DE69201578D1 - System zur Auswertung der Eigenschaften eines elektrischen Filters. - Google Patents

System zur Auswertung der Eigenschaften eines elektrischen Filters.

Info

Publication number
DE69201578D1
DE69201578D1 DE69201578T DE69201578T DE69201578D1 DE 69201578 D1 DE69201578 D1 DE 69201578D1 DE 69201578 T DE69201578 T DE 69201578T DE 69201578 T DE69201578 T DE 69201578T DE 69201578 D1 DE69201578 D1 DE 69201578D1
Authority
DE
Germany
Prior art keywords
evaluating
properties
electrical filter
filter
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69201578T
Other languages
English (en)
Other versions
DE69201578T2 (de
Inventor
Jacques Guillard
Christian Girard
Pierre Morin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alcatel CIT SA
Original Assignee
Alcatel Cable SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Cable SA filed Critical Alcatel Cable SA
Application granted granted Critical
Publication of DE69201578D1 publication Critical patent/DE69201578D1/de
Publication of DE69201578T2 publication Critical patent/DE69201578T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Optical Communication System (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE69201578T 1991-02-13 1992-02-10 System zur Auswertung der Eigenschaften eines elektrischen Filters. Expired - Fee Related DE69201578T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9101667A FR2672686B1 (fr) 1991-02-13 1991-02-13 Systeme d'evaluation des performances d'un filtre electrique.

Publications (2)

Publication Number Publication Date
DE69201578D1 true DE69201578D1 (de) 1995-04-13
DE69201578T2 DE69201578T2 (de) 1995-07-13

Family

ID=9409660

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69201578T Expired - Fee Related DE69201578T2 (de) 1991-02-13 1992-02-10 System zur Auswertung der Eigenschaften eines elektrischen Filters.

Country Status (5)

Country Link
US (1) US5315257A (de)
EP (1) EP0499169B1 (de)
CA (1) CA2060935C (de)
DE (1) DE69201578T2 (de)
FR (1) FR2672686B1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002527804A (ja) * 1998-10-08 2002-08-27 シーメンス アクチエンゲゼルシヤフト 多くの結合された制御量を有する制御対象を調節するための調節装置
IL128007A (en) * 1999-01-11 2003-02-12 Milsys Ltd Enhancements on compact logic devices and also for accelerating and securing computations in modular arithmetic especially for use in public key cryptographic co-processors designed for elliptic curve and rsa type computations
CN100340865C (zh) * 2004-02-21 2007-10-03 华为技术有限公司 一种滤波器的自动化测试方法
DE102005029615A1 (de) * 2005-06-23 2007-01-04 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren zur Erkennung von Bauteilefehlern einer analogen Signalverarbeitungsschaltung insbesondere für einen Messumformer
DE102009056395A1 (de) * 2009-11-23 2011-05-26 Esw Gmbh Verfahren zur Funktionsprüfung von elektrischen Filtern sowie Filter mit Prüfeinrichtung
GB2491587B (en) * 2011-06-06 2018-09-05 E2V Tech Uk Limited Magnetron filter
US8744390B2 (en) * 2012-03-29 2014-06-03 Adc Telecommunications, Inc. Systems and methods for adjusting system tests based on detected interference
DE102020117672A1 (de) 2020-07-03 2022-01-05 Avl Software And Functions Gmbh Verfahren zur Überwachung der Filterfunktion und Filteranordnung

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492568A (en) * 1967-10-05 1970-01-27 Tamar Electronics Ind Inc Checking the radio frequency shielding effectivity of an enclosure with an rf transmitter connected to enclosure surfaces and fr receiver to sense surface current at leakage points
US3651400A (en) * 1969-05-26 1972-03-21 Allen Bradley Co Apparatus and method for testing the insertion loss of electrical filters
FR2134092B1 (de) * 1971-04-19 1974-04-05 Lannionnais Electronique
US3764894A (en) * 1971-12-13 1973-10-09 Exxon Research Engineering Co Static charge tester
US4093914A (en) * 1977-04-06 1978-06-06 General Electric Company Method of measuring parameters of a crystal filter
US4647844A (en) * 1984-08-03 1987-03-03 Cooper Industries, Inc. Method and apparatus for testing shielded cable assemblies
US5194818A (en) * 1991-02-27 1993-03-16 National Semiconductor Corporation Risetime and falltime test system and method

Also Published As

Publication number Publication date
EP0499169B1 (de) 1995-03-08
DE69201578T2 (de) 1995-07-13
CA2060935A1 (fr) 1992-08-14
FR2672686B1 (fr) 1993-04-16
FR2672686A1 (fr) 1992-08-14
US5315257A (en) 1994-05-24
EP0499169A1 (de) 1992-08-19
CA2060935C (fr) 1996-11-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: ALCATEL CIT, PARIS, FR

8328 Change in the person/name/address of the agent

Free format text: DREISS, FUHLENDORF, STEIMLE & BECKER, 70188 STUTTGART

8339 Ceased/non-payment of the annual fee