DE69231502D1 - Wellenleitersensor - Google Patents

Wellenleitersensor

Info

Publication number
DE69231502D1
DE69231502D1 DE69231502T DE69231502T DE69231502D1 DE 69231502 D1 DE69231502 D1 DE 69231502D1 DE 69231502 T DE69231502 T DE 69231502T DE 69231502 T DE69231502 T DE 69231502T DE 69231502 D1 DE69231502 D1 DE 69231502D1
Authority
DE
Germany
Prior art keywords
waveguide
species
metal clad
chemical species
segment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69231502T
Other languages
English (en)
Other versions
DE69231502T2 (de
Inventor
M Klainer
S Butler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FiberChem Inc
Original Assignee
FiberChem Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FiberChem Inc filed Critical FiberChem Inc
Application granted granted Critical
Publication of DE69231502D1 publication Critical patent/DE69231502D1/de
Publication of DE69231502T2 publication Critical patent/DE69231502T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431Dip refractometers, e.g. using optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122Basic optical elements, e.g. light-guiding paths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • G01N21/431Dip refractometers, e.g. using optical fibres
    • G01N2021/432Dip refractometers, e.g. using optical fibres comprising optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N2021/7706Reagent provision
    • G01N2021/7709Distributed reagent, e.g. over length of guide
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769Measurement method of reaction-produced change in sensor
    • G01N2021/7776Index
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769Measurement method of reaction-produced change in sensor
    • G01N2021/7779Measurement method of reaction-produced change in sensor interferometric
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7793Sensor comprising plural indicators
DE69231502T 1991-01-24 1992-01-24 Wellenleitersensor Expired - Fee Related DE69231502T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/646,148 US5165005A (en) 1988-01-29 1991-01-24 Planar and other waveguide refractive index sensors using metal cladding
PCT/US1992/000612 WO1992014177A2 (en) 1991-01-24 1992-01-24 Planar and other waveguide refractive index sensors using metal cladding

Publications (2)

Publication Number Publication Date
DE69231502D1 true DE69231502D1 (de) 2000-11-16
DE69231502T2 DE69231502T2 (de) 2001-06-13

Family

ID=24591961

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69231502T Expired - Fee Related DE69231502T2 (de) 1991-01-24 1992-01-24 Wellenleitersensor

Country Status (8)

Country Link
US (1) US5165005A (de)
EP (1) EP0568652B1 (de)
JP (1) JPH06505556A (de)
AT (1) ATE196951T1 (de)
AU (1) AU1642592A (de)
CA (1) CA2101072A1 (de)
DE (1) DE69231502T2 (de)
WO (1) WO1992014177A2 (de)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
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US5777726A (en) * 1992-05-12 1998-07-07 Raytheon Company Spectrophotometric supercritical fluid contamination monitor
US5253037A (en) * 1992-08-04 1993-10-12 Fci-Fiberchem, Inc. Optimal length for refractive index sensors
US5323477A (en) * 1992-08-24 1994-06-21 Motorola, Inc. Contact array imager with integral waveguide and electronics
EP0598341B1 (de) * 1992-11-17 1998-09-23 Hoechst Aktiengesellschaft Optischer Sensor zur Detektion von chemischen Spezien
CA2117003A1 (en) * 1993-04-13 1994-10-14 Dana Craig Bookbinder Method of encapsulating optical components and products produced by that method
JP3330947B2 (ja) * 1993-04-15 2002-10-07 株式会社ジャパンエナジー 全反射型屈折率センサ
US5439647A (en) * 1994-02-25 1995-08-08 Fiberchem, Inc. Chip level waveguide sensor
US5737457A (en) * 1994-02-25 1998-04-07 Fci - Fiberchem, Inc. Chip level waveguide sensor
US5615008A (en) * 1994-12-21 1997-03-25 Beckman Instruments, Inc. Optical waveguide integrated spectrometer
US5619599A (en) * 1995-05-12 1997-04-08 Xerox Corporation Remote split scan detector
AU5763296A (en) 1995-05-12 1996-11-29 Novartis Ag Sensor platform and method for the parallel detection of a plurality of analytes using evanescently excited luminescence
US5719033A (en) * 1995-06-28 1998-02-17 Motorola, Inc. Thin film transistor bio/chemical sensor
US5822473A (en) * 1996-02-29 1998-10-13 Texas Instruments Incorporated Integrated microchip chemical sensor
US6149591A (en) * 1997-02-21 2000-11-21 Duke University Refractometric devices especially adapted for the in vivo detection of refractive indices of cervical mucus
US6432364B1 (en) * 1998-07-06 2002-08-13 Suzuki Motor Corporation SPR sensor cell and immunoassay apparatus using the same
US6035705A (en) * 1998-09-01 2000-03-14 Marathon Ashland Petroleum Llc Method for characterization of fuels
US6821738B2 (en) * 1999-01-20 2004-11-23 The Board Of Regents For Oklahoma State University Broad spectrum bio-detection of nerve agents, organophosphates, and other chemical warfare agents
US6381025B1 (en) 1999-08-19 2002-04-30 Texas Tech University Interferometric detection system and method
US6694067B1 (en) 2001-01-05 2004-02-17 Los Gatos Research Cavity enhanced fiber optic and waveguide chemical sensor
WO2002059579A1 (en) 2001-01-25 2002-08-01 Texas Tech University Universal detector for biological and chemical separations or assays using plastic microfluidic devices
GB2375188B (en) * 2001-04-30 2004-07-21 Samsung Electronics Co Ltd Wearable Display Apparatus with Waveguide Having Diagonally Cut End Face
US6707958B2 (en) * 2001-11-20 2004-03-16 Agilent Technologies, Inc. Biochemical assay device using frustrated total internal reflection modulator with an imaging optical waveguide
US7435391B2 (en) * 2003-05-23 2008-10-14 Lucent Technologies Inc. Light-mediated micro-chemical reactors
US8599140B2 (en) * 2004-11-17 2013-12-03 International Business Machines Corporation Providing a frustrated total internal reflection touch interface
US7391936B2 (en) * 2005-01-21 2008-06-24 Lucent Technologies, Inc. Microfluidic sensors and methods for making the same
US20070053179A1 (en) * 2005-09-08 2007-03-08 Pang Slew I Low profile light source utilizing a flexible circuit carrier
KR100754686B1 (ko) * 2006-03-28 2007-09-03 삼성전자주식회사 키패드 어셈블리
KR100860763B1 (ko) 2006-10-19 2008-09-29 부산대학교 산학협력단 플라스틱 박막 광도파로, 이의 제조방법 및 상기 광도파로를 이용한 낌 방지센서
KR100827175B1 (ko) * 2007-02-23 2008-05-02 삼성전자주식회사 도파로 시트 및 그 제조방법
WO2009039466A1 (en) 2007-09-20 2009-03-26 Vanderbilt University Free solution measurement of molecular interactions by backscattering interferometry
US20100236625A1 (en) * 2009-02-20 2010-09-23 John Kenney Solar Modules Including Spectral Concentrators and Related Manufacturing Methods
US20100224248A1 (en) * 2009-02-20 2010-09-09 John Kenney Solar Modules Including Spectral Concentrators and Related Manufacturing Methods
US8774573B2 (en) * 2009-02-20 2014-07-08 OmniPV, Inc. Optical devices including resonant cavity structures
US9638632B2 (en) 2010-06-11 2017-05-02 Vanderbilt University Multiplexed interferometric detection system and method
US9562853B2 (en) 2011-02-22 2017-02-07 Vanderbilt University Nonaqueous backscattering interferometric methods
US9262011B2 (en) * 2011-03-30 2016-02-16 Smart Technologies Ulc Interactive input system and method
DE102011089703B3 (de) * 2011-12-22 2013-05-23 Continental Automotive Gmbh Optische Messanordnung zur Bestimmung eines Füllstands und/oder einer Konzentration einer Flüssigkeit
US9273949B2 (en) 2012-05-11 2016-03-01 Vanderbilt University Backscattering interferometric methods
US20150233885A1 (en) * 2014-02-14 2015-08-20 Chevron U.S.A. Inc. Sorption-based sensing system
US9377353B2 (en) * 2014-06-27 2016-06-28 Intel Corporation Optical perspiration sensor using frustrated total internal reflection
US9680271B2 (en) * 2014-09-22 2017-06-13 Mcgill University Sensor systems and methods for analyte detection
WO2016118812A1 (en) 2015-01-23 2016-07-28 Vanderbilt University A robust interferometer and methods of using same
US10627396B2 (en) 2016-01-29 2020-04-21 Vanderbilt University Free-solution response function interferometry
US10197499B2 (en) * 2016-04-07 2019-02-05 Corning Incorporated Waveguide sensor with nanoporous surface layer
US11344883B2 (en) * 2018-08-28 2022-05-31 Max-Ir Labs Incorporated Microfluidic device with integrated waveguides for analyte identification and method of operation thereof
US11333601B1 (en) * 2021-04-14 2022-05-17 United States Of America As Represented By The Secretary Of The Air Force Thermo-optic refractometry

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3680999D1 (de) * 1985-05-29 1991-09-26 Artificial Sensing Instr Asi A Optischer sensor zum selektiven nachweis von substanzen und zum nachweis von brechzahlaenderungen in messubstanzen.
GB2185308B (en) * 1986-01-10 1989-10-25 Stc Plc Optical sensor device
US4929049A (en) * 1988-01-29 1990-05-29 Fiberchem, Inc. Fiber optic refractive index sensor using a metal clad
US5026139A (en) * 1988-01-29 1991-06-25 Fiberchem Inc. Fiber optic refractive index sensor using metal cladding

Also Published As

Publication number Publication date
EP0568652A1 (de) 1993-11-10
WO1992014177A2 (en) 1992-08-20
CA2101072A1 (en) 1992-07-25
WO1992014177A3 (en) 1992-10-15
JPH06505556A (ja) 1994-06-23
AU1642592A (en) 1992-09-07
US5165005A (en) 1992-11-17
EP0568652B1 (de) 2000-10-11
DE69231502T2 (de) 2001-06-13
EP0568652A4 (en) 1994-05-18
ATE196951T1 (de) 2000-10-15

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee