DE69220020D1 - Kamera für Vorrichtung zur Erkennung von Oberflächenfehlern auf Materialbahnen - Google Patents

Kamera für Vorrichtung zur Erkennung von Oberflächenfehlern auf Materialbahnen

Info

Publication number
DE69220020D1
DE69220020D1 DE69220020T DE69220020T DE69220020D1 DE 69220020 D1 DE69220020 D1 DE 69220020D1 DE 69220020 T DE69220020 T DE 69220020T DE 69220020 T DE69220020 T DE 69220020T DE 69220020 D1 DE69220020 D1 DE 69220020D1
Authority
DE
Germany
Prior art keywords
camera
detection
surface defects
material webs
webs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69220020T
Other languages
English (en)
Other versions
DE69220020T2 (de
Inventor
Toshiro Mihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Futec Inc
Original Assignee
Futec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Futec Inc filed Critical Futec Inc
Application granted granted Critical
Publication of DE69220020D1 publication Critical patent/DE69220020D1/de
Publication of DE69220020T2 publication Critical patent/DE69220020T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
    • H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/51—Housings
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2301/00—Handling processes for sheets or webs
    • B65H2301/50—Auxiliary process performed during handling process
    • B65H2301/53—Auxiliary process performed during handling process for acting on performance of handling machine
    • B65H2301/5305—Cooling parts or areas of handling machine
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE69220020T 1992-01-02 1992-01-02 Kamera für Vorrichtung zur Erkennung von Oberflächenfehlern auf Materialbahnen Expired - Fee Related DE69220020T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP92100012A EP0549842B1 (de) 1992-01-02 1992-01-02 Kamera für Vorrichtung zur Erkennung von Oberflächenfehlern auf Materialbahnen

Publications (2)

Publication Number Publication Date
DE69220020D1 true DE69220020D1 (de) 1997-07-03
DE69220020T2 DE69220020T2 (de) 1997-11-13

Family

ID=8209215

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69220020T Expired - Fee Related DE69220020T2 (de) 1992-01-02 1992-01-02 Kamera für Vorrichtung zur Erkennung von Oberflächenfehlern auf Materialbahnen

Country Status (2)

Country Link
EP (1) EP0549842B1 (de)
DE (1) DE69220020T2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2282444B (en) * 1993-09-29 1997-06-25 Circuit Foil Sa Visual inspection system
DE19519055C2 (de) * 1995-05-24 1997-06-05 Bst Servo Technik Gmbh Optischer Sensor, insbesondere für eine Bahnlaufregeleinrichtung
DE102008009375A1 (de) * 2008-02-14 2009-08-20 Giesecke & Devrient Gmbh Sensoreinrichtung und Verfahren zur Erkennung von Rissen in Wertdokumenten
DE102009027265A1 (de) * 2009-06-29 2010-12-30 Manroland Ag Druckmaschine

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4136377A (en) * 1978-02-16 1979-01-23 Gte Sylvania Incorporated Foldable photoflash lamp unit
DE2819395C2 (de) * 1978-05-03 1980-01-10 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen der Breite von Walzerzeugnissen
JPS62138740A (ja) * 1985-12-13 1987-06-22 Hiyuutec:Kk シ−ト面の欠陥検出方法
DE3812543A1 (de) * 1988-04-15 1989-10-26 Grundig Emv Gekuehltes sondengehaeuse, insbesondere fuer eine feuerraumsonde mit fernsehkamera
US5068715A (en) * 1990-06-29 1991-11-26 Digital Equipment Corporation High-power, high-performance integrated circuit chip package

Also Published As

Publication number Publication date
DE69220020T2 (de) 1997-11-13
EP0549842A1 (de) 1993-07-07
EP0549842B1 (de) 1997-05-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee