DE69618882D1 - Method and device for polishing semiconductor substrates - Google Patents
Method and device for polishing semiconductor substratesInfo
- Publication number
- DE69618882D1 DE69618882D1 DE69618882T DE69618882T DE69618882D1 DE 69618882 D1 DE69618882 D1 DE 69618882D1 DE 69618882 T DE69618882 T DE 69618882T DE 69618882 T DE69618882 T DE 69618882T DE 69618882 D1 DE69618882 D1 DE 69618882D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor substrates
- polishing semiconductor
- polishing
- substrates
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23135595 | 1995-09-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69618882D1 true DE69618882D1 (en) | 2002-03-14 |
DE69618882T2 DE69618882T2 (en) | 2002-07-11 |
Family
ID=16922329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69618882T Expired - Lifetime DE69618882T2 (en) | 1995-09-08 | 1996-08-29 | Method and device for polishing semiconductor substrates |
Country Status (4)
Country | Link |
---|---|
US (1) | US5866480A (en) |
EP (1) | EP0763402B1 (en) |
KR (1) | KR970018240A (en) |
DE (1) | DE69618882T2 (en) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2833552B2 (en) * | 1995-10-19 | 1998-12-09 | 日本電気株式会社 | Wafer polishing method and polishing apparatus |
JPH10329011A (en) | 1997-03-21 | 1998-12-15 | Canon Inc | Precise polishing device and method |
US5921849A (en) * | 1997-06-04 | 1999-07-13 | Speedfam Corporation | Method and apparatus for distributing a polishing agent onto a polishing element |
JP2000216120A (en) * | 1999-01-27 | 2000-08-04 | Mitsubishi Electric Corp | Polisher and manufacturing semiconductor device using the same |
US6429131B2 (en) * | 1999-03-18 | 2002-08-06 | Infineon Technologies Ag | CMP uniformity |
JP2001138233A (en) * | 1999-11-19 | 2001-05-22 | Sony Corp | Grinding apparatus, grinding method and cleaning method of grinding tool |
US6887132B2 (en) * | 2001-09-10 | 2005-05-03 | Multi Planar Technologies Incorporated | Slurry distributor for chemical mechanical polishing apparatus and method of using the same |
JP4101609B2 (en) * | 2001-12-07 | 2008-06-18 | 大日本スクリーン製造株式会社 | Substrate processing method |
JP2003324085A (en) * | 2002-05-01 | 2003-11-14 | Mitsubishi Electric Corp | Device and method for polishing semiconductor wafer |
US7128803B2 (en) * | 2002-06-28 | 2006-10-31 | Lam Research Corporation | Integration of sensor based metrology into semiconductor processing tools |
US7309618B2 (en) | 2002-06-28 | 2007-12-18 | Lam Research Corporation | Method and apparatus for real time metal film thickness measurement |
JP2005271151A (en) * | 2004-03-25 | 2005-10-06 | Toshiba Corp | Polishing apparatus and polishing method |
JP5298383B2 (en) * | 2007-04-25 | 2013-09-25 | Esファイバービジョンズ株式会社 | Heat-adhesive conjugate fiber excellent in bulkiness and flexibility and fiber molded article using the same |
KR101110268B1 (en) * | 2010-04-30 | 2012-02-16 | 삼성전자주식회사 | Chemical mechanical polishing system which prevents air pressure tube electric wires from being twisted |
TWI517935B (en) * | 2013-04-16 | 2016-01-21 | 國立台灣科技大學 | Supplying system of adding gas into slurry and method thereof |
JP6975078B2 (en) | 2018-03-15 | 2021-12-01 | キオクシア株式会社 | Semiconductor manufacturing equipment and methods for manufacturing semiconductor equipment |
JP7162465B2 (en) | 2018-08-06 | 2022-10-28 | 株式会社荏原製作所 | Polishing device and polishing method |
JP7083722B2 (en) | 2018-08-06 | 2022-06-13 | 株式会社荏原製作所 | Polishing equipment and polishing method |
CN111113224B (en) * | 2019-12-27 | 2020-11-27 | 绍兴圣万特热流道有限公司 | Automatic machining equipment for hot runner mold |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4910155A (en) * | 1988-10-28 | 1990-03-20 | International Business Machines Corporation | Wafer flood polishing |
