DE68928510T2 - Method of measuring the period of a surface defect - Google Patents

Method of measuring the period of a surface defect

Info

Publication number
DE68928510T2
DE68928510T2 DE68928510T DE68928510T DE68928510T2 DE 68928510 T2 DE68928510 T2 DE 68928510T2 DE 68928510 T DE68928510 T DE 68928510T DE 68928510 T DE68928510 T DE 68928510T DE 68928510 T2 DE68928510 T2 DE 68928510T2
Authority
DE
Germany
Prior art keywords
measuring
period
surface defect
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68928510T
Other languages
German (de)
Other versions
DE68928510D1 (en
Inventor
Takeshi C O Fuji Photo Fi Kiso
Takanori C O Fuji Photo Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Application granted granted Critical
Publication of DE68928510D1 publication Critical patent/DE68928510D1/en
Publication of DE68928510T2 publication Critical patent/DE68928510T2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8858—Flaw counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
    • G01N2021/8912—Processing using lane subdivision
DE68928510T 1988-09-09 1989-09-08 Method of measuring the period of a surface defect Expired - Fee Related DE68928510T2 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63226190A JPH0786474B2 (en) 1988-09-09 1988-09-09 Defect period measurement method

Publications (2)

Publication Number Publication Date
DE68928510D1 DE68928510D1 (en) 1998-02-05
DE68928510T2 true DE68928510T2 (en) 1998-04-16

Family

ID=16841298

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68928510T Expired - Fee Related DE68928510T2 (en) 1988-09-09 1989-09-08 Method of measuring the period of a surface defect

Country Status (4)

Country Link
US (1) US4982600A (en)
EP (1) EP0358236B1 (en)
JP (1) JPH0786474B2 (en)
DE (1) DE68928510T2 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0475454A3 (en) * 1990-09-14 1992-10-14 Fuji Photo Film Co., Ltd. Defect inspection system
JP2535257B2 (en) * 1991-05-07 1996-09-18 新日本製鐵株式会社 Strip surface defect inspection system
US5508622A (en) * 1994-12-14 1996-04-16 Gatzlaff; Harold Coating defect detector system
US5678447A (en) * 1996-04-17 1997-10-21 Eastman Kodak Company On-line web planarity measurement apparatus and method
FR2770646B1 (en) * 1997-11-06 1999-12-17 Eastman Kodak Co METHOD FOR IDENTIFYING DEFECTS IN A COATING
AU1353899A (en) * 1997-11-27 1999-06-16 Hoogovens Staal Bv Process and device for producing a strip-like material avoiding repeated surfacedefects
EP0927887A1 (en) * 1997-12-17 1999-07-07 Zellweger Luwa Ag Method for detecting periodic defects in a sample in motion
US6895811B2 (en) * 2001-12-14 2005-05-24 Shawmut Corporation Detection of small holes in laminates
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US7176475B2 (en) 2004-11-16 2007-02-13 Omron Corporation Adjusting apparatus, production processing system, and method of controlling adjusting apparatus
US7748259B2 (en) * 2006-12-15 2010-07-06 General Electric Company Systems and methods for solid oxide fuel cell surface analysis
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US20090028417A1 (en) * 2007-07-26 2009-01-29 3M Innovative Properties Company Fiducial marking for multi-unit process spatial synchronization
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7493678B1 (en) * 2007-09-13 2009-02-24 Ming-Tse Chen Method of inspecting cloth
US7781622B2 (en) * 2008-01-25 2010-08-24 Council Of Scientific & Industrial Research Process for direct hydroxylation of aromatic hydrocarbons
JP5453861B2 (en) * 2008-03-31 2014-03-26 Ｊｆｅスチール株式会社 Periodic defect detection apparatus and method
US7937233B2 (en) * 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
TWI420098B (en) * 2008-07-18 2013-12-21 Asahi Glass Co Ltd A defect inspection apparatus and method using the image data for defect inspection, a method for manufacturing the same, and a recording medium
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
KR100905519B1 (en) * 2009-03-11 2009-07-01 와이즈플래닛(주) Offer method of defect position for panel using visual encoder.
JP2013522595A (en) * 2010-03-10 2013-06-13 スリーエム イノベイティブ プロパティズ カンパニー Application-specific repetitive defect detection in the web manufacturing process
DE102011083405A1 (en) * 2010-12-21 2012-06-21 Sms Siemag Ag Method and device for surface inspection of band pieces
CN103507408A (en) * 2013-09-19 2014-01-15 安庆市康明纳包装有限公司 Automatic detecting device of printing machine
JP6062396B2 (en) * 2014-06-16 2017-01-18 Ckd株式会社 Inspection system and PTP packaging machine
DE102017108495A1 (en) 2017-04-21 2018-10-25 Windmöller & Hölscher Kg Monitoring procedure for monitoring an unwinding process, unwinding device and unwinding system
US10501274B2 (en) 2017-07-06 2019-12-10 Honeywell International Inc. Continuous web sheet defect analytics, classification and remediation for enhancing equipment efficiency and throughput

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1150424A (en) * 1956-05-03 1958-01-13 Method and apparatus for checking irregularity in streams of textile or the like
US3112642A (en) * 1960-05-06 1963-12-03 Republic Steel Corp Apparatus for measuring surface roughness
US3971272A (en) * 1963-10-01 1976-07-27 Zellweger, Ltd. Regulation of electronically operated quality control equipment
US3377828A (en) * 1963-12-02 1968-04-16 Republic Steel Corp Method of rolling metal strip to control surface roughness
DE1245605B (en) * 1964-10-20 1967-07-27 Janez Peklenik Dr Ing Method and device for determining parameters in stochastic processes
GB1207241A (en) * 1967-03-30 1970-09-30 Sumitomo Metal Ind Method of and apparatus for detecting local irregularities in strip and for controlling the evenness of strip
US3633211A (en) * 1969-10-17 1972-01-04 American Electronic Lab Inspection recorder means
JPS4935091A (en) * 1972-08-01 1974-04-01
US3835332A (en) * 1973-06-04 1974-09-10 Eastman Kodak Co Inspection apparatus for detecting defects in a web
JPS5112154A (en) * 1974-07-22 1976-01-30 Nippon Kokan Kk Hyomenheitandosokuteihoho
DE2525560C2 (en) * 1975-06-07 1991-04-18 Fritz 7347 Bad Überkingen Stahlecker Maintenance device which can be moved along an open-end spinning machine which has a large number of spinning positions arranged next to one another
DE2550814C3 (en) * 1975-11-12 1979-08-09 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Line scanning device for material webs to detect defects
US4134684A (en) * 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
SU939929A1 (en) * 1980-04-08 1982-06-30 Калининский филиал Всесоюзного научно-исследовательского института вагоностроения Device for measuring waviness
JPS58156842A (en) * 1982-03-15 1983-09-17 Toshiba Corp Detector for flaw of roll
SE459013B (en) * 1987-09-22 1989-05-29 Svenska Traeforskningsinst SET FOR SATISFACTION OF VARIATIONS IN PROPERTIES OF A CONTINUOUS CURRENT PAPER PATH
US4958307A (en) * 1987-11-20 1990-09-18 Kabushiki Kaisha Toshiba Roll mark inspection apparatus

Also Published As

Publication number Publication date
EP0358236A3 (en) 1991-05-29
EP0358236A2 (en) 1990-03-14
EP0358236B1 (en) 1997-12-29
JPH0786474B2 (en) 1995-09-20
US4982600A (en) 1991-01-08
DE68928510D1 (en) 1998-02-05
JPH0274852A (en) 1990-03-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee