DE69207741D1 - Zeitmesser für Ereignisse im Picosekundenbereich - Google Patents

Zeitmesser für Ereignisse im Picosekundenbereich

Info

Publication number
DE69207741D1
DE69207741D1 DE69207741T DE69207741T DE69207741D1 DE 69207741 D1 DE69207741 D1 DE 69207741D1 DE 69207741 T DE69207741 T DE 69207741T DE 69207741 T DE69207741 T DE 69207741T DE 69207741 D1 DE69207741 D1 DE 69207741D1
Authority
DE
Germany
Prior art keywords
timers
events
picosecond range
picosecond
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69207741T
Other languages
English (en)
Other versions
DE69207741T2 (de
Inventor
David C Chu
Thomas A Knotts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69207741D1 publication Critical patent/DE69207741D1/de
Application granted granted Critical
Publication of DE69207741T2 publication Critical patent/DE69207741T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
    • G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
DE69207741T 1991-12-19 1992-08-06 Zeitmesser für Ereignisse im Picosekundenbereich Expired - Fee Related DE69207741T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/810,946 US5166959A (en) 1991-12-19 1991-12-19 Picosecond event timer

Publications (2)

Publication Number Publication Date
DE69207741D1 true DE69207741D1 (de) 1996-02-29
DE69207741T2 DE69207741T2 (de) 1996-08-29

Family

ID=25205100

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69207741T Expired - Fee Related DE69207741T2 (de) 1991-12-19 1992-08-06 Zeitmesser für Ereignisse im Picosekundenbereich

Country Status (5)

Country Link
US (1) US5166959A (de)
EP (1) EP0547292B1 (de)
JP (1) JP3337507B2 (de)
DE (1) DE69207741T2 (de)
HK (1) HK210496A (de)

Families Citing this family (46)

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JP2868266B2 (ja) * 1990-01-25 1999-03-10 株式会社日本自動車部品総合研究所 信号位相差検出回路及び信号位相差検出方法
US5428648A (en) * 1992-09-18 1995-06-27 Sony Corporation Digital PLL circuit having signal edge position measurement
JP2929888B2 (ja) * 1993-03-26 1999-08-03 株式会社デンソー パルス位相差符号化回路
GB2296142B (en) * 1994-12-16 1998-03-18 Plessey Semiconductors Ltd Circuit arrangement for measuring a time interval
US5828717A (en) * 1995-03-28 1998-10-27 Matsushita Electric Industrial Co. Ltd. Time counting circuit and counter circuit
US5812626A (en) * 1995-06-13 1998-09-22 Matsushita Electric Industrial Co., Ltd. Time counting circuit sampling circuit skew adjusting circuit and logic analyzing circuit
JP2793524B2 (ja) * 1995-07-31 1998-09-03 日本電気アイシーマイコンシステム株式会社 時間測定システムおよびその測定方法
US5835552A (en) * 1995-11-13 1998-11-10 Matsushita Electric Industrial Co.,Ltd. Time counting circuit and counter circuit
US5703838A (en) * 1996-02-16 1997-12-30 Lecroy Corporation Vernier delay line interpolator and coarse counter realignment
US5903522A (en) * 1996-04-19 1999-05-11 Oak Technology, Inc. Free loop interval timer and modulator
US5793709A (en) * 1996-04-19 1998-08-11 Xli Corporation Free loop interval timer and modulator
JP3123931B2 (ja) * 1996-08-29 2001-01-15 日本電気アイシーマイコンシステム株式会社 時間測定システム及びその時間測定方法
US5818890A (en) * 1996-09-24 1998-10-06 Motorola, Inc. Method for synchronizing signals and structures therefor
US6255969B1 (en) * 1997-12-18 2001-07-03 Advanced Micro Devices, Inc. Circuit and method for high speed bit stream capture using a digital delay line
US6377094B1 (en) 2002-03-25 2002-04-23 Oak Technology, Inc. Arbitrary waveform synthesizer using a free-running ring oscillator
US6393088B1 (en) * 2001-01-16 2002-05-21 Wavecrest Corporation Measurement system with a frequency-dividing edge counter
US6535735B2 (en) * 2001-03-22 2003-03-18 Skyworks Solutions, Inc. Critical path adaptive power control
US6894953B2 (en) * 2001-09-12 2005-05-17 Lockheed Martin Corporation Circuit for measuring time of arrival of an asynchronous event
US6480126B1 (en) * 2001-10-26 2002-11-12 Agilent Technologies, Inc. Phase digitizer
US6738143B2 (en) * 2001-11-13 2004-05-18 Agilent Technologies, Inc System and method for interferometer non-linearity compensation
US6792368B2 (en) * 2002-01-17 2004-09-14 Agilent Technologies, Inc. System and method for heterodyne interferometer high velocity type non-linearity compensation
US6868503B1 (en) 2002-01-19 2005-03-15 National Semiconductor Corporation Adaptive voltage scaling digital processing component and method of operating the same
US6950375B2 (en) * 2002-12-17 2005-09-27 Agilent Technologies, Inc. Multi-phase clock time stamping
US7613263B2 (en) * 2003-03-04 2009-11-03 Altera Corporation Clock and data recovery method and apparatus
US6952175B2 (en) * 2003-09-23 2005-10-04 Agilent Technologies, Inc. Phase digitizer for signals in imperfect quadrature
US20050163255A1 (en) * 2004-01-22 2005-07-28 Broadcom Corporation System and method for simplifying analog processing in a transmitter
US7606321B2 (en) * 2004-01-22 2009-10-20 Broadcom Corporation System and method for simplifying analog processing in a transmitter incorporating a randomization circuit
US6822588B1 (en) * 2004-04-15 2004-11-23 Agilent Technologies, Inc. Pulse width modulation systems and methods
US7436519B2 (en) 2005-06-01 2008-10-14 Agilent Technologies, Inc. System and method for interferometer non-linearity compensation
JP2007085933A (ja) * 2005-09-22 2007-04-05 Agilent Technol Inc 周波数測定方法および周波数測定装置
US7339853B2 (en) * 2005-12-02 2008-03-04 Agilent Technologies, Inc. Time stamping events for fractions of a clock cycle
US7446612B2 (en) * 2006-09-08 2008-11-04 Skyworks Solutions, Inc. Amplifier feedback and bias configuration
US8138843B2 (en) * 2006-09-15 2012-03-20 Massachusetts Institute Of Technology Gated ring oscillator for a time-to-digital converter with shaped quantization noise
US8346832B2 (en) * 2006-10-12 2013-01-01 The Regents Of The University Of Michigan Random number generator
US7696826B2 (en) * 2006-12-04 2010-04-13 Skyworks Solutions, Inc. Temperature compensation of collector-voltage control RF amplifiers
US7605375B2 (en) * 2007-04-26 2009-10-20 Oy Ajat Ltd. Multi-functional radiation/photon identifying and processing application specific integrated circuit and device
US7921312B1 (en) 2007-09-14 2011-04-05 National Semiconductor Corporation System and method for providing adaptive voltage scaling with multiple clock domains inside a single voltage domain
US7930121B2 (en) * 2008-07-03 2011-04-19 Texas Instrument Incorporated Method and apparatus for synchronizing time stamps
US8050148B2 (en) * 2008-07-03 2011-11-01 Texas Instruments Incorporated Flash time stamp apparatus
EP2375294A1 (de) 2010-04-07 2011-10-12 Imec Zeitstempelerzeugungsverbesserung
ITBO20110461A1 (it) 2011-07-29 2013-01-30 Alfa Wassermann Spa Composizioni farmaceutiche comprendenti rifaximina, processi per la loro preparazione e loro uso nel trattamento di infezioni vaginali.
US8498373B2 (en) * 2011-09-20 2013-07-30 Arm Limited Generating a regularly synchronised count value
JP2016516988A (ja) 2013-03-15 2016-06-09 アルファ ワッセルマン ソシエタ ペル アチオニＡｌｆａ Ｗａｓｓｅｒｍａｎｎ Ｓ．Ｐ．Ａ． 膣感染症を診断するための方法
AU2014229467A1 (en) 2013-03-15 2015-08-06 Alfa Wassermann S.P.A. Rifaximin for use in the treating of vaginal infections.
FR3052559B1 (fr) 2016-06-10 2020-06-12 Onera (Office National D'etudes Et De Recherches Aerospatiales) Systeme et procede pour fournir l'amplitude et le retard de phase d'un signal sinusoidal
US11641206B2 (en) * 2021-01-07 2023-05-02 AyDeeKay LLC Digitally calibrated programmable clock phase generation circuit

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4468746A (en) * 1981-12-01 1984-08-28 Cincinnati Electronics Corporation Apparatus for determining interval between two events
US4731768A (en) * 1986-09-15 1988-03-15 Tektronix Autoranging time stamp circuit
US4764694A (en) * 1987-04-22 1988-08-16 Genrad, Inc. Interpolating time-measurement apparatus
US4908784A (en) * 1987-08-04 1990-03-13 Wave Technologies, Inc. Method and apparatus for asynchronous time measurement

Also Published As

Publication number Publication date
EP0547292B1 (de) 1996-01-17
JPH05273364A (ja) 1993-10-22
DE69207741T2 (de) 1996-08-29
HK210496A (en) 1996-12-06
US5166959A (en) 1992-11-24
EP0547292A1 (de) 1993-06-23
JP3337507B2 (ja) 2002-10-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee