DE69404128T2 - Abbildungsverfahren und -apparat - Google Patents

Abbildungsverfahren und -apparat

Info

Publication number
DE69404128T2
DE69404128T2 DE69404128T DE69404128T DE69404128T2 DE 69404128 T2 DE69404128 T2 DE 69404128T2 DE 69404128 T DE69404128 T DE 69404128T DE 69404128 T DE69404128 T DE 69404128T DE 69404128 T2 DE69404128 T2 DE 69404128T2
Authority
DE
Germany
Prior art keywords
image method
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69404128T
Other languages
English (en)
Other versions
DE69404128D1 (de
Inventor
William Marinelli
Karl Holtzclaw
Steven Davis
Byron Green
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Physical Sciences Corp
Original Assignee
Physical Sciences Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Physical Sciences Corp filed Critical Physical Sciences Corp
Publication of DE69404128D1 publication Critical patent/DE69404128D1/de
Application granted granted Critical
Publication of DE69404128T2 publication Critical patent/DE69404128T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2823—Imaging spectrometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J2003/1828—Generating the spectrum; Monochromators using diffraction elements, e.g. grating with order sorter or prefilter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
DE69404128T 1993-02-23 1994-02-18 Abbildungsverfahren und -apparat Expired - Fee Related DE69404128T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US2120793A 1993-02-23 1993-02-23
PCT/US1994/002009 WO1994019667A1 (en) 1993-02-23 1994-02-18 Method and apparatus for imaging

Publications (2)

Publication Number Publication Date
DE69404128D1 DE69404128D1 (de) 1997-08-14
DE69404128T2 true DE69404128T2 (de) 1998-01-29

Family

ID=21802953

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69404128T Expired - Fee Related DE69404128T2 (de) 1993-02-23 1994-02-18 Abbildungsverfahren und -apparat

Country Status (7)

Country Link
US (1) US5461477A (de)
EP (1) EP0686256B1 (de)
JP (1) JP3628017B2 (de)
AU (1) AU6271994A (de)
CA (1) CA2153591C (de)
DE (1) DE69404128T2 (de)
WO (1) WO1994019667A1 (de)

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EP0767361B1 (de) * 1993-07-22 2000-02-23 Applied Spectral Imaging Ltd. Verfahren und Vorrichtung zur Spektralen Bilderfassung
US5714759A (en) * 1996-02-23 1998-02-03 Ohmeda Inc. Optical system with an extended, imaged source
US5903346A (en) * 1996-03-15 1999-05-11 Forschungszentrum Karlsruhe Gmbh Analysis system
DE69841107D1 (de) * 1997-07-12 2009-10-08 Roper Ind Inc Multispektraler zweidimensionaler bildgebeuder spekteometer
US6937885B1 (en) 1997-10-30 2005-08-30 Hypermed, Inc. Multispectral/hyperspectral medical instrument
US5982497A (en) * 1998-07-09 1999-11-09 Optical Insights, Llc Multi-spectral two-dimensional imaging spectrometer
US6337472B1 (en) 1998-10-19 2002-01-08 The University Of Texas System Board Of Regents Light imaging microscope having spatially resolved images
US6765945B2 (en) * 1999-09-27 2004-07-20 Cymer, Inc. Injection seeded F2 laser with pre-injection filter
US6958811B2 (en) 2000-06-29 2005-10-25 Carl Zeiss Jena Gmbh Method for the detection of dyes in fluorescence microscopy
US6747737B2 (en) 2000-06-29 2004-06-08 Carl Zeiss Jena Gmbh Method for optical detection of an illuminated specimen in a plurality of detection channels
US6947133B2 (en) * 2000-08-08 2005-09-20 Carl Zeiss Jena Gmbh Method for increasing the spectral and spatial resolution of detectors
US6858852B2 (en) 2000-08-08 2005-02-22 Carl Zeiss Jena Gmbh Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy
US6670087B2 (en) * 2000-11-07 2003-12-30 Canon Kabushiki Kaisha Toner, image-forming apparatus, process cartridge and image forming method
US7238942B2 (en) * 2001-05-02 2007-07-03 Csir Spectrometric using broadband filters with overlapping spectral ranges
US6856466B2 (en) 2001-07-05 2005-02-15 Science & Engineering Associates, Inc. Multiple imaging system
SE524663C2 (sv) * 2003-01-15 2004-09-14 Senseair Ab Gascell, ingående i gassensor för spektralanalys
US7799273B2 (en) 2004-05-06 2010-09-21 Smp Logic Systems Llc Manufacturing execution system for validation, quality and risk assessment and monitoring of pharmaceutical manufacturing processes
US7444197B2 (en) 2004-05-06 2008-10-28 Smp Logic Systems Llc Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes
US20070074035A1 (en) * 2005-09-29 2007-03-29 Tom Scanlon Secure recordation for inspection systems and methods
US7851758B1 (en) 2005-09-29 2010-12-14 Flir Systems, Inc. Portable multi-function inspection systems and methods
US7561274B2 (en) * 2005-10-20 2009-07-14 Duke University Optical spectroscopy utilizing planar spectral filters
US7936463B2 (en) 2007-02-05 2011-05-03 Palo Alto Research Center Incorporated Containing analyte in optical cavity structures
US7633629B2 (en) * 2007-02-05 2009-12-15 Palo Alto Research Center Incorporated Tuning optical cavities
US7817281B2 (en) * 2007-02-05 2010-10-19 Palo Alto Research Center Incorporated Tuning optical cavities
US7852490B2 (en) * 2007-02-05 2010-12-14 Palo Alto Research Center Incorporated Implanting optical cavity structures
US8548271B2 (en) * 2008-01-08 2013-10-01 Opgal Optronic Industries Ltd. System and method for gas leakage detection
US8018597B2 (en) 2008-06-20 2011-09-13 Com Dev International Ltd. Slab waveguide spatial heterodyne spectrometer assembly
JP6255992B2 (ja) 2013-12-27 2018-01-10 セイコーエプソン株式会社 分光測定システム、分光モジュール、及び、位置ズレ検出方法
JP2016011932A (ja) * 2014-06-30 2016-01-21 セイコーエプソン株式会社 分光画像撮像装置、分光画像撮像方法
JP6166697B2 (ja) * 2014-07-29 2017-07-19 日本電信電話株式会社 光干渉断層装置
US11598716B2 (en) * 2017-09-27 2023-03-07 Konica Minolta, Inc. Gas image device and image acquisition method
JP7246466B2 (ja) * 2018-08-06 2023-03-27 サーモ エレクトロン サイエンティフィック インストルメンツ リミテッド ライアビリティ カンパニー 迷光低減を伴うモノクロメータ
CN116113809A (zh) * 2020-09-01 2023-05-12 华为技术有限公司 成像设备和操作成像设备的方法

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US3973134A (en) * 1975-02-18 1976-08-03 Allied Chemical Corporation Generation of coherent rotational anti-Stokes spectra
US4195931A (en) * 1978-05-18 1980-04-01 The United States Of America As Represented By The Secretary Of The Army Clear air turbulence detector
US4269509A (en) * 1978-05-26 1981-05-26 Allied Chemical Corporation Photoacoustic Raman spectroscopy
DE3014646C2 (de) * 1980-04-16 1983-12-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Spektralanalyse
US4400058A (en) * 1980-06-16 1983-08-23 Honeywell Inc. Tunable Fabry-Perot filter
US4627722A (en) * 1984-08-31 1986-12-09 Ball Corporation Method and apparatus for optically measuring three-dimensional coordinates
US4710001A (en) * 1986-11-21 1987-12-01 Hewlett-Packard Company Support for a moving mirror in an interferometer
US4833314A (en) * 1987-02-13 1989-05-23 Hughes Aircraft Company Variable phase stop for use in interferometers
US4893003A (en) * 1988-09-19 1990-01-09 The University Of Michigan Circle-to-line interferometer optical system
US4998017A (en) * 1989-05-01 1991-03-05 Ryan Fredrick M Method and arrangement for measuring the optical absorptions of gaseous mixtures
DE3923831A1 (de) * 1989-07-19 1991-01-31 Hartmann & Braun Ag Interferometrische einrichtung
US5050991A (en) * 1989-09-29 1991-09-24 The United States Of America As Represented By The Secretary Of The Navy High optical density measuring spectrometer
GB8928952D0 (en) * 1989-12-21 1990-02-28 Queensgate Instr Ltd Piezo-electric actuators
US5225888A (en) * 1990-12-26 1993-07-06 International Business Machines Corporation Plasma constituent analysis by interferometric techniques

Also Published As

Publication number Publication date
JPH08512400A (ja) 1996-12-24
DE69404128D1 (de) 1997-08-14
EP0686256A1 (de) 1995-12-13
EP0686256B1 (de) 1997-07-09
CA2153591C (en) 2000-04-25
AU6271994A (en) 1994-09-14
WO1994019667A1 (en) 1994-09-01
US5461477A (en) 1995-10-24
JP3628017B2 (ja) 2005-03-09
CA2153591A1 (en) 1994-09-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee