DE68924995T2 - Zugriffszeitprüfung eingegrabener Anordnungen. - Google Patents
Zugriffszeitprüfung eingegrabener Anordnungen.Info
- Publication number
- DE68924995T2 DE68924995T2 DE68924995T DE68924995T DE68924995T2 DE 68924995 T2 DE68924995 T2 DE 68924995T2 DE 68924995 T DE68924995 T DE 68924995T DE 68924995 T DE68924995 T DE 68924995T DE 68924995 T2 DE68924995 T2 DE 68924995T2
- Authority
- DE
- Germany
- Prior art keywords
- buried
- orders
- access time
- time check
- check
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50012—Marginal testing, e.g. race, voltage or current testing of timing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/169,544 US4878209A (en) | 1988-03-17 | 1988-03-17 | Macro performance test |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68924995D1 DE68924995D1 (de) | 1996-01-18 |
DE68924995T2 true DE68924995T2 (de) | 1996-06-20 |
Family
ID=22616147
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68924995T Expired - Fee Related DE68924995T2 (de) | 1988-03-17 | 1989-03-07 | Zugriffszeitprüfung eingegrabener Anordnungen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4878209A (de) |
EP (1) | EP0337106B1 (de) |
JP (1) | JPH0210278A (de) |
DE (1) | DE68924995T2 (de) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5365165A (en) * | 1986-09-19 | 1994-11-15 | Actel Corporation | Testability architecture and techniques for programmable interconnect architecture |
US5367208A (en) | 1986-09-19 | 1994-11-22 | Actel Corporation | Reconfigurable programmable interconnect architecture |
US5058087A (en) * | 1987-05-29 | 1991-10-15 | Siemens Aktiengesellschaft | Process for determining the electrical duration of signal paths |
US4982349A (en) * | 1989-06-29 | 1991-01-01 | At&T Bell Laboratories | Response time analysis system |
JP2582906B2 (ja) * | 1989-10-21 | 1997-02-19 | 東芝マイクロエレクトロニクス株式会社 | 半導体装置の直流電流・電圧特性の測定方法 |
US5083299A (en) * | 1990-07-16 | 1992-01-21 | Unisys Corporation | Tester for measuring signal propagation delay through electronic components |
KR920006993A (ko) * | 1990-09-28 | 1992-04-28 | 정몽헌 | Epld의 입출력 마크로셀 시험회로 |
US5528600A (en) * | 1991-01-28 | 1996-06-18 | Actel Corporation | Testability circuits for logic arrays |
US5181191A (en) * | 1991-11-27 | 1993-01-19 | Hughes Aircraft Company | Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations |
US5268639A (en) * | 1992-06-05 | 1993-12-07 | Rambus, Inc. | Testing timing parameters of high speed integrated circuit devices |
US5455517A (en) * | 1992-06-09 | 1995-10-03 | International Business Machines Corporation | Data output impedance control |
CA2099415A1 (en) * | 1992-08-27 | 1994-02-28 | Duane Rodney Aadsen | Method and apparatus for self-testing of delay faults |
US6069849A (en) * | 1996-09-17 | 2000-05-30 | Xilinx, Inc. | Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator |
US5790479A (en) * | 1996-09-17 | 1998-08-04 | Xilinx, Inc. | Method for characterizing interconnect timing characteristics using reference ring oscillator circuit |
US6466520B1 (en) | 1996-09-17 | 2002-10-15 | Xilinx, Inc. | Built-in AC self test using pulse generators |
US6144262A (en) * | 1996-09-17 | 2000-11-07 | Xilinx, Inc. | Circuit for measuring signal delays of asynchronous register inputs |
US6233205B1 (en) | 1996-09-17 | 2001-05-15 | Xilinx, Inc. | Built-in self test method for measuring clock to out delays |
US6232845B1 (en) | 1996-09-17 | 2001-05-15 | Xilinx, Inc. | Circuit for measuring signal delays in synchronous memory elements |
US6075418A (en) * | 1996-09-17 | 2000-06-13 | Xilinx, Inc. | System with downstream set or clear for measuring signal propagation delays on integrated circuits |
US6219305B1 (en) | 1996-09-17 | 2001-04-17 | Xilinx, Inc. | Method and system for measuring signal propagation delays using ring oscillators |
KR100517257B1 (ko) * | 1996-11-27 | 2005-11-28 | 텍사스 인스트루먼츠 인코포레이티드 | 메모리어레이테스트회로 |
EP0845788B1 (de) * | 1996-11-27 | 2003-09-10 | Texas Instruments Incorporated | Speicherfeldprüfschaltung mit Fehlermeldung |
DE19711097C2 (de) * | 1997-03-17 | 2000-04-06 | Siemens Ag | Integrierte Schaltung mit einem Speicher und einer Prüfschaltung |
US6058496A (en) * | 1997-10-21 | 2000-05-02 | International Business Machines Corporation | Self-timed AC CIO wrap method and apparatus |
ITTO980467A1 (it) * | 1998-05-29 | 1999-11-29 | St Microelectronics Srl | Circuito di prova aggiuntivo per la misura di tempi di ritardo in circuiti non direttamente accessibili |
US6452459B1 (en) | 1999-07-22 | 2002-09-17 | Xilinx, Inc. | Circuit for measuring signal delays of synchronous memory elements |
US6327224B1 (en) | 2000-06-16 | 2001-12-04 | International Business Machines Corporation | On-chip method for measuring access time and data-pin spread |
JP4480238B2 (ja) * | 2000-07-18 | 2010-06-16 | Okiセミコンダクタ株式会社 | 半導体装置 |
US6630838B1 (en) | 2001-01-23 | 2003-10-07 | Xilinx, Inc. | Method for implementing dynamic burn-in testing using static test signals |
US6437597B1 (en) | 2001-04-11 | 2002-08-20 | Xilinx, Inc. | Methods and circuits for precise edge placement of test signals |
US7065684B1 (en) | 2002-04-18 | 2006-06-20 | Xilinx, Inc. | Circuits and methods for measuring signal propagation delays on integrated circuits |
US7212939B2 (en) * | 2005-02-18 | 2007-05-01 | Taiwan Semiconductor Manufacturin Co., Ltd. | Method and system for timing measurement of embedded macro module |
US7308630B2 (en) * | 2005-02-22 | 2007-12-11 | International Business Machines Corporation | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) |
US7656182B2 (en) * | 2007-03-21 | 2010-02-02 | International Business Machines Corporation | Testing method using a scalable parametric measurement macro |
FR3110261B1 (fr) * | 2020-05-18 | 2022-04-29 | Idemia Starchip | Procede et systeme de test d’un circuit integre |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3961252A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
US3961251A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
US3961254A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
US4058767A (en) * | 1975-04-29 | 1977-11-15 | International Business Machines Corporation | Apparatus and process for testing AC performance of LSI components |
US4225957A (en) * | 1978-10-16 | 1980-09-30 | International Business Machines Corporation | Testing macros embedded in LSI chips |
FR2460526A1 (fr) * | 1979-06-29 | 1981-01-23 | Ibm France | Procede de mesure du temps d'acces d'adresse de memoires mettant en oeuvre la technique de recirculation des donnees, et testeur en resultant |
US4482953A (en) * | 1980-05-30 | 1984-11-13 | Fairchild Camera & Instrument Corporation | Computer with console addressable PLA storing control microcode and microinstructions for self-test of internal registers and ALU |
US4430735A (en) * | 1981-05-26 | 1984-02-07 | Burroughs Corporation | Apparatus and technique for testing IC memories |
US4510603A (en) * | 1981-05-26 | 1985-04-09 | Burroughs Corporation | Testing system for reliable access times in ROM semiconductor memories |
US4481627A (en) * | 1981-10-30 | 1984-11-06 | Honeywell Information Systems Inc. | Embedded memory testing method and apparatus |
US4461000A (en) * | 1982-03-01 | 1984-07-17 | Harris Corporation | ROM/PLA Structure and method of testing |
US4513418A (en) * | 1982-11-08 | 1985-04-23 | International Business Machines Corporation | Simultaneous self-testing system |
US4503387A (en) * | 1982-12-30 | 1985-03-05 | Harris Corporation | A.C. Testing of logic arrays |
JPH0711559B2 (ja) * | 1983-11-07 | 1995-02-08 | 株式会社日立製作所 | テストパターン発生装置 |
US4608669A (en) * | 1984-05-18 | 1986-08-26 | International Business Machines Corporation | Self contained array timing |
JPS6122500A (ja) * | 1984-07-09 | 1986-01-31 | Advantest Corp | Ic試験装置 |
-
1988
- 1988-03-17 US US07/169,544 patent/US4878209A/en not_active Expired - Lifetime
-
1989
- 1989-03-07 DE DE68924995T patent/DE68924995T2/de not_active Expired - Fee Related
- 1989-03-07 EP EP89104012A patent/EP0337106B1/de not_active Expired - Lifetime
- 1989-03-17 JP JP1064044A patent/JPH0210278A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0337106A2 (de) | 1989-10-18 |
US4878209A (en) | 1989-10-31 |
EP0337106A3 (de) | 1991-07-03 |
DE68924995D1 (de) | 1996-01-18 |
EP0337106B1 (de) | 1995-12-06 |
JPH0210278A (ja) | 1990-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |