DE69325277T2 - Schaltung zur Erkennung eines Versorgungsspannungsabfalls - Google Patents
Schaltung zur Erkennung eines VersorgungsspannungsabfallsInfo
- Publication number
- DE69325277T2 DE69325277T2 DE69325277T DE69325277T DE69325277T2 DE 69325277 T2 DE69325277 T2 DE 69325277T2 DE 69325277 T DE69325277 T DE 69325277T DE 69325277 T DE69325277 T DE 69325277T DE 69325277 T2 DE69325277 T2 DE 69325277T2
- Authority
- DE
- Germany
- Prior art keywords
- drop
- detecting
- circuit
- supply voltage
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93830537A EP0661713B1 (de) | 1993-12-31 | 1993-12-31 | Schaltung zur Erkennung eines Versorgungsspannungsabfalls |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69325277D1 DE69325277D1 (de) | 1999-07-15 |
DE69325277T2 true DE69325277T2 (de) | 2000-01-20 |
Family
ID=8215295
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69325277T Expired - Lifetime DE69325277T2 (de) | 1993-12-31 | 1993-12-31 | Schaltung zur Erkennung eines Versorgungsspannungsabfalls |
Country Status (4)
Country | Link |
---|---|
US (2) | US5583820A (de) |
EP (1) | EP0661713B1 (de) |
JP (1) | JPH07249296A (de) |
DE (1) | DE69325277T2 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0661713B1 (de) * | 1993-12-31 | 1999-06-09 | STMicroelectronics S.r.l. | Schaltung zur Erkennung eines Versorgungsspannungsabfalls |
JPH10253701A (ja) * | 1997-03-10 | 1998-09-25 | Mitsubishi Electric Corp | 半導体試験装置 |
US5949499A (en) * | 1997-03-19 | 1999-09-07 | Thomson Consumer Electronics, Inc. | Power sensor circuit for a conference system |
KR20010023048A (ko) | 1997-08-20 | 2001-03-26 | 인피니언 테크놀로지스 아게 | 집적 회로의 동작 상태를 모니터링하는 방법 |
US5930174A (en) * | 1997-12-11 | 1999-07-27 | Amic Technology, Inc. | Circuit and method for erasing flash memory array |
US5943635A (en) * | 1997-12-12 | 1999-08-24 | Scenix Semiconductor Inc. | System and method for programmable brown-out detection and differentiation |
JP3606814B2 (ja) | 2001-02-01 | 2005-01-05 | 松下電器産業株式会社 | 電源検出回路 |
US7692442B2 (en) * | 2005-11-17 | 2010-04-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for detecting a current and temperature for an integrated circuit |
US7180301B1 (en) * | 2005-11-30 | 2007-02-20 | The Untied States Of America As Represented By The Secretary Of The Army | Power monitor-glitch trap system |
JP5572283B2 (ja) * | 2007-10-29 | 2014-08-13 | ピーエスフォー ルクスコ エスエイアールエル | 電圧検知回路 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55115729A (en) * | 1979-02-28 | 1980-09-05 | Toshiba Corp | Mos transistor circuit |
US4560937A (en) * | 1981-11-16 | 1985-12-24 | Curtis Instruments, Inc. | Battery state of charge metering method and apparatus |
JPS63153799A (ja) * | 1986-08-08 | 1988-06-27 | Nec Corp | 半導体メモリ |
US5083045A (en) * | 1987-02-25 | 1992-01-21 | Samsung Electronics Co., Ltd. | High voltage follower and sensing circuit |
US4975883A (en) * | 1990-03-29 | 1990-12-04 | Intel Corporation | Method and apparatus for preventing the erasure and programming of a nonvolatile memory |
KR100209449B1 (ko) * | 1990-05-21 | 1999-07-15 | 가나이 쓰토무 | 반도체 집적회로 장치 |
US5199032A (en) * | 1990-09-04 | 1993-03-30 | Motorola, Inc. | Microcontroller having an EPROM with a low voltage program inhibit circuit |
US5109187A (en) * | 1990-09-28 | 1992-04-28 | Intel Corporation | CMOS voltage reference |
JP2705326B2 (ja) * | 1991-02-19 | 1998-01-28 | 日本電気株式会社 | 光磁気ヘッド装置 |
EP0661713B1 (de) * | 1993-12-31 | 1999-06-09 | STMicroelectronics S.r.l. | Schaltung zur Erkennung eines Versorgungsspannungsabfalls |
-
1993
- 1993-12-31 EP EP93830537A patent/EP0661713B1/de not_active Expired - Lifetime
- 1993-12-31 DE DE69325277T patent/DE69325277T2/de not_active Expired - Lifetime
-
1994
- 1994-12-29 US US08/366,211 patent/US5583820A/en not_active Expired - Lifetime
-
1995
- 1995-01-04 JP JP11795A patent/JPH07249296A/ja active Pending
-
1996
- 1996-09-09 US US08/711,132 patent/US5748548A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07249296A (ja) | 1995-09-26 |
US5583820A (en) | 1996-12-10 |
EP0661713B1 (de) | 1999-06-09 |
EP0661713A1 (de) | 1995-07-05 |
DE69325277D1 (de) | 1999-07-15 |
US5748548A (en) | 1998-05-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: SAMSON & PARTNER, PATENTANWAELTE, 80538 MUENCHEN |