DE69524789D1 - Flacher detektor für strahlungsabbildung und pixel für den gebrauch darin - Google Patents

Flacher detektor für strahlungsabbildung und pixel für den gebrauch darin

Info

Publication number
DE69524789D1
DE69524789D1 DE69524789T DE69524789T DE69524789D1 DE 69524789 D1 DE69524789 D1 DE 69524789D1 DE 69524789 T DE69524789 T DE 69524789T DE 69524789 T DE69524789 T DE 69524789T DE 69524789 D1 DE69524789 D1 DE 69524789D1
Authority
DE
Germany
Prior art keywords
pixel
radiation image
flat detector
detector
flat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69524789T
Other languages
English (en)
Inventor
Pal Singh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
iFire Technology Inc
Original Assignee
iFire Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by iFire Technology Inc filed Critical iFire Technology Inc
Application granted granted Critical
Publication of DE69524789D1 publication Critical patent/DE69524789D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
DE69524789T 1995-07-31 1995-07-31 Flacher detektor für strahlungsabbildung und pixel für den gebrauch darin Expired - Lifetime DE69524789D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CA1995/000456 WO1997005658A1 (en) 1995-07-31 1995-07-31 Flat panel detector for radiation imaging and pixel for use therein

Publications (1)

Publication Number Publication Date
DE69524789D1 true DE69524789D1 (de) 2002-01-31

Family

ID=4173097

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69524789T Expired - Lifetime DE69524789D1 (de) 1995-07-31 1995-07-31 Flacher detektor für strahlungsabbildung und pixel für den gebrauch darin

Country Status (4)

Country Link
US (1) US6232606B1 (de)
EP (1) EP0842540B1 (de)
DE (1) DE69524789D1 (de)
WO (1) WO1997005658A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19827020A1 (de) * 1998-06-17 1999-12-30 Siemens Ag Bilddetektor
US20020121605A1 (en) * 1999-06-17 2002-09-05 Lutz Fink Semiconductor sensor and method for its wiring
DE19927694C1 (de) * 1999-06-17 2000-11-02 Lutz Fink Halbleitersensor mit einer Pixelstruktur
US6956216B2 (en) * 2000-06-15 2005-10-18 Canon Kabushiki Kaisha Semiconductor device, radiation detection device, and radiation detection system
JP2002214040A (ja) * 2001-01-16 2002-07-31 Inst Of Space & Astronautical Science 複数素子からの同時信号読み出し方法
JP2003250785A (ja) * 2002-02-28 2003-09-09 Konica Corp 放射線撮像装置及び撮像装置による撮影方法
US6868138B2 (en) 2002-05-29 2005-03-15 The Regents Of The University Of Michigan Method, processor and computed tomography (CT) machine for generating images utilizing high and low sensitivity data collected from a flat panel detector having an extended dynamic range
JP2009186268A (ja) * 2008-02-05 2009-08-20 Fujifilm Corp 画像検出装置
JP2012079820A (ja) * 2010-09-30 2012-04-19 Canon Inc 検出装置及び放射線検出システム
JP2012079860A (ja) * 2010-09-30 2012-04-19 Canon Inc 検出装置及び放射線検出システム
KR102465353B1 (ko) 2015-12-02 2022-11-10 삼성전자주식회사 전계 효과 트랜지스터 및 이를 포함하는 반도체 소자

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4002431A1 (de) * 1990-01-27 1991-08-01 Philips Patentverwaltung Sensormatrix
DE4227096A1 (de) 1992-08-17 1994-02-24 Philips Patentverwaltung Röntgenbilddetektor
US5381014B1 (en) * 1993-12-29 1997-06-10 Du Pont Large area x-ray imager and method of fabrication

Also Published As

Publication number Publication date
US6232606B1 (en) 2001-05-15
EP0842540A1 (de) 1998-05-20
EP0842540B1 (de) 2001-12-19
WO1997005658A1 (en) 1997-02-13

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Legal Events

Date Code Title Description
8332 No legal effect for de