DE68902904D1 - QUALITY CONTROL IN WIRE BINDING. - Google Patents
QUALITY CONTROL IN WIRE BINDING.Info
- Publication number
- DE68902904D1 DE68902904D1 DE8989311229T DE68902904T DE68902904D1 DE 68902904 D1 DE68902904 D1 DE 68902904D1 DE 8989311229 T DE8989311229 T DE 8989311229T DE 68902904 T DE68902904 T DE 68902904T DE 68902904 D1 DE68902904 D1 DE 68902904D1
- Authority
- DE
- Germany
- Prior art keywords
- wire
- bonding
- drawn
- automatic
- bond
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Revoked
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
- B23K31/125—Weld quality monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/4847—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78313—Wedge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/786—Means for supplying the connector to be connected in the bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/851—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/852—Applying energy for connecting
- H01L2224/85201—Compression bonding
- H01L2224/85205—Ultrasonic bonding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/859—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20751—Diameter ranges larger or equal to 10 microns less than 20 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20752—Diameter ranges larger or equal to 20 microns less than 30 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20753—Diameter ranges larger or equal to 30 microns less than 40 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20754—Diameter ranges larger or equal to 40 microns less than 50 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20755—Diameter ranges larger or equal to 50 microns less than 60 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20756—Diameter ranges larger or equal to 60 microns less than 70 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20757—Diameter ranges larger or equal to 70 microns less than 80 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20758—Diameter ranges larger or equal to 80 microns less than 90 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20759—Diameter ranges larger or equal to 90 microns less than 100 microns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/2076—Diameter ranges equal to or larger than 100 microns
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Quality & Reliability (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
Abstract
An automatic wire bonding apparatus, for wedge-bonding using aluminium wire, comprises a bonding head comprising a bonding tool mounted on an ultrasonic transducer, a bonding tip of the tool being arranged, in the operation of the machine, to press aluminium wire against the contact surface of an electronic or electrical component, the wire being drawn from a suitable wire supply, and a wire clamp by which the wire drawn from the wire supply may be clamped, the wire clamp being movable backward and forward generally in the direction in which the wire is fed appropriately to position the free end of wire drawn from the spool after completion of a bonding operation. The automatic wire-bonding apparatus further comprises means for monitoring, during bonding, the quality of the bond formed between the wire and the surface to which it is to be bonded, by identifying those bonds which do not fall within predetermined maximum and minimum values for deformation of the wire due to ultrasonic excitation. By using the automatic wire bonding apparatus described, the time during which ultrasonic energy is transmitted to the bond is minimised, thus maximising the throughput of the machine, and wastage due to unsatisfactory bond formation is reduced.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB888826488A GB8826488D0 (en) | 1988-11-11 | 1988-11-11 | Quality control for wire bonding |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68902904D1 true DE68902904D1 (en) | 1992-10-22 |
DE68902904T2 DE68902904T2 (en) | 1993-03-11 |
Family
ID=10646748
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8989311229T Revoked DE68902904T2 (en) | 1988-11-11 | 1989-10-31 | QUALITY CONTROL IN WIRE BINDING. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4984730A (en) |
EP (1) | EP0368533B1 (en) |
JP (1) | JPH02187286A (en) |
DE (1) | DE68902904T2 (en) |
GB (1) | GB8826488D0 (en) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04332145A (en) * | 1991-05-07 | 1992-11-19 | Shinkawa Ltd | Wire bonding device |
DE69216761T2 (en) * | 1991-10-30 | 1997-07-03 | F & K Delvotev Bondtechgmbh | Control system |
US5240165A (en) * | 1992-07-06 | 1993-08-31 | Motorola, Inc. | Method and apparatus for controlled deformation bonding |
DE4447073C1 (en) * | 1994-12-29 | 1996-07-18 | Bosch Gmbh Robert | Method for testing connections made by ultrasonic wire bonding |
WO1999019107A1 (en) * | 1997-10-13 | 1999-04-22 | Hesse & Knipps Gmbh | Quality control method |
US6237833B1 (en) * | 1998-06-15 | 2001-05-29 | Rohm Co., Ltd. | Method of checking wirebond condition |
US6425514B1 (en) | 1999-11-10 | 2002-07-30 | Asm Technology Singapore Pte Ltd | Force sensing apparatus |
US6568581B2 (en) * | 2001-03-15 | 2003-05-27 | Asm Technology Singapore Pte. Ltd. | Detection of wire bonding failures |
US6644533B2 (en) | 2001-07-03 | 2003-11-11 | Asm Technology Singapore Pte. Ltd. | Force sensing apparatus |
ATE338603T1 (en) | 2001-11-07 | 2006-09-15 | F & K Delvotec Bondtech Gmbh | TESTING PROCEDURES FOR BONDING CONNECTIONS AND WIRE BONDERS |
EP1343201A1 (en) | 2002-03-08 | 2003-09-10 | F & K Delvotec Bondtechnik GmbH | Method and apparatus for manufacture and quality control of a wire bond |
US20040060639A1 (en) * | 2002-08-13 | 2004-04-01 | Dawn White | Method of apparatus for ensuring uniform build quality during object consolidation |
DE102004022509A1 (en) * | 2004-01-07 | 2005-08-25 | Stapla Ultraschall-Technik Gmbh | Consolidating and sealing a tube between a sonotrode and the anvil of an ultrasonic welder where the sonotrode is activated and displaced relative to a counter electrode useful for automatic consolidation and sealing of tubes |
JP4625892B2 (en) * | 2004-06-11 | 2011-02-02 | 日産自動車株式会社 | Ultrasonic bonding method and apparatus |
DE102005012992B4 (en) * | 2005-03-21 | 2014-01-02 | Infineon Technologies Ag | Method, bonding device and system for bonding a semiconductor element |
US7845542B2 (en) * | 2005-09-22 | 2010-12-07 | Palomar Technologies, Inc. | Monitoring deformation and time to logically constrain a bonding process |
EP1897648B1 (en) | 2006-09-05 | 2010-06-30 | Technische Universität Berlin | Method and device for controlling the generation of ultrasonic wire bonds |
DE102007054626A1 (en) | 2007-11-12 | 2009-05-14 | Hesse & Knipps Gmbh | Method and apparatus for ultrasonic bonding |
DE102008017495B8 (en) * | 2008-04-04 | 2015-01-15 | Rolls-Royce Deutschland Ltd & Co Kg | Method of making or repairing integrally bladed rotors |
DE102008020624A1 (en) * | 2008-04-24 | 2009-10-29 | Rolls-Royce Deutschland Ltd & Co Kg | Process for the production of turbine or compressor rotors for gas turbine engines |
KR101620351B1 (en) * | 2012-01-30 | 2016-05-12 | 삼성전자주식회사 | Wire bonding method of electric element |
US9876487B2 (en) | 2013-09-27 | 2018-01-23 | International Business Machines Corporation | Contactless readable programmable transponder to monitor chip join |
JP6575161B2 (en) * | 2015-06-16 | 2019-09-18 | 富士電機株式会社 | Pass / fail judgment device, wire bonder device, and pass / fail judgment method |
DE102017101736A1 (en) * | 2017-01-30 | 2018-08-02 | F&K Delvotec Bondtechnik Gmbh | Method of making wire bonds and device for carrying out the method |
US10658328B2 (en) * | 2017-11-09 | 2020-05-19 | Asm Technology Singapore Pte Ltd | Detection of foreign particles during wire bonding |
