DE69407393D1 - Impedanzangepasster fotoleitfähiger infrarot-detektor mit heteroübergangskontakten - Google Patents

Impedanzangepasster fotoleitfähiger infrarot-detektor mit heteroübergangskontakten

Info

Publication number
DE69407393D1
DE69407393D1 DE69407393T DE69407393T DE69407393D1 DE 69407393 D1 DE69407393 D1 DE 69407393D1 DE 69407393 T DE69407393 T DE 69407393T DE 69407393 T DE69407393 T DE 69407393T DE 69407393 D1 DE69407393 D1 DE 69407393D1
Authority
DE
Germany
Prior art keywords
impedance
infrared photo
conductive detector
transition contacts
hetero transition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69407393T
Other languages
English (en)
Other versions
DE69407393T2 (de
Inventor
Thomas Schimert
Scott Barnes
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xylon LLC
Original Assignee
Loral Vought Systems Corp
Lockheed Martin Vought Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Loral Vought Systems Corp, Lockheed Martin Vought Systems Corp filed Critical Loral Vought Systems Corp
Application granted granted Critical
Publication of DE69407393D1 publication Critical patent/DE69407393D1/de
Publication of DE69407393T2 publication Critical patent/DE69407393T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/109—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PN heterojunction type
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/1446—Devices controlled by radiation in a repetitive configuration
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0216—Coatings
    • H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02164—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers, cold shields for infrared detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0224—Electrodes
    • H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1828—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof the active layers comprising only AIIBVI compounds, e.g. CdS, ZnS, CdTe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/543—Solar cells from Group II-VI materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/904—Charge carrier lifetime control
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/977—Thinning or removal of substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69407393T 1993-08-10 1994-07-29 Impedanzangepasster fotoleitfähiger infrarot-detektor mit heteroübergangskontakten Expired - Lifetime DE69407393T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10498393A 1993-08-10 1993-08-10
PCT/US1994/008665 WO1995005007A1 (en) 1993-08-10 1994-07-29 Photoconductive impedance-matched infrared detector with heterojunction blocking contacts

Publications (2)

Publication Number Publication Date
DE69407393D1 true DE69407393D1 (de) 1998-01-29
DE69407393T2 DE69407393T2 (de) 1998-07-16

Family

ID=22303463

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69407393T Expired - Lifetime DE69407393T2 (de) 1993-08-10 1994-07-29 Impedanzangepasster fotoleitfähiger infrarot-detektor mit heteroübergangskontakten

Country Status (6)

Country Link
US (1) US5580795A (de)
EP (1) EP0664052B1 (de)
JP (1) JPH08502147A (de)
CA (1) CA2142915C (de)
DE (1) DE69407393T2 (de)
WO (1) WO1995005007A1 (de)

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* Cited by examiner, † Cited by third party
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JPH09148620A (ja) * 1995-09-20 1997-06-06 Sharp Corp 光反射型検出器及びその製造方法
EP0940848A3 (de) * 1998-03-05 2000-03-22 Interuniversitair Micro-Elektronica Centrum Vzw Verlustarme Leiterbahn und Verfahren zu ihrer Herstellung
JP2001144218A (ja) * 1999-11-17 2001-05-25 Sony Corp 半導体装置及び半導体装置の製造方法
US20060182654A1 (en) * 2005-02-16 2006-08-17 Cumberland Brandi M Sampling device and method for the rapid detection of proteins in mold, allergens of other protein-containing substances
CN100392871C (zh) * 2006-04-14 2008-06-04 中国科学院上海技术物理研究所 铟镓砷焦平面探测器的列阵微台面的制备方法
US20080003144A1 (en) * 2006-06-29 2008-01-03 Cumberland Brendi M Sampling device
CN100424895C (zh) * 2006-11-24 2008-10-08 中国科学院上海技术物理研究所 微台面结构的铟镓砷线列探测器
US7755079B2 (en) * 2007-08-17 2010-07-13 Sandia Corporation Strained-layer superlattice focal plane array having a planar structure
US8022390B1 (en) 2007-08-17 2011-09-20 Sandia Corporation Lateral conduction infrared photodetector
US8258482B2 (en) 2008-05-28 2012-09-04 Lawrence Livermore National Security, Llc Energy resolution in semiconductor gamma radiation detectors using heterojunctions and methods of use and preparation thereof
US7947601B2 (en) * 2009-03-24 2011-05-24 Micron Technology, Inc. Semiconductor devices and methods for forming patterned radiation blocking on a semiconductor device
CN101907576B (zh) * 2010-06-11 2012-02-01 中国科学院上海技术物理研究所 一种检测碲锌镉材料缺陷空间延伸特性的方法
CN104465686B (zh) * 2014-11-20 2016-11-02 西安电子科技大学 红外探测器阵列及其制作方法
CN104409533B (zh) * 2014-11-20 2016-11-16 西安电子科技大学 InSb红外焦平面探测器阵列及其制作方法
CN104465812B (zh) * 2014-11-20 2016-08-17 西安电子科技大学 光伏型探测器阵列及其制作方法

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US3575740A (en) * 1967-06-08 1971-04-20 Ibm Method of fabricating planar dielectric isolated integrated circuits
US3452198A (en) * 1968-02-23 1969-06-24 Honeywell Inc Manufacture of detectors
US3884733A (en) * 1971-08-13 1975-05-20 Texas Instruments Inc Dielectric isolation process
US4050979A (en) * 1973-12-28 1977-09-27 Texas Instruments Incorporated Process for thinning silicon with special application to producing silicon on insulator
US4355456A (en) * 1980-03-07 1982-10-26 General Dynamics, Pomona Division Process of fabricating a Schottky barrier photovoltaic detector
US4380056A (en) * 1980-10-10 1983-04-12 Hughes Aircraft Company Charge coupled device focal plane with serial register having interdigitated electrodes
US4507674A (en) * 1982-06-07 1985-03-26 Hughes Aircraft Company Backside illuminated blocked impurity band infrared detector
US4720738A (en) * 1982-09-08 1988-01-19 Texas Instruments Incorporated Focal plane array structure including a signal processing system
DE3273475D1 (en) * 1982-10-14 1986-10-30 Ibm Deutschland Method to measure the thickness of eroded layers at subtractive work treatment processes
US4533933A (en) * 1982-12-07 1985-08-06 The United States Of America As Represented By The Secretary Of The Air Force Schottky barrier infrared detector and process
GB2240444B (en) * 1985-12-20 1991-10-30 Philips Electronic Associated Imaging array devices and staring array imaging systems
US4901084A (en) * 1988-04-19 1990-02-13 Millitech Corporation Object detection and location system
US4782028A (en) * 1987-08-27 1988-11-01 Santa Barbara Research Center Process methodology for two-sided fabrication of devices on thinned silicon
US4783594A (en) * 1987-11-20 1988-11-08 Santa Barbara Research Center Reticular detector array
US4970567A (en) * 1987-11-23 1990-11-13 Santa Barbara Research Center Method and apparatus for detecting infrared radiation
US4914296A (en) * 1988-04-21 1990-04-03 The Boeing Company Infrared converter
EP0383816B1 (de) * 1988-08-31 1992-04-01 Santa Barbara Research Center Verfahren zur herstellung auf zwei seiten von anordnungen von verdünntem silizium
US4910154A (en) * 1988-12-23 1990-03-20 Ford Aerospace Corporation Manufacture of monolithic infrared focal plane arrays
US4965649A (en) * 1988-12-23 1990-10-23 Ford Aerospace Corporation Manufacture of monolithic infrared focal plane arrays
EP0407062A3 (en) * 1989-06-29 1991-02-06 Texas Instruments Incorporated A method and apparatus for forming an infrared detector having a refractory metal
US4956555A (en) * 1989-06-30 1990-09-11 Rockwell International Corporation Multicolor focal plane arrays
US5081063A (en) * 1989-07-20 1992-01-14 Harris Corporation Method of making edge-connected integrated circuit structure
US5179283A (en) * 1989-08-07 1993-01-12 Santa Barbara Research Center Infrared detector focal plane
US5145795A (en) * 1990-06-25 1992-09-08 Motorola, Inc. Semiconductor device and method therefore
US5091330A (en) * 1990-12-28 1992-02-25 Motorola, Inc. Method of fabricating a dielectric isolated area
US5132763A (en) * 1991-02-07 1992-07-21 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration InAs hole-immobilized doping superlattice long-wave-infrared detector
US5122669A (en) * 1991-03-13 1992-06-16 Hughes Aircraft Company Wideband schottky focal plane array
US5385632A (en) * 1993-06-25 1995-01-31 At&T Laboratories Method for manufacturing integrated semiconductor devices

Also Published As

Publication number Publication date
DE69407393T2 (de) 1998-07-16
EP0664052B1 (de) 1997-12-17
WO1995005007A1 (en) 1995-02-16
JPH08502147A (ja) 1996-03-05
US5580795A (en) 1996-12-03
CA2142915C (en) 2003-10-07
EP0664052A4 (de) 1996-01-10
EP0664052A1 (de) 1995-07-26
CA2142915A1 (en) 1995-02-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: LOCKHEED MARTIN CORP., BETHESDA, MD., US

8327 Change in the person/name/address of the patent owner

Owner name: XYLON LLC, LAS VEGAS, NEV., US