DE69100176D1 - Impulsformerschaltung. - Google Patents

Impulsformerschaltung.

Info

Publication number
DE69100176D1
DE69100176D1 DE9191119190T DE69100176T DE69100176D1 DE 69100176 D1 DE69100176 D1 DE 69100176D1 DE 9191119190 T DE9191119190 T DE 9191119190T DE 69100176 T DE69100176 T DE 69100176T DE 69100176 D1 DE69100176 D1 DE 69100176D1
Authority
DE
Germany
Prior art keywords
pulse shifting
shifting
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE9191119190T
Other languages
English (en)
Other versions
DE69100176T2 (de
Inventor
Ulrich Knoch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Hewlett Packard GmbH Germany
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard GmbH Germany filed Critical Hewlett Packard GmbH Germany
Application granted granted Critical
Publication of DE69100176D1 publication Critical patent/DE69100176D1/de
Publication of DE69100176T2 publication Critical patent/DE69100176T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE91119190T 1991-11-11 1991-11-11 Impulsformerschaltung. Expired - Fee Related DE69100176T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP91119190A EP0541840B1 (de) 1991-11-11 1991-11-11 Impulsformerschaltung

Publications (2)

Publication Number Publication Date
DE69100176D1 true DE69100176D1 (de) 1993-08-19
DE69100176T2 DE69100176T2 (de) 1993-10-28

Family

ID=8207325

Family Applications (1)

Application Number Title Priority Date Filing Date
DE91119190T Expired - Fee Related DE69100176T2 (de) 1991-11-11 1991-11-11 Impulsformerschaltung.

Country Status (4)

Country Link
US (1) US5293079A (de)
EP (1) EP0541840B1 (de)
JP (1) JP3130386B2 (de)
DE (1) DE69100176T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69326003T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat zum Testen und Handhaben einer Vielzahl von Vorrichtungen
DE69326004T2 (de) * 1993-09-20 1999-11-25 Hewlett-Packard Gmbh Testapparat mit grosser Kapazität
JP3157681B2 (ja) * 1994-06-27 2001-04-16 日本電気株式会社 論理データ入力ラッチ回路
US5537062A (en) * 1995-06-07 1996-07-16 Ast Research, Inc. Glitch-free clock enable circuit
EP0899878B1 (de) * 1997-08-29 2003-11-05 STMicroelectronics S.r.l. Kippschaltung mit reduzierter Integrationsfläche
US6275962B1 (en) 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
JP4757365B2 (ja) * 1999-09-28 2011-08-24 株式会社アドバンテスト 波形フォーマッタ・この波形フォーマッタを搭載した半導体デバイス試験装置
JP3537087B2 (ja) 2000-09-29 2004-06-14 Ｎｅｃエレクトロニクス株式会社 半導体装置及び半導体装置の検査方法
DE10219119A1 (de) * 2002-04-29 2003-11-13 Infineon Technologies Ag Über ein Taktsignal geteuertes Flipflop, Verfahren zum Durchschalten eines Signals durch ein Flipflop, Verwendung eines Flipflops sowie eine Takt-Sperrschaltung
US6771061B2 (en) * 2002-09-17 2004-08-03 Teradyne, Inc. High speed tester with narrow output pulses
US6856184B2 (en) * 2003-01-15 2005-02-15 Agilent Technologies, Inc Clock divider circuit
US7856578B2 (en) * 2005-09-23 2010-12-21 Teradyne, Inc. Strobe technique for test of digital signal timing
US7573957B2 (en) 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for recovering a clock in a digital signal
US7574632B2 (en) * 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for time stamping a digital signal
DE102005046981B4 (de) * 2005-09-30 2010-04-15 Qimonda Ag Speicher und Verfahren zum Verbessern der Zuverlässigkeit eines Speichers mit einem benutzten Speicherbereich und einem unbenutzten Speicherbereich
US7378854B2 (en) * 2005-10-28 2008-05-27 Teradyne, Inc. Dual sine-wave time stamp method and apparatus
US7593497B2 (en) * 2005-10-31 2009-09-22 Teradyne, Inc. Method and apparatus for adjustment of synchronous clock signals
KR100892296B1 (ko) * 2007-10-24 2009-04-08 주식회사 아이티엔티 반도체 테스트 패턴신호의 체배 장치

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3670249A (en) * 1971-05-06 1972-06-13 Rca Corp Sampling decoder for delay modulation signals
JPS5338952B2 (de) * 1973-07-09 1978-10-18
JPS5180755A (de) * 1975-01-10 1976-07-14 Kokusai Denshin Denwa Co Ltd
US4002933A (en) * 1975-02-18 1977-01-11 Texas Instruments Incorporated Five gate flip-flop
US4045693A (en) * 1976-07-08 1977-08-30 Gte Automatic Electric Laboratories Incorporated Negative r-s triggered latch
US4267514A (en) * 1979-02-16 1981-05-12 The United States Of America As Represented By The Secretary Of The Air Force Digital phase-frequency detector
JPS60126778A (ja) * 1983-12-13 1985-07-06 Fuji Electric Corp Res & Dev Ltd 光センサアレイの信号変換回路
US4677318A (en) * 1985-04-12 1987-06-30 Altera Corporation Programmable logic storage element for programmable logic devices
JPS61253918A (ja) * 1985-05-02 1986-11-11 Fujitsu Ltd 論理回路
US4980577A (en) * 1987-06-18 1990-12-25 Advanced Micro Devices, Inc. Dual triggered edge-sensitive asynchrounous flip-flop
DE3860705D1 (de) * 1988-01-28 1990-10-31 Hewlett Packard Gmbh Erkennungsschaltung fuer binaersignalzustandswechsel.
JP2688366B2 (ja) * 1989-03-20 1997-12-10 富士通株式会社 論理回路
US4891028A (en) * 1989-04-11 1990-01-02 Zenith Electronics Corporation Shielding means and process for use in the manufacture of tension mask color cathode ray tubes
US5001374A (en) * 1989-09-08 1991-03-19 Amp Incorporated Digital filter for removing short duration noise
US5159279A (en) * 1990-11-27 1992-10-27 Dsc Communications Corporation Apparatus and method for detecting out-of-lock condition in a phase lock loop
US5180933A (en) * 1991-11-26 1993-01-19 Honeywell Inc. Programmable digital out-of-lock detector

Also Published As

Publication number Publication date
EP0541840A1 (de) 1993-05-19
DE69100176T2 (de) 1993-10-28
US5293079A (en) 1994-03-08
EP0541840B1 (de) 1993-07-14
JPH05223899A (ja) 1993-09-03
JP3130386B2 (ja) 2001-01-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES DEUTSCHLAND GMBH, 71034 BOEBL

8327 Change in the person/name/address of the patent owner

Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG

8339 Ceased/non-payment of the annual fee