DE69123069D1 - Massenspektrometrie-Systeme - Google Patents

Massenspektrometrie-Systeme

Info

Publication number
DE69123069D1
DE69123069D1 DE69123069T DE69123069T DE69123069D1 DE 69123069 D1 DE69123069 D1 DE 69123069D1 DE 69123069 T DE69123069 T DE 69123069T DE 69123069 T DE69123069 T DE 69123069T DE 69123069 D1 DE69123069 D1 DE 69123069D1
Authority
DE
Germany
Prior art keywords
mass spectrometry
spectrometry systems
systems
mass
spectrometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69123069T
Other languages
English (en)
Inventor
John Desmond Waldron
Mark G Dowsett
Peter John Derrick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kratos Analytical Ltd
Original Assignee
Kratos Analytical Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kratos Analytical Ltd filed Critical Kratos Analytical Ltd
Application granted granted Critical
Publication of DE69123069D1 publication Critical patent/DE69123069D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/443Dynamic spectrometers
    • H01J49/446Time-of-flight spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE69123069T 1990-03-21 1991-03-18 Massenspektrometrie-Systeme Expired - Lifetime DE69123069D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB909006303A GB9006303D0 (en) 1990-03-21 1990-03-21 Mass spectrometry systems

Publications (1)

Publication Number Publication Date
DE69123069D1 true DE69123069D1 (de) 1996-12-19

Family

ID=10672962

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69123069T Expired - Lifetime DE69123069D1 (de) 1990-03-21 1991-03-18 Massenspektrometrie-Systeme

Country Status (5)

Country Link
US (1) US5171987A (de)
EP (1) EP0448331B1 (de)
JP (1) JPH0620643A (de)
DE (1) DE69123069D1 (de)
GB (2) GB9006303D0 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5202563A (en) * 1991-05-16 1993-04-13 The Johns Hopkins University Tandem time-of-flight mass spectrometer
GB9510699D0 (en) * 1995-05-26 1995-07-19 Fisons Plc Apparatus and method for surface analysis
CA2405047C (en) * 2000-06-28 2007-03-27 The Johns Hopkins University Time-of-flight mass spectrometer array instrument
CA2800040C (en) * 2002-10-29 2015-12-29 Target Discovery, Inc. Method for increasing ionization efficiency in mass spectroscopy
KR100869074B1 (ko) * 2006-10-31 2008-11-18 한국전력공사 질량분석법을 이용한 중수로 중수누설 감시방법 및 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5034439B1 (de) * 1969-05-16 1975-11-08
US3894233A (en) * 1972-10-27 1975-07-08 Hitachi Ltd Ion microprobe analyzer
DE2338452A1 (de) * 1973-07-28 1975-02-06 Viktor Dr Ing Winkler Verfahren und vorrichtung zur anregung und/oder bearbeitung von oberflaechen mit mehreren arten von korpuskularstrahlen in einem arbeitsgang sowie zur erzeugung und konzentration von korpuskularstrahlen
US4472631A (en) * 1982-06-04 1984-09-18 Research Corporation Combination of time resolution and mass dispersive techniques in mass spectrometry
US4818872A (en) * 1987-05-11 1989-04-04 Microbeam Inc. Integrated charge neutralization and imaging system
JP2523781B2 (ja) * 1988-04-28 1996-08-14 日本電子株式会社 飛行時間型/偏向二重収束型切換質量分析装置

Also Published As

Publication number Publication date
EP0448331A2 (de) 1991-09-25
US5171987A (en) 1992-12-15
EP0448331A3 (en) 1992-01-15
GB9105511D0 (en) 1991-05-01
GB9006303D0 (en) 1990-05-16
JPH0620643A (ja) 1994-01-28
EP0448331B1 (de) 1996-11-13

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Legal Events

Date Code Title Description
8332 No legal effect for de