DE69003760D1 - Spektroskopiesysteme bei der Elektroreflexionsmessung. - Google Patents

Spektroskopiesysteme bei der Elektroreflexionsmessung.

Info

Publication number
DE69003760D1
DE69003760D1 DE90114222T DE69003760T DE69003760D1 DE 69003760 D1 DE69003760 D1 DE 69003760D1 DE 90114222 T DE90114222 T DE 90114222T DE 69003760 T DE69003760 T DE 69003760T DE 69003760 D1 DE69003760 D1 DE 69003760D1
Authority
DE
Germany
Prior art keywords
electroreflection
measurement
spectroscopy systems
spectroscopy
systems
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE90114222T
Other languages
English (en)
Other versions
DE69003760T2 (de
Inventor
Claude Alibert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telecom Italia SpA
Original Assignee
CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSELT Centro Studi e Laboratori Telecomunicazioni SpA filed Critical CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Publication of DE69003760D1 publication Critical patent/DE69003760D1/de
Application granted granted Critical
Publication of DE69003760T2 publication Critical patent/DE69003760T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1721—Electromodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE90114222T 1989-07-26 1990-07-25 Spektroskopiesysteme bei der Elektroreflexionsmessung. Expired - Fee Related DE69003760T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT8967630A IT1232420B (it) 1989-07-26 1989-07-26 Perfezionamenti ai sistemi di spettroscopia mediante elettroriflettan za

Publications (2)

Publication Number Publication Date
DE69003760D1 true DE69003760D1 (de) 1993-11-11
DE69003760T2 DE69003760T2 (de) 1994-03-17

Family

ID=11304051

Family Applications (2)

Application Number Title Priority Date Filing Date
DE199090114222T Pending DE410404T1 (de) 1989-07-26 1990-07-25 Spektroskopiesysteme zur elektroreflexionsmessung.
DE90114222T Expired - Fee Related DE69003760T2 (de) 1989-07-26 1990-07-25 Spektroskopiesysteme bei der Elektroreflexionsmessung.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE199090114222T Pending DE410404T1 (de) 1989-07-26 1990-07-25 Spektroskopiesysteme zur elektroreflexionsmessung.

Country Status (3)

Country Link
EP (1) EP0410404B1 (de)
DE (2) DE410404T1 (de)
IT (1) IT1232420B (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106769880A (zh) * 2016-12-14 2017-05-31 薛永富 一种多光路电势检测方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH538687A (de) * 1971-11-23 1973-06-30 Bbc Brown Boveri & Cie Verfahren und Einrichtung zur Untersuchung der Störstellenkonzentration von Halbleitern

Also Published As

Publication number Publication date
IT1232420B (it) 1992-02-17
EP0410404A2 (de) 1991-01-30
IT8967630A0 (it) 1989-07-26
EP0410404B1 (de) 1993-10-06
DE410404T1 (de) 1991-08-14
EP0410404A3 (en) 1991-04-24
DE69003760T2 (de) 1994-03-17

Similar Documents

Publication Publication Date Title
DE69001386D1 (de) Hochempfindliches positionsmess-verfahren.
DE59002057D1 (de) Inkrementales messsystem.
DE69022343D1 (de) Überprüfungssystem.
DE69020494D1 (de) Metrologie.
DE68914553D1 (de) Lasermesssystem.
DE69003429D1 (de) Tastkopf.
DE69003149D1 (de) Tastkopf.
DE59007120D1 (de) Interferometrisches Analysengerät.
DE68914651D1 (de) Wiegegerät.
DE59102863D1 (de) Messwertaufnehmer.
NO905460D0 (no) Broennsonde.
DE69012837D1 (de) Messgerät.
DE69001445D1 (de) Maehvorrichtung.
DE59002854D1 (de) Temperaturmessschaltung.
DE59103189D1 (de) Messsonde.
DE69024016D1 (de) Messvorrichtung.
DE69021590D1 (de) Flüssigkeitsmessanordnung.
DE58902436D1 (de) Optoelektronische messanordnung.
DE69014399D1 (de) Messunterdrückungsmechanismus.
NO875154L (no) Evalueringssystem ved maalfoelging.
DE59009116D1 (de) Versuchsträger.
TR25442A (tr) Jaluzzi kasasi elemanlarina mahsus adaptör profili.
DE58901701D1 (de) Inkrementales messsystem.
DE59005180D1 (de) Wegmesssystem.
NO900317D0 (no) Maalemetode.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee