 1997-02-27 1998-02-24 Vorrichtung und Methode zur Detektion von elektromagnetischer Strahlung oder ionisierender Teilchen Expired - Lifetime DE69802856T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT97MI000423A IT1290553B1 (it) 1997-02-27 1997-02-27 Rivelatore dell'energia e della posizione di incidenza di radiazioni elettromagnetiche o di particelle ionizzanti a deriva controllata

Publications (2)

Publication Number Publication Date
DE69802856D1 true DE69802856D1 (de) 2002-01-24
DE69802856T2 DE69802856T2 (de) 2002-08-14

Family

ID=11376194

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69802856T Expired - Lifetime DE69802856T2 (de) 1997-02-27 1998-02-24 Vorrichtung und Methode zur Detektion von elektromagnetischer Strahlung oder ionisierender Teilchen

Country Status (4)

Country Link
US (1) US6249033B1 (de)
EP (1) EP0862226B1 (de)
DE (1) DE69802856T2 (de)
IT (1) IT1290553B1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110168732A (zh) * 2016-12-22 2019-08-23 宽腾矽公司 具有直接合并像素的整合式光电侦测器

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1583150A1 (de) 2004-03-31 2005-10-05 CSEM Centre Suisse d'Electronique et de Microtechnique SA Bildsensor mit grossflächigen, hochgeschwindigen, hochempfindlichen Pixeln
US20070072332A1 (en) * 2005-09-26 2007-03-29 Josef Kemmer Semiconductor radiation detectors and method for fabrication thereof
EP1873834B1 (de) * 2006-06-29 2008-12-10 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Löschbarriere, insbesondere für einem Halbleiterdetektor, und zugehöriges Betriebsverfahren
GB2446429A (en) 2006-12-08 2008-08-13 E2V Tech Photosensor with variable sensing area
US8698091B2 (en) 2009-06-10 2014-04-15 Moxtek, Inc. Semiconductor MOS entrance window for radiation detectors
US8314468B2 (en) * 2009-06-10 2012-11-20 Moxtek, Inc. Variable ring width SDD
US20110192984A1 (en) * 2010-02-09 2011-08-11 Weinberg Medical Physics Llc Method and equipment for producing drift detectors
WO2013063032A1 (en) * 2011-10-25 2013-05-02 Brookhaven Science Associates, Llc Spiral biasing adaptor for use in si drift detectors and si drift detector arrays
US9530902B2 (en) * 2012-06-20 2016-12-27 Oxford Instruments Analytical Oy Two-dimensional guard structure and a radiation detector with the same
DE102013015403B4 (de) 2012-09-20 2021-11-25 Infineon Technologies Ag Herstellung eines Bildwandlergeräts und Bildwandlergerät
US9759658B2 (en) 2014-08-08 2017-09-12 Quantum-Si Incorporated Integrated device for temporal binning of received photons
ITUB20159390A1 (it) * 2015-12-24 2017-06-24 Fond Bruno Kessler Rivelatore a semiconduttore, rivelatore di radiazione e apparecchiatura di rivelazione di radiazione.
IT201700122669A1 (it) * 2017-10-27 2019-04-27 Lfoundry Srl Sensore integrato di radiazione ionizzante e di particelle ionizzanti
US20210335866A1 (en) * 2020-04-28 2021-10-28 Lawrence Livermore National Security, Llc High temporal resolution solid-state x-ray detection system

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2118846A1 (en) * 1970-12-22 1972-08-04 Radiotechnique Compelec Semiconductor detector for radiation - having separated semiconducting zones of opposite type on base material
DE3586279D1 (de) * 1984-04-25 1992-08-06 Josef Dr Kemmer Verarmtes halbleiterelement mit einem potential-minimum fuer majoritaetstraeger.
JP2557750B2 (ja) * 1991-02-27 1996-11-27 三洋電機株式会社 光半導体装置
US5466954A (en) * 1994-12-21 1995-11-14 Honeywell Inc. Shunt phototransistor with reverse bias protection
US5889313A (en) * 1996-02-08 1999-03-30 University Of Hawaii Three-dimensional architecture for solid state radiation detectors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110168732A (zh) * 2016-12-22 2019-08-23 宽腾矽公司 具有直接合并像素的整合式光电侦测器
CN110168732B (zh) * 2016-12-22 2024-03-08 宽腾矽公司 具有直接合并像素的整合式光电侦测器

Also Published As

Publication number Publication date
DE69802856T2 (de) 2002-08-14
IT1290553B1 (it) 1998-12-10
EP0862226A3 (de) 1999-04-07
ITMI970423A1 (it) 1998-08-27
EP0862226A2 (de) 1998-09-02
EP0862226B1 (de) 2001-12-12
US6249033B1 (en) 2001-06-19

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