DE69123069D1 - Massenspektrometrie-Systeme - Google Patents
Massenspektrometrie-SystemeInfo
- Publication number
- DE69123069D1 DE69123069D1 DE69123069T DE69123069T DE69123069D1 DE 69123069 D1 DE69123069 D1 DE 69123069D1 DE 69123069 T DE69123069 T DE 69123069T DE 69123069 T DE69123069 T DE 69123069T DE 69123069 D1 DE69123069 D1 DE 69123069D1
- Authority
- DE
- Germany
- Prior art keywords
- mass spectrometry
- spectrometry systems
- systems
- mass
- spectrometry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004949 mass spectrometry Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/443—Dynamic spectrometers
- H01J49/446—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB909006303A GB9006303D0 (en) | 1990-03-21 | 1990-03-21 | Mass spectrometry systems |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69123069D1 true DE69123069D1 (de) | 1996-12-19 |
Family
ID=10672962
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69123069T Expired - Lifetime DE69123069D1 (de) | 1990-03-21 | 1991-03-18 | Massenspektrometrie-Systeme |
Country Status (5)
Country | Link |
---|---|
US (1) | US5171987A (de) |
EP (1) | EP0448331B1 (de) |
JP (1) | JPH0620643A (de) |
DE (1) | DE69123069D1 (de) |
GB (2) | GB9006303D0 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5202563A (en) * | 1991-05-16 | 1993-04-13 | The Johns Hopkins University | Tandem time-of-flight mass spectrometer |
GB9510699D0 (en) * | 1995-05-26 | 1995-07-19 | Fisons Plc | Apparatus and method for surface analysis |
CA2405047C (en) * | 2000-06-28 | 2007-03-27 | The Johns Hopkins University | Time-of-flight mass spectrometer array instrument |
CA2800040C (en) * | 2002-10-29 | 2015-12-29 | Target Discovery, Inc. | Method for increasing ionization efficiency in mass spectroscopy |
KR100869074B1 (ko) * | 2006-10-31 | 2008-11-18 | 한국전력공사 | 질량분석법을 이용한 중수로 중수누설 감시방법 및 장치 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5034439B1 (de) * | 1969-05-16 | 1975-11-08 | ||
US3894233A (en) * | 1972-10-27 | 1975-07-08 | Hitachi Ltd | Ion microprobe analyzer |
DE2338452A1 (de) * | 1973-07-28 | 1975-02-06 | Viktor Dr Ing Winkler | Verfahren und vorrichtung zur anregung und/oder bearbeitung von oberflaechen mit mehreren arten von korpuskularstrahlen in einem arbeitsgang sowie zur erzeugung und konzentration von korpuskularstrahlen |
US4472631A (en) * | 1982-06-04 | 1984-09-18 | Research Corporation | Combination of time resolution and mass dispersive techniques in mass spectrometry |
US4818872A (en) * | 1987-05-11 | 1989-04-04 | Microbeam Inc. | Integrated charge neutralization and imaging system |
JP2523781B2 (ja) * | 1988-04-28 | 1996-08-14 | 日本電子株式会社 | 飛行時間型/偏向二重収束型切換質量分析装置 |
-
1990
- 1990-03-21 GB GB909006303A patent/GB9006303D0/en active Pending
-
1991
- 1991-03-15 GB GB919105511A patent/GB9105511D0/en active Pending
- 1991-03-18 EP EP91302329A patent/EP0448331B1/de not_active Expired - Lifetime
- 1991-03-18 DE DE69123069T patent/DE69123069D1/de not_active Expired - Lifetime
- 1991-03-19 US US07/671,368 patent/US5171987A/en not_active Expired - Lifetime
- 1991-03-20 JP JP3056741A patent/JPH0620643A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0448331A2 (de) | 1991-09-25 |
US5171987A (en) | 1992-12-15 |
EP0448331A3 (en) | 1992-01-15 |
GB9105511D0 (en) | 1991-05-01 |
GB9006303D0 (en) | 1990-05-16 |
JPH0620643A (ja) | 1994-01-28 |
EP0448331B1 (de) | 1996-11-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |