DE69004404D1 - Apparat zur Erzeugung eines Strahlungsbildes. - Google Patents

Apparat zur Erzeugung eines Strahlungsbildes.

Info

Publication number
DE69004404D1
DE69004404D1 DE90121900T DE69004404T DE69004404D1 DE 69004404 D1 DE69004404 D1 DE 69004404D1 DE 90121900 T DE90121900 T DE 90121900T DE 69004404 T DE69004404 T DE 69004404T DE 69004404 D1 DE69004404 D1 DE 69004404D1
Authority
DE
Germany
Prior art keywords
generating
radiation image
radiation
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE90121900T
Other languages
English (en)
Other versions
DE69004404T2 (de
Inventor
Motosada Kiri
Susumu Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE69004404D1 publication Critical patent/DE69004404D1/de
Application granted granted Critical
Publication of DE69004404T2 publication Critical patent/DE69004404T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Biochemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Nuclear Medicine (AREA)
DE90121900T 1989-11-24 1990-11-15 Apparat zur Erzeugung eines Strahlungsbildes. Expired - Fee Related DE69004404T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1305646A JP2890553B2 (ja) 1989-11-24 1989-11-24 Ｘ線像撮像装置

Publications (2)

Publication Number Publication Date
DE69004404D1 true DE69004404D1 (de) 1993-12-09
DE69004404T2 DE69004404T2 (de) 1994-03-10

Family

ID=17947640

Family Applications (1)

Application Number Title Priority Date Filing Date
DE90121900T Expired - Fee Related DE69004404T2 (de) 1989-11-24 1990-11-15 Apparat zur Erzeugung eines Strahlungsbildes.

Country Status (4)

Country Link
US (1) US5151588A (de)
EP (1) EP0429977B1 (de)
JP (1) JP2890553B2 (de)
DE (1) DE69004404T2 (de)

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US5796153A (en) * 1995-05-08 1998-08-18 Analogic Corporation Variable-response x-ray detection assemblies and methods of using same
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FR2735632B1 (fr) * 1995-06-14 1997-07-11 Commissariat Energie Atomique Dispositif et procede de numerisation pour detecteurs photosensibles et procede de lecture d'une matrice de detecteurs photoniques
US6178224B1 (en) 1995-06-23 2001-01-23 Science Applications International Corporation Enhanced X-ray converter screen for X-ray radioscopic systems
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US7110496B1 (en) 2004-07-21 2006-09-19 Science Applications International Corporation Portable system and method for non-intrusive radioscopic imaging
US7068753B2 (en) * 2004-07-30 2006-06-27 Jordan Valley Applied Radiation Ltd. Enhancement of X-ray reflectometry by measurement of diffuse reflections
US7120228B2 (en) * 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
US7600916B2 (en) * 2004-12-01 2009-10-13 Jordan Valley Semiconductors Ltd. Target alignment for X-ray scattering measurements
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US7076024B2 (en) * 2004-12-01 2006-07-11 Jordan Valley Applied Radiation, Ltd. X-ray apparatus with dual monochromators
US7804934B2 (en) 2004-12-22 2010-09-28 Jordan Valley Semiconductors Ltd. Accurate measurement of layer dimensions using XRF
US20070076842A1 (en) * 2005-09-30 2007-04-05 Tkaczyk John E Adaptable energy discriminating computed tomography system
DE102005049228B4 (de) 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
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US20090257553A1 (en) * 2006-07-19 2009-10-15 Hitachi Medical Corporation X-ray ct apparatus and image noise reduction method
US7406153B2 (en) * 2006-08-15 2008-07-29 Jordan Valley Semiconductors Ltd. Control of X-ray beam spot size
IL180482A0 (en) * 2007-01-01 2007-06-03 Jordan Valley Semiconductors Inspection of small features using x - ray fluorescence
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DE102007033462A1 (de) 2007-07-18 2009-01-22 Siemens Ag Quantendetektormodul, Quantendetektor, Verfahren zur Ermittlung von Quantenabsorptionsereignissen, Computerprogrammprodukt und Strahlungserfassungseinrichtung
EP2028509A1 (de) * 2007-08-09 2009-02-25 European Organisation for Nuclear Research CERN Strahlungsüberwachungsvorrichtung
US7680243B2 (en) * 2007-09-06 2010-03-16 Jordan Valley Semiconductors Ltd. X-ray measurement of properties of nano-particles
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FR2938936B1 (fr) * 2008-11-25 2016-01-15 Sopro Dispositif d'acquisition d'images multifonction
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US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
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JP5995491B2 (ja) * 2012-04-06 2016-09-21 株式会社日立製作所 Ｘ線ｃｔ装置
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JP6415867B2 (ja) * 2013-06-20 2018-10-31 キヤノンメディカルシステムズ株式会社 Ｘ線ｃｔ装置及び医用画像診断装置
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Also Published As

Publication number Publication date
US5151588A (en) 1992-09-29
JP2890553B2 (ja) 1999-05-17
EP0429977B1 (de) 1993-11-03
EP0429977A3 (en) 1991-12-04
EP0429977A2 (de) 1991-06-05
JPH03165291A (ja) 1991-07-17
DE69004404T2 (de) 1994-03-10

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