DE69623659D1 - Hochauflösender flacher sensor für strahlungsabbildungssystem - Google Patents

Hochauflösender flacher sensor für strahlungsabbildungssystem

Info

Publication number
DE69623659D1
DE69623659D1 DE69623659T DE69623659T DE69623659D1 DE 69623659 D1 DE69623659 D1 DE 69623659D1 DE 69623659 T DE69623659 T DE 69623659T DE 69623659 T DE69623659 T DE 69623659T DE 69623659 D1 DE69623659 D1 DE 69623659D1
Authority
DE
Germany
Prior art keywords
imaging system
radiation imaging
flat sensor
resolution flat
resolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69623659T
Other languages
English (en)
Other versions
DE69623659T2 (de
Inventor
Shou Huang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
iFire Technology Corp
Original Assignee
iFire Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by iFire Technology Inc filed Critical iFire Technology Inc
Application granted granted Critical
Publication of DE69623659D1 publication Critical patent/DE69623659D1/de
Publication of DE69623659T2 publication Critical patent/DE69623659T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE69623659T 1996-05-08 1996-05-08 Hochauflösender flacher sensor für strahlungsabbildungssystem Expired - Lifetime DE69623659T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CA1996/000294 WO1997042661A1 (en) 1996-05-08 1996-05-08 High resolution flat panel for radiation imaging

Publications (2)

Publication Number Publication Date
DE69623659D1 true DE69623659D1 (de) 2002-10-17
DE69623659T2 DE69623659T2 (de) 2003-05-08

Family

ID=4173152

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69623659T Expired - Lifetime DE69623659T2 (de) 1996-05-08 1996-05-08 Hochauflösender flacher sensor für strahlungsabbildungssystem

Country Status (5)

Country Link
US (1) US6232607B1 (de)
EP (1) EP0897597B1 (de)
JP (1) JP2000512804A (de)
DE (1) DE69623659T2 (de)
WO (1) WO1997042661A1 (de)

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US7009663B2 (en) 2003-12-17 2006-03-07 Planar Systems, Inc. Integrated optical light sensitive active matrix liquid crystal display
US7053967B2 (en) * 2002-05-23 2006-05-30 Planar Systems, Inc. Light sensitive display
US20080084374A1 (en) 2003-02-20 2008-04-10 Planar Systems, Inc. Light sensitive display
JP4307230B2 (ja) * 2003-12-05 2009-08-05 キヤノン株式会社 放射線撮像装置及び放射線撮像方法
US7773139B2 (en) * 2004-04-16 2010-08-10 Apple Inc. Image sensor with photosensitive thin film transistors
DE102004043693A1 (de) * 2004-09-09 2006-03-30 Siemens Ag Detektoranordnung für ein medizinisches Diagnosegerät sowie medizinisches bildgebendes Diagnoseverfahren
US7317190B2 (en) * 2004-09-24 2008-01-08 General Electric Company Radiation absorbing x-ray detector panel support
US7189972B2 (en) * 2004-10-04 2007-03-13 General Electric Company X-ray detector with impact absorbing cover
US7046764B1 (en) 2004-10-04 2006-05-16 General Electric Company X-ray detector having an accelerometer
US7866163B2 (en) * 2004-10-04 2011-01-11 General Electric Company Radiographic detector docking station with dynamic environmental control
US7342998B2 (en) * 2004-11-18 2008-03-11 General Electric Company X-ray detector quick-connect connection system
US7381964B1 (en) 2004-11-24 2008-06-03 General Electric Company Method and system of x-ray data calibration
US7581885B2 (en) * 2004-11-24 2009-09-01 General Electric Company Method and system of aligning x-ray detector for data acquisition
KR100889746B1 (ko) * 2007-03-09 2009-03-24 한국전자통신연구원 칼코젠 박막 트랜지스터 어레이를 포함하는 전자의료영상장치
US9310923B2 (en) 2010-12-03 2016-04-12 Apple Inc. Input device for touch sensitive devices
US8638320B2 (en) 2011-06-22 2014-01-28 Apple Inc. Stylus orientation detection
US9329703B2 (en) 2011-06-22 2016-05-03 Apple Inc. Intelligent stylus
US8928635B2 (en) 2011-06-22 2015-01-06 Apple Inc. Active stylus
US8884238B2 (en) * 2012-03-15 2014-11-11 Varian Medical Systems, Inc. X-ray matrix imager
US9029794B2 (en) 2012-03-15 2015-05-12 Varian Medical Systems, Inc. X-ray matrix imager based on a multiple-gate-line driving scheme and a shared-gate-line driving scheme
JP5895650B2 (ja) * 2012-03-28 2016-03-30 ソニー株式会社 撮像装置および撮像表示システム
US9176604B2 (en) 2012-07-27 2015-11-03 Apple Inc. Stylus device
US9557845B2 (en) 2012-07-27 2017-01-31 Apple Inc. Input device for and method of communication with capacitive devices through frequency variation
US9652090B2 (en) 2012-07-27 2017-05-16 Apple Inc. Device for digital communication through capacitive coupling
US10048775B2 (en) 2013-03-14 2018-08-14 Apple Inc. Stylus detection and demodulation
US10845901B2 (en) 2013-07-31 2020-11-24 Apple Inc. Touch controller architecture
US10061449B2 (en) 2014-12-04 2018-08-28 Apple Inc. Coarse scan and targeted active mode scan for touch and stylus
US10474277B2 (en) 2016-05-31 2019-11-12 Apple Inc. Position-based stylus communication
CN110192123B (zh) * 2017-01-23 2023-11-10 深圳帧观德芯科技有限公司 能识别和管理电荷共享的x射线检测器
KR102664422B1 (ko) * 2018-12-19 2024-05-09 엘지디스플레이 주식회사 디지털 엑스레이 검출장치 및 그의 구동방법
EP3823268B1 (de) * 2019-11-12 2024-02-28 Canon Kabushiki Kaisha Strahlungsabbildungsvorrichtung und strahlungsabbildungssystem

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FR2575602B1 (fr) 1984-12-27 1987-01-30 Thomson Csf Dispositif photosensible de grand format, et procede d'utilisation
FR2598250B1 (fr) 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
US4785186A (en) 1986-10-21 1988-11-15 Xerox Corporation Amorphous silicon ionizing particle detectors
FR2627923B1 (fr) 1988-02-26 1990-06-22 Thomson Csf Matrice d'elements photosensibles et detecteur de radiations comportant une telle matrice, notamment detecteur de rayons x a double energie
CA2065246C (en) 1989-09-06 2001-11-13 Larry E. Antonuk Multi-element-amorphous-silicon-detector-array for real-time imaging and dosimetry of megavoltage photons and diagnostic x-rays
US5262649A (en) 1989-09-06 1993-11-16 The Regents Of The University Of Michigan Thin-film, flat panel, pixelated detector array for real-time digital imaging and dosimetry of ionizing radiation
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DE4002431A1 (de) 1990-01-27 1991-08-01 Philips Patentverwaltung Sensormatrix
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JP3671056B2 (ja) 1993-12-20 2005-07-13 ゼネラル・エレクトリック・カンパニイ アドレス線修理構造及び薄膜作像装置に対する方法
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US5435608A (en) 1994-06-17 1995-07-25 General Electric Company Radiation imager with common passivation dielectric for gate electrode and photosensor
US5869837A (en) * 1994-07-27 1999-02-09 Litton Systems Canada Limited Radiation imaging panel
US5962856A (en) * 1995-04-28 1999-10-05 Sunnybrook Hospital Active matrix X-ray imaging array
DE69529096D1 (de) * 1995-07-31 2003-01-16 Ifire Technology Inc Flachbildschirm-strahlungsdetektor mit reduziertem elektronischen rauschen
DE69528384D1 (de) * 1995-07-31 2002-10-31 Fire Technology Inc Halbleiterschaltermatrix mit schutz vor elektrischer entladung und herstellungsverfahren
US5930591A (en) * 1997-04-23 1999-07-27 Litton Systems Canada Limited High resolution, low voltage flat-panel radiation imaging sensors

Also Published As

Publication number Publication date
DE69623659T2 (de) 2003-05-08
JP2000512804A (ja) 2000-09-26
WO1997042661A1 (en) 1997-11-13
US6232607B1 (en) 2001-05-15
EP0897597A1 (de) 1999-02-24
EP0897597B1 (de) 2002-09-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: KRAMER - BARSKE - SCHMIDTCHEN, 81245 MUENCHEN

8327 Change in the person/name/address of the patent owner

Owner name: IFIRE TECHNOLOGY CORP., FORT SASKATCHEWAN, ALBERTA