DE69735565D1 - Optisches Messgerät mit wellenlängenselektiver Lichtquelle - Google Patents
Optisches Messgerät mit wellenlängenselektiver LichtquelleInfo
- Publication number
- DE69735565D1 DE69735565D1 DE69735565T DE69735565T DE69735565D1 DE 69735565 D1 DE69735565 D1 DE 69735565D1 DE 69735565 T DE69735565 T DE 69735565T DE 69735565 T DE69735565 T DE 69735565T DE 69735565 D1 DE69735565 D1 DE 69735565D1
- Authority
- DE
- Germany
- Prior art keywords
- wavelength
- light source
- measuring device
- optical measuring
- selective light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/1256—Generating the spectrum; Monochromators using acousto-optic tunable filter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22063996 | 1996-08-02 | ||
JP22063996 | 1996-08-02 | ||
JP24890396 | 1996-08-30 | ||
JP24890396 | 1996-08-30 | ||
JP30582396 | 1996-10-30 | ||
JP30582396 | 1996-10-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69735565D1 true DE69735565D1 (de) | 2006-05-18 |
DE69735565T2 DE69735565T2 (de) | 2006-08-24 |
Family
ID=27330467
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69735565T Expired - Lifetime DE69735565T2 (de) | 1996-08-02 | 1997-07-29 | Optisches Messgerät mit wellenlängenselektiver Lichtquelle |
DE69730921T Expired - Lifetime DE69730921T2 (de) | 1996-08-02 | 1997-07-29 | Optisches Messgerät mit wellenlängenselektiver Lichtquelle |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69730921T Expired - Lifetime DE69730921T2 (de) | 1996-08-02 | 1997-07-29 | Optisches Messgerät mit wellenlängenselektiver Lichtquelle |
Country Status (3)
Country | Link |
---|---|
US (1) | US5949540A (de) |
EP (2) | EP1447651B1 (de) |
DE (2) | DE69735565T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3654458B2 (ja) * | 1995-10-31 | 2005-06-02 | アークレイ株式会社 | 光源装置 |
JPH09122128A (ja) | 1995-10-31 | 1997-05-13 | Kdk Corp | 測定条件再現具ならびに測定条件再現方法およびそれ を利用した生体情報測定装置 |
US6898537B1 (en) * | 2001-04-27 | 2005-05-24 | Nanometrics Incorporated | Measurement of diffracting structures using one-half of the non-zero diffracted orders |
JP2009527333A (ja) * | 2006-02-22 | 2009-07-30 | ヴィヴァム ネクサス エルエルシー | 検体測定装置及び方法 |
TW201435317A (zh) | 2013-02-28 | 2014-09-16 | Otsuka Denshi Kk | 分光光度計及分光光度測定方法 |
WO2017141020A1 (en) | 2016-02-19 | 2017-08-24 | Bae Systems Plc | Optical sensing and communications system |
GB2547486B (en) * | 2016-02-19 | 2021-05-12 | Bae Systems Plc | Optical sensing and communications system |
EP3324173B1 (de) | 2017-07-03 | 2019-04-17 | Fyla Laser, S.L. | System und verfahren zur lichtinspektion der oberfläche und des innern einer probe |
CN111912459A (zh) * | 2020-07-23 | 2020-11-10 | 重庆大学 | 电树枝的声光组合在线测量方法 |
CN111912460A (zh) * | 2020-07-23 | 2020-11-10 | 重庆大学 | 电树枝在线监测的声光组合装置 |
CN113654655A (zh) * | 2021-08-24 | 2021-11-16 | 宁波工程学院 | 太阳能追日用可见光光敏电阻检测方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS545987B2 (de) * | 1972-12-28 | 1979-03-23 | ||
US4467203A (en) * | 1981-10-19 | 1984-08-21 | Panametrics, Inc. | Low noise amplifier and method for energy biased radiation sensitive receiver |
US4449821A (en) * | 1982-07-14 | 1984-05-22 | E. I. Du Pont De Nemours And Company | Process colorimeter |
US5040889A (en) * | 1986-05-30 | 1991-08-20 | Pacific Scientific Company | Spectrometer with combined visible and ultraviolet sample illumination |
US5066132A (en) * | 1989-08-09 | 1991-11-19 | Sunstar Engineering, Inc. | Method of and apparatus for inspecting paint coating |
US5039855A (en) * | 1990-03-05 | 1991-08-13 | Bran+Luebbe Analyzing Technologies, Inc. | Dual beam acousto-optic tunable spectrometer |
US5296910A (en) * | 1992-10-05 | 1994-03-22 | University Of Akransas | Method and apparatus for particle analysis |
US5444528A (en) * | 1994-07-27 | 1995-08-22 | The Titan Corporation | Tunable spectrometer with acousto-optical tunable filter |
US5477321A (en) * | 1994-08-31 | 1995-12-19 | Bayer Corporation | Dual beam tunable spectrometer |
-
1997
- 1997-07-29 EP EP04004730A patent/EP1447651B1/de not_active Expired - Lifetime
- 1997-07-29 EP EP97113023A patent/EP0822394B1/de not_active Expired - Lifetime
- 1997-07-29 DE DE69735565T patent/DE69735565T2/de not_active Expired - Lifetime
- 1997-07-29 DE DE69730921T patent/DE69730921T2/de not_active Expired - Lifetime
- 1997-07-30 US US08/903,154 patent/US5949540A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69730921D1 (de) | 2004-11-04 |
EP0822394A2 (de) | 1998-02-04 |
EP0822394B1 (de) | 2004-09-29 |
DE69730921T2 (de) | 2006-02-23 |
EP1447651A1 (de) | 2004-08-18 |
EP0822394A3 (de) | 2000-03-29 |
US5949540A (en) | 1999-09-07 |
DE69735565T2 (de) | 2006-08-24 |
EP1447651B1 (de) | 2006-03-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |