DE69526512D1 - Strahlungsempfangssystem und herstellungsverfahren - Google Patents

Strahlungsempfangssystem und herstellungsverfahren

Info

Publication number
DE69526512D1
DE69526512D1 DE69526512T DE69526512T DE69526512D1 DE 69526512 D1 DE69526512 D1 DE 69526512D1 DE 69526512 T DE69526512 T DE 69526512T DE 69526512 T DE69526512 T DE 69526512T DE 69526512 D1 DE69526512 D1 DE 69526512D1
Authority
DE
Germany
Prior art keywords
manufacturing
receiving system
radiation receiving
radiation
receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69526512T
Other languages
English (en)
Other versions
DE69526512T2 (de
Inventor
Misho Schieber
Baruch Nissenbaum
Ze Ev Harel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIRECT DIGITAL IMAGING READOUT
Original Assignee
DIRECT DIGITAL IMAGING READOUT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from IL11108594A external-priority patent/IL111085A0/xx
Priority claimed from IL11353595A external-priority patent/IL113535A/xx
Application filed by DIRECT DIGITAL IMAGING READOUT filed Critical DIRECT DIGITAL IMAGING READOUT
Application granted granted Critical
Publication of DE69526512D1 publication Critical patent/DE69526512D1/de
Publication of DE69526512T2 publication Critical patent/DE69526512T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H01L27/14665—
    • H01L31/02966—
    • H01L31/032—
    • H01L31/085—

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
DE69526512T 1994-09-29 1995-09-29 Strahlungsempfangssystem und herstellungsverfahren Expired - Fee Related DE69526512T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
IL11108594A IL111085A0 (en) 1994-09-29 1994-09-29 Image receptor for an imaging system
IL11353595A IL113535A (en) 1995-04-28 1995-04-28 Radiation detection system and processes for preparing the same
PCT/US1995/012222 WO1996010194A1 (en) 1994-09-29 1995-09-29 A radiation detection system and processes for preparing the same

Publications (2)

Publication Number Publication Date
DE69526512D1 true DE69526512D1 (de) 2002-05-29
DE69526512T2 DE69526512T2 (de) 2002-11-28

Family

ID=26322910

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69526512T Expired - Fee Related DE69526512T2 (de) 1994-09-29 1995-09-29 Strahlungsempfangssystem und herstellungsverfahren

Country Status (8)

Country Link
EP (1) EP0784801B1 (de)
JP (1) JPH10506989A (de)
KR (1) KR100383867B1 (de)
CN (1) CN1047002C (de)
AU (1) AU699690C (de)
CA (1) CA2200319C (de)
DE (1) DE69526512T2 (de)
WO (1) WO1996010194A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3976915B2 (ja) * 1998-02-09 2007-09-19 シャープ株式会社 二次元画像検出器およびその製造方法
FR2793351A1 (fr) * 1999-05-07 2000-11-10 Commissariat Energie Atomique Procede de fabrication d'un materiau a base de tellurure de cadmium pour la detection d'un rayonnement x ou gamma et detecteur comprenant ce materiau
US7186985B2 (en) 2001-07-30 2007-03-06 Dxray, Inc. Method and apparatus for fabricating mercuric iodide polycrystalline films for digital radiography
KR100440240B1 (ko) * 2002-10-09 2004-07-15 한국수력원자력 주식회사 저에너지 베타선 방출핵종 직접측정을 위한 이중구조무기형광 함침막 및 그의 제조방법
DE10323584B4 (de) * 2003-05-20 2006-05-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Anordnung zur Detektion von Röntgenstrahlung und Verfahren zu deren Herstellung
JP5524859B2 (ja) * 2007-12-18 2014-06-18 ティ． ミハレヴィチュ，マレク 量子トンネル効果光検出器アレイ
JP2011187920A (ja) * 2009-10-12 2011-09-22 Ryukoku Univ 化合物半導体薄膜の製造方法、太陽電池および化合物半導体薄膜製造装置
DE102010021172B4 (de) 2010-05-21 2013-04-18 Siemens Aktiengesellschaft Strahlenwandler mit einer direkt konvertierenden Halbleiterschicht und Verfahren zur Herstellung eines solchen Strahlenwandlers
CN102288983A (zh) * 2011-05-19 2011-12-21 中国工程物理研究院激光聚变研究中心 伽马射线成像能谱仪
BR112014031875A2 (pt) 2012-06-21 2017-06-27 Trophy processo de fabricação de um chip semicondutor para um detector de conversão direta de raios-x, detector de conversão direta de raios-x, e, aparelho radiológico
JP6054859B2 (ja) * 2013-12-27 2016-12-27 ミハレヴィチュ, マレク ティ.MICHALEWICZ, Marek, T. 量子トンネル効果光検出器アレイ
JP2015133408A (ja) * 2014-01-14 2015-07-23 株式会社島津製作所 放射線検出器
EP3320372B1 (de) * 2015-07-09 2020-04-08 Koninklijke Philips N.V. Vorrichtung und verfahren zur simultanen röntgen- und gammaphotonenbildgebung mit einem gestapelten detektor
CN106680859B (zh) * 2015-11-09 2019-01-25 北京卫星环境工程研究所 探头结构及具有其的全向探测器
EP3355081B1 (de) * 2017-01-27 2019-06-19 Detection Technology Oy Direktumwandlungs-verbund-leiterplattenkachelstruktur

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3754965A (en) * 1971-04-05 1973-08-28 Varian Associates A method for making an electrophotographic plate
US3812361A (en) * 1971-11-03 1974-05-21 Siemens Ag Process and apparatus for visualizing gamma ray images
DE2442276A1 (de) * 1974-09-04 1976-03-25 Siemens Ag Elektrooptischer wandler
JP2822185B2 (ja) * 1988-01-27 1998-11-11 株式会社日立メディコ 放射線検出器
US5047645A (en) * 1989-07-07 1991-09-10 The Royal Institution For The Advancement Of Learning Thin film infrared laser detector and monitor
US5072122A (en) * 1990-10-15 1991-12-10 Kansas State University Research Foundation Charge storage image device using persistent photoconductivity crystals

Also Published As

Publication number Publication date
EP0784801A1 (de) 1997-07-23
AU699690C (en) 2002-03-21
CA2200319A1 (en) 1996-04-04
DE69526512T2 (de) 2002-11-28
CN1047002C (zh) 1999-12-01
JPH10506989A (ja) 1998-07-07
EP0784801B1 (de) 2002-04-24
EP0784801A4 (de) 1998-08-19
CN1167529A (zh) 1997-12-10
AU3724795A (en) 1996-04-19
WO1996010194A1 (en) 1996-04-04
KR100383867B1 (ko) 2003-07-07
AU699690B2 (en) 1998-12-10
CA2200319C (en) 2003-08-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee