DE69208862D1 - Infrarot-Elliposmeter - Google Patents

Infrarot-Elliposmeter

Info

Publication number
DE69208862D1
DE69208862D1 DE69208862T DE69208862T DE69208862D1 DE 69208862 D1 DE69208862 D1 DE 69208862D1 DE 69208862 T DE69208862 T DE 69208862T DE 69208862 T DE69208862 T DE 69208862T DE 69208862 D1 DE69208862 D1 DE 69208862D1
Authority
DE
Germany
Prior art keywords
elliposmeter
infrared
infrared elliposmeter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69208862T
Other languages
English (en)
Other versions
DE69208862T2 (de
Inventor
Bernard Drevillon
Biosca Adolfo Canillas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of DE69208862D1 publication Critical patent/DE69208862D1/de
Application granted granted Critical
Publication of DE69208862T2 publication Critical patent/DE69208862T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/211—Ellipsometry

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE69208862T 1992-01-07 1992-12-29 Infrarot-Elliposmeter Expired - Fee Related DE69208862T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9200090A FR2685962B1 (fr) 1992-01-07 1992-01-07 Ellipsometre infrarouge.

Publications (2)

Publication Number Publication Date
DE69208862D1 true DE69208862D1 (de) 1996-04-11
DE69208862T2 DE69208862T2 (de) 1996-10-02

Family

ID=9425442

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69208862T Expired - Fee Related DE69208862T2 (de) 1992-01-07 1992-12-29 Infrarot-Elliposmeter

Country Status (5)

Country Link
US (1) US5485271A (de)
EP (1) EP0558863B1 (de)
JP (1) JP3337734B2 (de)
DE (1) DE69208862T2 (de)
FR (1) FR2685962B1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2714970B1 (fr) * 1994-01-12 1996-03-29 Centre Nat Rech Scient Ellipsomètre spectroscopique modulé.
US6734967B1 (en) 1995-01-19 2004-05-11 Kla-Tencor Technologies Corporation Focused beam spectroscopic ellipsometry method and system
US5608526A (en) * 1995-01-19 1997-03-04 Tencor Instruments Focused beam spectroscopic ellipsometry method and system
JP3286138B2 (ja) * 1995-08-03 2002-05-27 日東電工株式会社 導光板、面光源装置、偏光光源装置及び液晶表示装置
FR2737572B1 (fr) * 1995-08-03 1997-10-24 Centre Nat Rech Scient Ellipsometre multi-detecteurs et procede de mesure ellipsometrique multi-detecteurs
US5871805A (en) * 1996-04-08 1999-02-16 Lemelson; Jerome Computer controlled vapor deposition processes
US6278519B1 (en) 1998-01-29 2001-08-21 Therma-Wave, Inc. Apparatus for analyzing multi-layer thin film stacks on semiconductors
US5798837A (en) 1997-07-11 1998-08-25 Therma-Wave, Inc. Thin film optical measurement system and method with calibrating ellipsometer
US6535779B1 (en) 1998-03-06 2003-03-18 Applied Materials, Inc. Apparatus and method for endpoint control and plasma monitoring
EP1125314A1 (de) 1998-07-10 2001-08-22 Applied Materials, Inc. Verbesserte endpunktbestimmung für einen substratfabrikationsprozess
FR2811761B1 (fr) * 2000-07-17 2002-10-11 Production Rech S Appliquees Ellipsometre a haute resolution spatiale fonctionnant dans l'infrarouge
JP2002267418A (ja) * 2001-03-09 2002-09-18 Horiba Ltd 膜厚測定装置
US20040166593A1 (en) * 2001-06-22 2004-08-26 Nolte David D. Adaptive interferometric multi-analyte high-speed biosensor
US6856384B1 (en) * 2001-12-13 2005-02-15 Nanometrics Incorporated Optical metrology system with combined interferometer and ellipsometer
US6744510B2 (en) * 2002-01-09 2004-06-01 Korea Advanced Institute Of Science And Technology Ellipsometer and precision auto-alignment method for incident angle of the ellipsometer without auxiliary equipment
EP1491876A1 (de) * 2003-06-24 2004-12-29 Ecole Polytechnique FTIR-ellipsometrische Vorrichtung und Verfahren zur Charakterisierung und weiteren Identifizierung von Proben von komplexen biologischen Proben, insbesondere Mikroorganismen
DE102005028894B3 (de) * 2005-06-19 2006-08-17 Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung mbH Spektrales Infrarot-Ellipsometer mit einem Azimut zwischen den Einfallsebenen der Terahertzstrahlen
DE102005062180B3 (de) * 2005-12-23 2007-01-04 Gesellschaft zur Förderung der Analytischen Wissenschaften e.V. Infrarot-Ellipsometer
US7928390B1 (en) 2007-09-06 2011-04-19 Kla-Tencor Corporation Infrared metrology
CN108918095B (zh) * 2018-06-12 2021-03-26 同济大学 一种桌面型软x射线波段光学元件偏振检测装置
FR3090099B1 (fr) 2018-12-18 2022-04-22 Univ De Technologie De Troyes Dispositif laser pour interferometrie a polarisation

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3445833A (en) * 1965-11-01 1969-05-20 Sperry Rand Corp Signal responsive apparatus with a polar azimuth vibrator
US3594085A (en) * 1967-08-31 1971-07-20 Centre Nat Rech Scient Ellipsometric method and device
US4053232A (en) * 1973-06-25 1977-10-11 International Business Machines Corporation Rotating-compensator ellipsometer
FR2602338B1 (fr) * 1986-07-30 1989-06-30 Centre Nat Rech Scient Ellipsometre a modulation de phase fonctionnant dans l'infrarouge
US4969200A (en) * 1988-03-25 1990-11-06 Texas Instruments Incorporated Target autoalignment for pattern inspector or writer
US5196903A (en) * 1990-03-29 1993-03-23 Jeol Ltd. Pulsed light source spectrometer with interferometer

Also Published As

Publication number Publication date
US5485271A (en) 1996-01-16
EP0558863B1 (de) 1996-03-06
EP0558863A1 (de) 1993-09-08
JPH05264355A (ja) 1993-10-12
DE69208862T2 (de) 1996-10-02
FR2685962A1 (fr) 1993-07-09
FR2685962B1 (fr) 1994-05-20
JP3337734B2 (ja) 2002-10-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee