DE69332647T2 - Rechnergekoppelte tomographische dickenprofilmessung - Google Patents

Rechnergekoppelte tomographische dickenprofilmessung

Info

Publication number
DE69332647T2
DE69332647T2 DE69332647T DE69332647T DE69332647T2 DE 69332647 T2 DE69332647 T2 DE 69332647T2 DE 69332647 T DE69332647 T DE 69332647T DE 69332647 T DE69332647 T DE 69332647T DE 69332647 T2 DE69332647 T2 DE 69332647T2
Authority
DE
Germany
Prior art keywords
sample
radiation detectors
thickness profile
computer coupled
profile measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69332647T
Other languages
English (en)
Other versions
DE69332647D1 (de
Inventor
D Hoffman
J Romberger
Hunter Ellinger
W Stephens
D Savage
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bethlehem Steel Corp
Original Assignee
Bethlehem Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bethlehem Steel Corp filed Critical Bethlehem Steel Corp
Publication of DE69332647D1 publication Critical patent/DE69332647D1/de
Application granted granted Critical
Publication of DE69332647T2 publication Critical patent/DE69332647T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69332647T 1992-08-03 1993-08-02 Rechnergekoppelte tomographische dickenprofilmessung Expired - Fee Related DE69332647T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/924,105 US5351203A (en) 1992-08-03 1992-08-03 Online tomographic gauging of sheet metal
PCT/US1993/007294 WO1994003776A1 (en) 1992-08-03 1993-08-02 Online tomographic gauging of sheet metal

Publications (2)

Publication Number Publication Date
DE69332647D1 DE69332647D1 (de) 2003-02-20
DE69332647T2 true DE69332647T2 (de) 2003-09-25

Family

ID=25449713

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69332647T Expired - Fee Related DE69332647T2 (de) 1992-08-03 1993-08-02 Rechnergekoppelte tomographische dickenprofilmessung

Country Status (8)

Country Link
US (1) US5351203A (de)
EP (1) EP0705420B1 (de)
KR (1) KR100220146B1 (de)
AT (1) ATE231235T1 (de)
CA (1) CA2141813C (de)
DE (1) DE69332647T2 (de)
TW (1) TW231337B (de)
WO (1) WO1994003776A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08313223A (ja) * 1995-05-16 1996-11-29 Ls Electro Galvanizing Co 移動ストリップを監視する方法と装置
US6198103B1 (en) 1998-03-30 2001-03-06 Ohmart/Vega Corporation Nuclear level sensing gauge using scintillating fiber bundle
ES2223334T3 (es) * 1999-05-28 2005-03-01 Ims-Messsysteme Gmbh Procedimiento para la determinacion delaplanitud deuna banda de material.
US6421418B1 (en) 2000-08-15 2002-07-16 Northrop Grumman Corporation Method and system for detecting hidden edges
US6678634B1 (en) 2001-04-27 2004-01-13 Automation And Control Technology, Inc. Thickness measurement system and method
DE10160398B4 (de) * 2001-12-10 2004-11-11 Dieffenbacher Gmbh + Co. Kg Verfahren und Vorrichtung zur Prüfung einer Matte aus Biomassepartikeln
US6921896B2 (en) * 2002-10-24 2005-07-26 Northrop Grumman Corporation Automatic backscatter gauge
US6876718B2 (en) * 2003-06-27 2005-04-05 Ge Medical Systems Global Technology Company, Llc Scatter correction methods and apparatus
US7526969B2 (en) * 2004-01-07 2009-05-05 Pepper1 + Fuchs Gmbh Method and device for the contactless detection of flat objects
WO2006116100A1 (en) * 2005-04-22 2006-11-02 American Science And Engineering, Inc. X-ray backscatter inspection with coincident optical beam
US20100087943A1 (en) * 2008-10-08 2010-04-08 Robert Bosch Gmbh Systems, methods, and tools for proofing a computer-aided design object
US8095341B2 (en) 2008-10-08 2012-01-10 Robert Bosch Gmbh Systems, methods, and tools for proofing a computer-aided design object
US8065116B2 (en) * 2008-10-08 2011-11-22 Robert Bosch Gmbh Systems, methods, and tools for proofing a computer-aided design object
GB2468713B (en) * 2009-03-20 2011-02-16 Siemens Vai Metals Tech Ltd Edge flatness monitoring
US8077827B2 (en) * 2010-02-23 2011-12-13 Test Research, Inc. Method for thickness calibration and measuring thickness of material
DE102010014238B4 (de) 2010-03-29 2013-09-19 Mesacon Messelektronik Gmbh Dresden Verfahren zur Bestimmung der Dicke platten-oder bandförmiger Werkstücke
US20120283864A1 (en) * 2011-05-04 2012-11-08 Norandal Usa, Inc. Automated cast coil evaluation system
US10295508B2 (en) * 2016-01-06 2019-05-21 Saudi Arabian Oil Company Integrated system for quantitative real-time monitoring of hydrogen-induced cracking in simulated sour environment
CA3038417A1 (en) 2016-09-29 2018-04-05 Marel Iceland Ehf. A method of generating a three dimensional surface profile of a food object
WO2019230010A1 (ja) * 2018-06-01 2019-12-05 株式会社東芝 予兆データサーバ及びｘ線厚み測定システム

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5922161B2 (ja) * 1974-05-13 1984-05-24 株式会社東芝 放射線厚み計
GB1552224A (en) * 1975-05-10 1979-09-12 Heath Gloucester Ltd Strip profile gauge
US4284895A (en) * 1978-02-21 1981-08-18 Ira Lon Morgan Method and apparatus for tomographic examination of an object by penetrating radiation
US4437006A (en) * 1978-02-21 1984-03-13 Scientific Measurement Systems, Inc. Method and apparatus for measuring radiation in computer-assisted tomography and radiographic applications
US4246784A (en) * 1979-06-01 1981-01-27 Theodore Bowen Passive remote temperature sensor system
US4495635A (en) * 1981-04-03 1985-01-22 Analogic Corporation Method and apparatus for profiling structural sections
US4463758A (en) * 1981-09-18 1984-08-07 Arun A. Patil Computed tomography stereotactic frame
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計
US4510577A (en) * 1982-02-18 1985-04-09 Tokyo Shibaura Denki Kabushiki Kaisha Non-contact radiation thickness gauge
GB2138561B (en) * 1983-04-21 1987-03-18 Schlumberger Electronics Strip profile gauge
DE3425295C2 (de) * 1984-07-10 1986-07-24 Hoesch Ag, 4600 Dortmund Vorrichtung zur Messung des Dickenprofils von gewalzten Blechbändern
CA1253620A (en) * 1985-04-30 1989-05-02 Jon Claesson Method relating to three dimensional measurement of objects
US4725963A (en) * 1985-05-09 1988-02-16 Scientific Measurement Systems I, Ltd. Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects
US4751391A (en) * 1986-12-19 1988-06-14 General Electric Company High resolution X-ray collimator/detector system having reduced sensitivity to leakage radiation
US4951222A (en) * 1988-06-09 1990-08-21 Bethlehem Steel Corporation Method and system for dimensional and weight measurements of articles of manufacture by computerized tomography
US5042015A (en) * 1989-09-01 1991-08-20 Quantronix, Inc. Measuring method and apparatus

Also Published As

Publication number Publication date
EP0705420A1 (de) 1996-04-10
EP0705420A4 (de) 1997-11-12
DE69332647D1 (de) 2003-02-20
CA2141813C (en) 2000-01-25
US5351203A (en) 1994-09-27
ATE231235T1 (de) 2003-02-15
EP0705420B1 (de) 2003-01-15
KR100220146B1 (ko) 1999-09-01
CA2141813A1 (en) 1994-02-17
TW231337B (de) 1994-10-01
WO1994003776A1 (en) 1994-02-17
KR950703139A (ko) 1995-08-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee