DE69017759D1 - Displacement detector using a tunnel scanning microscope. - Google Patents

Displacement detector using a tunnel scanning microscope.

Info

Publication number
DE69017759D1
DE69017759D1 DE69017759T DE69017759T DE69017759D1 DE 69017759 D1 DE69017759 D1 DE 69017759D1 DE 69017759 T DE69017759 T DE 69017759T DE 69017759 T DE69017759 T DE 69017759T DE 69017759 D1 DE69017759 D1 DE 69017759D1
Authority
DE
Germany
Prior art keywords
scanning microscope
displacement detector
tunnel scanning
tunnel
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69017759T
Other languages
German (de)
Other versions
DE69017759T2 (en
Inventor
Yiroyasu Nose
Toshimitsu Kawase
Toshihiko Miyazaki
Takahiro Oguchi
Akihiko Yamano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE69017759D1 publication Critical patent/DE69017759D1/en
Application granted granted Critical
Publication of DE69017759T2 publication Critical patent/DE69017759T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • G01Q10/06—Circuits or algorithms therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
DE69017759T 1989-04-27 1990-04-26 Displacement detector using a tunnel scanning microscope. Expired - Fee Related DE69017759T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1105889A JP2775464B2 (en) 1989-04-27 1989-04-27 Position detection device

Publications (2)

Publication Number Publication Date
DE69017759D1 true DE69017759D1 (en) 1995-04-20
DE69017759T2 DE69017759T2 (en) 1995-10-05

Family

ID=14419488

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69017759T Expired - Fee Related DE69017759T2 (en) 1989-04-27 1990-04-26 Displacement detector using a tunnel scanning microscope.

Country Status (4)

Country Link
US (1) US5150035A (en)
EP (1) EP0403766B1 (en)
JP (1) JP2775464B2 (en)
DE (1) DE69017759T2 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3856296T2 (en) * 1987-08-25 1999-07-15 Canon K.K., Tokio/Tokyo Tunnel current encoder
JP2761801B2 (en) * 1990-10-04 1998-06-04 キヤノン株式会社 Angular positional relationship detection method and encoder using the same
JP3126409B2 (en) * 1991-06-05 2001-01-22 キヤノン株式会社 Information recording and playback method
US5329122A (en) * 1991-08-29 1994-07-12 Canon Kabushiki Kaisha Information processing apparatus and scanning tunnel microscope
EP0537642B1 (en) * 1991-10-15 1999-01-07 Canon Kabushiki Kaisha Information processing apparatus with tracking mechanism
DE69415019T2 (en) * 1993-07-22 1999-06-24 Btg International Ltd., London INTELLIGENT OPTICAL SENSOR FOR OPTICAL NEAR FIELD DEVICE
JP2983876B2 (en) * 1994-03-22 1999-11-29 徹雄 大原 Real-time and nanometer-scale position measurement method and apparatus
JP3698749B2 (en) * 1995-01-11 2005-09-21 株式会社半導体エネルギー研究所 Liquid crystal cell manufacturing method and apparatus, and liquid crystal cell production system
JP3610108B2 (en) * 1995-01-13 2005-01-12 キヤノン株式会社 Information processing device
US6266581B1 (en) * 1996-05-10 2001-07-24 The United States Of America As Represented By The Secretary Of Commerce Spatial RAM for high precision data acquisition systems
US6838889B2 (en) * 2001-01-17 2005-01-04 Veeco Instruments Inc. Method and apparatus for reducing the parachuting of a probe
GB2401934A (en) * 2003-02-18 2004-11-24 Univ Cardiff Measurement technique and system based on sub-nano-scale reference patterns
TWI255256B (en) * 2003-12-25 2006-05-21 Ind Tech Res Inst Method and apparatus for oxidizing a nitride film
JP4276270B2 (en) * 2007-02-20 2009-06-10 ファナック株式会社 Machine tool with workpiece reference position setting function by contact detection

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5994734A (en) * 1982-11-22 1984-05-31 Oki Electric Ind Co Ltd Optical recording medium
US4674436A (en) * 1984-04-19 1987-06-23 Canon Kabushiki Kaisha Film forming apparatus
US4785762A (en) * 1984-04-19 1988-11-22 Canon Kabushiki Kaisha Apparatus for forming film
JPS61197676A (en) * 1985-02-27 1986-09-01 Canon Inc Image recording method
JPS61228988A (en) * 1985-04-02 1986-10-13 Canon Inc Photo-thermal conversion recording medium
US4840821A (en) * 1985-05-27 1989-06-20 Canon Kabushiki Kaisha Method of and apparatus for forming film
JPS62209302A (en) * 1986-03-10 1987-09-14 Shimadzu Corp Apparatus for detecting parallel moving quantity
US4835083A (en) * 1986-04-16 1989-05-30 Canon Kabushiki Kaisha Method for patterning electroconductive film and patterned electroconductive film
DE3856296T2 (en) * 1987-08-25 1999-07-15 Canon K.K., Tokio/Tokyo Tunnel current encoder
DE3856336T2 (en) * 1987-09-24 2000-01-27 Canon K.K., Tokio/Tokyo Micro probe
US5001409A (en) * 1987-10-09 1991-03-19 Hitachi, Ltd. Surface metrological apparatus
JP2760508B2 (en) * 1988-06-23 1998-06-04 工業技術院長 Scanning tunnel microscope
US5019707A (en) * 1989-03-23 1991-05-28 International Business Machines Corporation High speed waveform sampling with a tunneling microscope

Also Published As

Publication number Publication date
EP0403766A3 (en) 1993-01-13
JP2775464B2 (en) 1998-07-16
US5150035A (en) 1992-09-22
JPH02285213A (en) 1990-11-22
EP0403766A2 (en) 1990-12-27
EP0403766B1 (en) 1995-03-15
DE69017759T2 (en) 1995-10-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: WESER & KOLLEGEN, 81245 MUENCHEN

8339 Ceased/non-payment of the annual fee