US5081051A (en) * | 1990-09-12 | 1992-01-14 | Intel Corporation | Method for conditioning the surface of a polishing pad |
US5308438A (en) * | 1992-01-30 | 1994-05-03 | International Business Machines Corporation | Endpoint detection apparatus and method for chemical/mechanical polishing |
US5216843A (en) * | 1992-09-24 | 1993-06-08 | Intel Corporation | Polishing pad conditioning apparatus for wafer planarization process |
US5341602A (en) * | 1993-04-14 | 1994-08-30 | Williams International Corporation | Apparatus for improved slurry polishing |
JP2903980B2 (en) * | 1993-11-30 | 1999-06-14 | 信越半導体株式会社 | Wafer polishing method and apparatus |
US5650039A (en) * | 1994-03-02 | 1997-07-22 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with improved slurry distribution |
US5527424A (en) * | 1995-01-30 | 1996-06-18 | Motorola, Inc. | Preconditioner for a polishing pad and method for using the same |
TW344695B (en) * | 1995-08-24 | 1998-11-11 | Matsushita Electric Ind Co Ltd | Method for polishing semiconductor substrate |
-
1996
- 1996-08-20 KR KR1019960034339A patent/KR970018240A/en not_active Application Discontinuation
- 1996-08-26 US US08/697,509 patent/US5866480A/en not_active Expired - Lifetime
- 1996-08-29 EP EP96113864A patent/EP0763402B1/en not_active Expired - Lifetime
- 1996-08-29 DE DE69618882T patent/DE69618882T2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR970018240A (en) | 1997-04-30 |
EP0763402B1 (en) | 2002-01-30 |
EP0763402A1 (en) | 1997-03-19 |
DE69618882T2 (en) | 2002-07-11 |
US5866480A (en) | 1999-02-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69607547D1 (en) | Method and device for polishing semiconductor wafers | |
DE19580932T1 (en) | Method and device for polishing wafers | |
DE69615603T2 (en) | Device and method for cleaning semiconductor wafers | |
DE59704120D1 (en) | Method and device for polishing semiconductor wafers | |
DE69927111D1 (en) | Method and device for polishing substrates | |
DE69709934T2 (en) | METHOD AND DEVICE FOR POLISHING SEMICONDUCTOR DISCS | |
DE69411213T2 (en) | Method and device for washing substrates | |
DE69625962D1 (en) | Method and device for dressing polishing pads | |
DE59802824D1 (en) | Method and device for polishing semiconductor wafers | |
DE69509561D1 (en) | Method and device for chamfering semiconductor wafers | |
DE69618437T2 (en) | Method and device for polishing workpieces | |
DE69015511D1 (en) | Method and device for connecting semiconductor substrates. | |
DE69419479D1 (en) | Process for grinding semiconductor wafers and device therefor | |
DE69719847D1 (en) | Method and device for polishing workpieces | |
DE69512535D1 (en) | METHOD AND DEVICE FOR POLISHING GEMS | |
DE69904074D1 (en) | METHOD AND DEVICE FOR POLISHING SEMICONDUCTOR DISCS | |
DE69620333D1 (en) | Method and device for polishing workpieces | |
DE69618882D1 (en) | Method and device for polishing semiconductor substrates | |
DE69618433D1 (en) | Method and device for supplying workpieces for the device for serial processing of semiconductor plates | |
DE59703456D1 (en) | Device and method for grinding sets | |
DE59900963D1 (en) | METHOD AND DEVICE FOR PROCESSING SUBSTRATES | |
DE69729779D1 (en) | Method and device for polishing | |
DE69703312D1 (en) | Device and method for polishing semiconductor wafers | |
DE69707235T2 (en) | Method and device for polishing and cleaning flat workpieces | |
DE59508757D1 (en) | Method and device for cleaning silicon wafers |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: PANASONIC CORP., KADOMA, OSAKA, JP |