JP6905778B2 (en) * | 2018-08-06 | 2021-07-21 | 株式会社新川 | Bonding head |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3734382A (en) * | 1972-04-03 | 1973-05-22 | Motorola Inc | Apparatus for control of welding apparatus |
GB1506164A (en) * | 1974-07-09 | 1978-04-05 | Mullard Ltd | Ultrasonic bonding apparatus |
JPS609664B2 (en) * | 1978-05-17 | 1985-03-12 | 株式会社日立製作所 | sonic wire bonder |
JPS55124240A (en) * | 1979-03-20 | 1980-09-25 | Nec Corp | Wire bonding device |
JPS58184734A (en) * | 1982-04-22 | 1983-10-28 | Toshiba Corp | Wire bonding device |
US4746051A (en) * | 1982-12-08 | 1988-05-24 | General Motors Corporation | Ultrasonic welding control |
SU1109292A1 (en) * | 1983-04-27 | 1984-08-23 | Предприятие П/Я Р-6495 | Device for adjusting value of conductor deformation when welding |
DE3343738C2 (en) * | 1983-12-02 | 1985-09-26 | Deubzer-Eltec GmbH, 8000 München | Method and device for bonding a thin, electrically conductive wire to electrical contact surfaces of electrical or electronic components |
JPH0744197B2 (en) * | 1985-03-19 | 1995-05-15 | 株式会社東芝 | Bonding device |
DE3667930D1 (en) * | 1985-07-12 | 1990-02-08 | Siemens Ag | METHOD FOR CONTROLLING THE PROCESS AND FOR QUALITY CONTROL IN ULTRASONIC WELDING OF WORKPIECES. |
JPS62123728A (en) * | 1985-11-25 | 1987-06-05 | Hitachi Ltd | Wire bonding method and device therefor |
JPS63194343A (en) * | 1987-02-09 | 1988-08-11 | Toshiba Corp | Method of controlling wire bonding apparatus |
-
1988
- 1988-11-11 GB GB888826488A patent/GB8826488D0/en active Pending
-
1989
- 1989-10-31 EP EP89311229A patent/EP0368533B1/en not_active Expired - Lifetime
- 1989-10-31 DE DE8989311229T patent/DE68902904T2/en not_active Revoked
- 1989-11-03 US US07/432,092 patent/US4984730A/en not_active Expired - Fee Related
- 1989-11-13 JP JP1294761A patent/JPH02187286A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
GB8826488D0 (en) | 1988-12-14 |
JPH02187286A (en) | 1990-07-23 |
US4984730A (en) | 1991-01-15 |
DE68902904T2 (en) | 1993-03-11 |
EP0368533A3 (en) | 1990-06-13 |
EP0368533B1 (en) | 1992-09-16 |
EP0368533A2 (en) | 1990-05-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE68902904D1 (en) | QUALITY CONTROL IN WIRE BINDING. | |
EP0540189B1 (en) | Control system | |
US3934783A (en) | Multiface wire bonding method and tool | |
EP0406351B1 (en) | Ultrasonic laser soldering | |
US3891819A (en) | Automatic set-up electroerosion machining method | |
GB1363042A (en) | Tailless wedge bonding of gold wire to palladium-silver cermets | |
JPS60206036A (en) | Variation and control of bonding force | |
US3718799A (en) | Apparatus for electrically bonding cemented carbide elements to the teeth of a saw blade | |
US3610506A (en) | Method for ultrasonically welding using a varying welding force | |
US4597520A (en) | Bonding method and means | |
Gobel et al. | Quality control for wire bonding | |
CN115740254A (en) | Roll material feeding equipment for punch press | |
EP0494510A2 (en) | Bonding head | |
JPH0774201A (en) | Supervising device of wire supply and comsumption | |
JPH0617291Y2 (en) | Wire-bonding equipment | |
GB2270868A (en) | Wire bonding control system. | |
JP2761922B2 (en) | Wire bonding method and apparatus | |
JPH02250342A (en) | Inner-lead bonding apparatus | |
JPS5925377B2 (en) | Wire bonding method | |
JPWO2022130617A5 (en) | ||
JP2550729Y2 (en) | Wire supply device and wire bonding device having the same | |
JPH0110929Y2 (en) | ||
JPS58148432A (en) | Wire bonding | |
JP2517005B2 (en) | Wire bonding tools | |
GB1398956A (en) | Ultrasonic bond controlling method and apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8363 | Opposition against the patent | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: F & K DELVOTEC BONDTECHNIK GMBH, 82041 OBERHACHING |
|
8331 | Complete revocation |