DE69710132T2 - Emulationsvorrichtung zur Vermeidung eines fehlerhaften Betriebs wegen Störungen - Google Patents

Emulationsvorrichtung zur Vermeidung eines fehlerhaften Betriebs wegen Störungen

Info

Publication number
DE69710132T2
DE69710132T2 DE69710132T DE69710132T DE69710132T2 DE 69710132 T2 DE69710132 T2 DE 69710132T2 DE 69710132 T DE69710132 T DE 69710132T DE 69710132 T DE69710132 T DE 69710132T DE 69710132 T2 DE69710132 T2 DE 69710132T2
Authority
DE
Germany
Prior art keywords
malfunctions
operation due
faulty operation
emulation device
avoid faulty
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69710132T
Other languages
English (en)
Other versions
DE69710132D1 (de
Inventor
Tetsuya Sakairi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69710132D1 publication Critical patent/DE69710132D1/de
Publication of DE69710132T2 publication Critical patent/DE69710132T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3648Software debugging using additional hardware
    • G06F11/3656Software debugging using additional hardware using a specific debug interface
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B30PRESSES
    • B30BPRESSES IN GENERAL
    • B30B1/00Presses, using a press ram, characterised by the features of the drive therefor, pressure being transmitted directly, or through simple thrust or tension members only, to the press ram or platen
    • B30B1/02Presses, using a press ram, characterised by the features of the drive therefor, pressure being transmitted directly, or through simple thrust or tension members only, to the press ram or platen by lever mechanism
    • B30B1/06Presses, using a press ram, characterised by the features of the drive therefor, pressure being transmitted directly, or through simple thrust or tension members only, to the press ram or platen by lever mechanism operated by cams, eccentrics, or cranks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B30PRESSES
    • B30BPRESSES IN GENERAL
    • B30B15/00Details of, or accessories for, presses; Auxiliary measures in connection with pressing
    • B30B15/30Feeding material to presses
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/261Functional testing by simulating additional hardware, e.g. fault simulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Mechanical Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Press Drives And Press Lines (AREA)
DE69710132T 1996-07-09 1997-07-07 Emulationsvorrichtung zur Vermeidung eines fehlerhaften Betriebs wegen Störungen Expired - Fee Related DE69710132T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8179181A JP3026299B2 (ja) 1996-07-09 1996-07-09 エミュレーション装置

Publications (2)

Publication Number Publication Date
DE69710132D1 DE69710132D1 (de) 2002-03-14
DE69710132T2 true DE69710132T2 (de) 2002-09-05

Family

ID=16061362

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69710132T Expired - Fee Related DE69710132T2 (de) 1996-07-09 1997-07-07 Emulationsvorrichtung zur Vermeidung eines fehlerhaften Betriebs wegen Störungen

Country Status (5)

Country Link
US (1) US6009260A (de)
EP (1) EP0820009B1 (de)
JP (1) JP3026299B2 (de)
KR (2) KR100291728B1 (de)
DE (1) DE69710132T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6701491B1 (en) 1999-06-26 2004-03-02 Sei-Yang Yang Input/output probing apparatus and input/output probing method using the same, and mixed emulation/simulation method based on it
US6947883B1 (en) * 2000-07-19 2005-09-20 Vikram Gupta Method for designing mixed signal integrated circuits and configurable synchronous digital noise emulator circuit
KR20030042747A (ko) * 2001-11-23 2003-06-02 주식회사 씨피씨 멀티 인라인 구동형 프레스장치
JP2008077176A (ja) * 2006-09-19 2008-04-03 Seiko Epson Corp エミュレーションシステム、エミュレーション方法
KR101113198B1 (ko) 2010-10-27 2012-02-15 (주)탑에이테크놀로지 멀티클립 매거진 및 멀티클립 매거진용 클램프

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH029937A (ja) * 1988-06-27 1990-01-12 Daihatsu Motor Co Ltd 排気還流制御装置の故障診断方法
US5581695A (en) * 1990-05-09 1996-12-03 Applied Microsystems Corporation Source-level run-time software code debugging instrument
US5056033A (en) * 1990-07-24 1991-10-08 Hewlett-Packard Company Microprocessor emulator active probe power supply
JPH04128940A (ja) * 1990-09-20 1992-04-30 Nec Ic Microcomput Syst Ltd エミュレータ
US5375228A (en) * 1991-02-04 1994-12-20 Analog Devices, Inc. Real-time signal analysis apparatus and method for digital signal processor emulation
JPH05257731A (ja) * 1992-03-11 1993-10-08 Nec Corp インサーキット・エミュレータ用プローブ終端装置
JPH05313936A (ja) * 1992-05-08 1993-11-26 Nec Corp インサーキットエミュレータ
US5383137A (en) * 1992-12-03 1995-01-17 Motorola, Inc. Emulation system and method for development of a low power data processor
JPH0728665A (ja) * 1993-07-07 1995-01-31 Nec Corp マイクロコンピュータ用エミュレーション装置
US5539901A (en) * 1993-09-30 1996-07-23 Intel Corporation Method and apparatus for system management mode support for in-circuit emulators
JPH08147185A (ja) * 1994-11-22 1996-06-07 Hitachi Ltd エミュレータ
US5630102A (en) * 1994-12-19 1997-05-13 Intel Corporation In-circuit-emulation event management system
JP3380827B2 (ja) * 1995-02-09 2003-02-24 三菱電機株式会社 エミュレータ装置
JPH08278900A (ja) * 1995-04-04 1996-10-22 Mitsubishi Electric Corp エミュレータプローブ
US5717699A (en) * 1996-07-18 1998-02-10 Hewlett-Packard Company Method and apparatus for accessing internal integrated circuit signals

Also Published As

Publication number Publication date
KR980008525A (ko) 1998-04-30
EP0820009A1 (de) 1998-01-21
US6009260A (en) 1999-12-28
KR100241633B1 (ko) 2000-03-02
DE69710132D1 (de) 2002-03-14
KR100291728B1 (ko) 2001-07-12
JPH1027112A (ja) 1998-01-27
JP3026299B2 (ja) 2000-03-27
EP0820009B1 (de) 2002-01-30
KR980010775A (ko) 1998-04-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8339 Ceased/non-payment of the annual fee