DE68921607D1 - Verfahren zum Züchten einer kristallinen halbleitenden Dünnschicht und Vorrichtung dafür. - Google Patents
Verfahren zum Züchten einer kristallinen halbleitenden Dünnschicht und Vorrichtung dafür.Info
- Publication number
- DE68921607D1 DE68921607D1 DE68921607T DE68921607T DE68921607D1 DE 68921607 D1 DE68921607 D1 DE 68921607D1 DE 68921607 T DE68921607 T DE 68921607T DE 68921607 T DE68921607 T DE 68921607T DE 68921607 D1 DE68921607 D1 DE 68921607D1
- Authority
- DE
- Germany
- Prior art keywords
- growing
- thin film
- device therefor
- semiconducting thin
- crystalline semiconducting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02395—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02546—Arsenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/925—Fluid growth doping control, e.g. delta doping
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1080482A JPH02260417A (ja) | 1989-03-30 | 1989-03-30 | 半導体薄膜の結晶成長方法及びその装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68921607D1 true DE68921607D1 (de) | 1995-04-13 |
DE68921607T2 DE68921607T2 (de) | 1995-07-27 |
Family
ID=13719498
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68921607T Expired - Fee Related DE68921607T2 (de) | 1989-03-30 | 1989-12-01 | Verfahren zum Züchten einer kristallinen halbleitenden Dünnschicht und Vorrichtung dafür. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5061643A (de) |
EP (1) | EP0389718B1 (de) |
JP (1) | JPH02260417A (de) |
DE (1) | DE68921607T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5493445A (en) * | 1990-03-29 | 1996-02-20 | The United States Of America As Represented By The Secretary Of The Navy | Laser textured surface absorber and emitter |
US5164324A (en) * | 1990-03-29 | 1992-11-17 | The United States Of America As Represented By The Secretary Of The Navy | Laser texturing |
US5322988A (en) * | 1990-03-29 | 1994-06-21 | The United States Of America As Represented By The Secretary Of The Navy | Laser texturing |
US5354420A (en) * | 1990-03-29 | 1994-10-11 | The United States Of America As Represented By The Secretary Of The Navy | Method for laser-assisted etching of III-V and II-VI semiconductor compounds using chlorofluorocarbon ambients |
US5310989A (en) * | 1990-04-10 | 1994-05-10 | The United States Of America As Represented By The Secretary Of The Navy | Method for laser-assisted etching of III-V and II-VI semiconductor compounds using chlorofluorocarbon ambients |
US5840592A (en) * | 1993-12-21 | 1998-11-24 | The United States Of America As Represented By The Secretary Of The Navy | Method of improving the spectral response and dark current characteristics of an image gathering detector |
JPH098344A (ja) * | 1995-06-14 | 1997-01-10 | Hitachi Cable Ltd | 発光ダイオード及びその製造方法 |
KR0178303B1 (ko) * | 1995-10-27 | 1999-04-15 | 김은영 | CBr4 개스를 이용한 반도체 패턴 측면의 에피성장율 조절방법 |
US6043509A (en) * | 1996-12-13 | 2000-03-28 | Hitachi Cable, Ltd. | Light-emitting diode having moisture-proof characteristics and high output power |
TW558666B (en) * | 1997-09-25 | 2003-10-21 | Toshiba Corp | Method of manufacturing semiconductor apparatus |
US6245144B1 (en) | 1999-12-06 | 2001-06-12 | Lucent Technologies Inc. | Doping control in selective area growth (SAG) of InP epitaxy in the fabrication of solid state semiconductor lasers |
CN1095514C (zh) * | 2000-11-22 | 2002-12-04 | 中国科学院广州化学研究所 | 一种氯化木素及其衍生物的降解方法 |
US6479313B1 (en) * | 2001-05-25 | 2002-11-12 | Kopin Corporation | Method of manufacturing GaN-based p-type compound semiconductors and light emitting diodes |
JP2010232638A (ja) * | 2009-03-03 | 2010-10-14 | Hitachi Cable Ltd | 発光素子用エピタキシャルウェハおよび発光素子 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59121917A (ja) * | 1982-12-28 | 1984-07-14 | Nec Corp | 気相成長装置 |
US4657777A (en) * | 1984-12-17 | 1987-04-14 | Canon Kabushiki Kaisha | Formation of deposited film |
US4772486A (en) * | 1985-02-18 | 1988-09-20 | Canon Kabushiki Kaisha | Process for forming a deposited film |
US4778692A (en) * | 1985-02-20 | 1988-10-18 | Canon Kabushiki Kaisha | Process for forming deposited film |
FR2578095B1 (fr) * | 1985-02-28 | 1988-04-15 | Avitaya Francois D | Procede et dispositif de depot par croissance epitaxiale d'un materiau dope |
JPS6291494A (ja) * | 1985-10-16 | 1987-04-25 | Res Dev Corp Of Japan | 化合物半導体単結晶成長方法及び装置 |
JPS62140485A (ja) * | 1985-12-16 | 1987-06-24 | Hitachi Ltd | 半導体構造体およびその製造方法 |
US4918028A (en) * | 1986-04-14 | 1990-04-17 | Canon Kabushiki Kaisha | Process for photo-assisted epitaxial growth using remote plasma with in-situ etching |
JPH0821552B2 (ja) * | 1986-05-12 | 1996-03-04 | ソニー株式会社 | 不純物ド−ピング法 |
JPS6328030A (ja) * | 1986-07-21 | 1988-02-05 | Seiko Epson Corp | 化合物半導体の結晶成長方法 |
JP2587623B2 (ja) * | 1986-11-22 | 1997-03-05 | 新技術事業団 | 化合物半導体のエピタキシヤル結晶成長方法 |
US4885260A (en) * | 1987-02-17 | 1989-12-05 | Matsushita Electric Industrial Co., Ltd. | Method of laser enhanced vapor phase growth for compound semiconductor |
US4843031A (en) * | 1987-03-17 | 1989-06-27 | Matsushita Electric Industrial Co., Ltd. | Method of fabricating compound semiconductor laser using selective irradiation |
GB2204066A (en) * | 1987-04-06 | 1988-11-02 | Philips Electronic Associated | A method for manufacturing a semiconductor device having a layered structure |
JPH073909B2 (ja) * | 1987-09-08 | 1995-01-18 | 三菱電機株式会社 | 半導体レーザの製造方法 |
JPH01198482A (ja) * | 1988-02-01 | 1989-08-10 | Canon Inc | マイクロ波プラズマcvd法による堆積膜形成法 |
GB8806800D0 (en) * | 1988-03-22 | 1988-04-20 | British Telecomm | Etching methods |
-
1989
- 1989-03-30 JP JP1080482A patent/JPH02260417A/ja active Pending
- 1989-12-01 DE DE68921607T patent/DE68921607T2/de not_active Expired - Fee Related
- 1989-12-01 EP EP89312538A patent/EP0389718B1/de not_active Expired - Lifetime
- 1989-12-27 US US07/457,525 patent/US5061643A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH02260417A (ja) | 1990-10-23 |
EP0389718A2 (de) | 1990-10-03 |
US5061643A (en) | 1991-10-29 |
EP0389718B1 (de) | 1995-03-08 |
EP0389718A3 (de) | 1991-08-07 |
DE68921607T2 (de) | 1995-07-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8320 | Willingness to grant licences declared (paragraph 23) | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |