DE682931C - Method for measuring the X-ray hardness with short exposure times - Google Patents
Method for measuring the X-ray hardness with short exposure timesInfo
- Publication number
- DE682931C DE682931C DEI52583D DEI0052583D DE682931C DE 682931 C DE682931 C DE 682931C DE I52583 D DEI52583 D DE I52583D DE I0052583 D DEI0052583 D DE I0052583D DE 682931 C DE682931 C DE 682931C
- Authority
- DE
- Germany
- Prior art keywords
- hardness
- rays
- measuring
- exposure times
- short exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Description
Verfahren zur Messung der Röntgenstrahlenhärte bei kurzen Belichtungszeiten Gegenstand der Erfindung ist ein Verfahren zur Messung der Härte von Röntgenstrahlen bei Anwendung kurzer Belichtungszeiten. Es ist bereits in der Rötgentechnik bekannt, für Spannungs- und Hartemessungen Voltmeter zu benutzern, die an der Primärspule des Röntgenhochspannungstransformators liegen und in kVmaX bzw. kVefs gewicht sind. Bei diesen Instrumenten sind die sekundärseitigen Spannungsabfällen, die bei höheren Belastungen von Röntgenröhren auftreten, in keiner Weise berücksichtigt. Es ist also hiermit nicht möglich, die Härte der Strahlen unter Berücksichtigung der jeweiligen Spannungsabfälle bei verschiedenen Stromstärken zu messen.Method for measuring the X-ray hardness with short exposure times The invention relates to a method for measuring the hardness of X-rays when using short exposure times. It is already known in x-ray technology for voltage and hardness measurements use a voltmeter attached to the primary coil of the X-ray high-voltage transformer and are weighted in kVmax or kVefs. With these instruments, the voltage drops on the secondary side are the ones with higher Stresses from X-ray tubes occur in no way taken into account. It is So hereby not possible to adjust the hardness of the rays taking into account the respective Measure voltage drops at different currents.
Es ist auch bekannt, zur Härtemessung einen Fluoreszenzschirm mit den zu untersuchenden Röntgenstrahlen zu erregen und das ausgesandte Licht des Schirmes mit Hilfe von Selenwiderstandszellen zu messen. Solche Widerstandszellen haben jedoch den großen Nachteil, Idaß sie sehr bald Ermüdungserscheinungen zeigen, die das Meßergebnis fälschen. It is also known to use a fluorescent screen for hardness measurement to excite the X-rays to be examined and the light emitted by the screen to measure with the help of selenium resistance cells. However, such resistance cells have the great disadvantage, that they very soon show signs of fatigue, which affects the measurement result counterfeit.
Außerdem arbeiten diese Zellen verhaltnismäßig trage, so daß sich solche Vorrichtun gen für kurze Expositionen nicht eignen.In addition, these cells work relatively sluggishly, so that themselves Such devices are not suitable for short exposures.
Ein weiterer Nachteil besteht darin, daß eine besondere Stromquelle zur Speisung der Seienzelle erforderlich ist.Another disadvantage is that a special power source is required to feed the seien cell.
Ferner ist es bekannt, Röntgenstrahlen auf eine Ionisationskammer einwirken zu lassen und die Spannungsänderung mit Hilfe eines Galvanometers zu messen. Solche Ionisationskammern sind jedoch zu unempfindlich, um so kleine Röntgenstrahlendosen anzuzeigen, wie sie bei Kurzexpositionen auftreten. Außerdem erfordern die Ionisationskammern, verhältnismäßig komplizierte Anordnungen. It is also known to use X-rays on an ionization chamber to act and to measure the voltage change with the help of a galvanometer. Such ionization chambers are, however, too insensitive to such small x-ray doses indicate how they occur during brief exposures. In addition, the ionization chambers require relatively complicated arrangements.
Erfindungsgemäß läßt man die Rlöntgenstrahlen nach Durchgang durch Metall stufen verschiedener Dicke auf einen Fluoreszenzschirm einwirken und vergleicht die Lichtintensitäten mit Hilfe zweier lichtelektrischer Zellen, die zwei Galvanometer betätigen. Die bleiden lichtelektrischen Zellen und die b'eiden Leuchtschirme, vor denen sich im Strahlengang der Röntgenstrahlen verschieden dichte Metallstufen z. B. aus Aluminium befinden, werden nebeneinander angeordnet und die verschiedenen Ausschläge der Galvanometer photographisch registriert. Aus dem Verhältnis der beiden registrierten Lichtintensitäten wird die Härte der Strahlen bestimmt. According to the invention, the X-rays are allowed to pass through after they have passed Metal levels of different thickness act on a fluorescent screen and compare the light intensities with the help of two photoelectric cells, the two galvanometers actuate. The lead photoelectric cells and the two luminescent screens are in front which in the beam path of the X-rays differently dense metal steps z. B. made of aluminum are placed side by side and the various The galvanometer deflections recorded photographically. From the relationship between the two Registered light intensities determine the hardness of the rays.
Die Belichtungszeiten betragen praktisch nur einige hundertstel Sekunden. Da die lichtelektrischen Zellen, insbesondere die Sperrschichtzellen und Vakuumzellen, proportional der auftretenden Lichtintensität arbeiten, genügen die Relativwerte der Galvanometerausschläge.The exposure times are practically only a few hundredths of a second. Since the photoelectric cells, especially the junction cells and vacuum cells, work proportionally to the occurring light intensity, the relative values are sufficient the galvanometer deflections.
In der Abbildung ist eine Ausbildungsform eines solchen Härtemessers schematisch dargestellt. Darin bedeuten I und 2 die lichtelektrischen Zellen der Meßgeräte, 3 und 4 die Leuchtschrime, die in einem dem gen Zweck angepaßten Abstand hinter der lichtelektrischen Zelle angeordnet sind, 5 und 6 die elektrischen Meßinstrument 7 un 7 die verschieden dicken Metallstufen, 9 die Röntgeröhre, deren Strahlungsbärte gemessen werden soll. The illustration shows one embodiment of such a hardness meter shown schematically. I and 2 mean the photoelectric Cells the measuring devices, 3 and 4 the neon screens, which are adapted to the purpose Distance behind the photoelectric cell are arranged, 5 and 6 the electrical Measuring instrument 7 and 7 the metal steps of different thicknesses, 9 the X-ray tube, their Radiation beards should be measured.
Die Verbindung des Meßinstruments mit der photographischen Registreiervorrichtung ist hier nicht besonders angegeblen. The connection of the measuring instrument with the photographic registration device is not particularly indicated here.
Das elektrische Meßinstrument kann in beliebiger Schaltung mit der Photozelle verbunden sein. Vorteilhafterweise wird man das Strommeßinstrument in Kompensation oder Brückenschaltung mit der lichtelektrischen Zelle legen. Das Instrument dient in diesem Falle als sog. Nullinstrument. Als Leuchtfolien kommen sowohl gelbe wie blaue oder anders strahlende Leuchtschieme in Frage. The electrical measuring instrument can be used in any circuit with the Photocell connected. The current measuring instrument is advantageously shown in Lay compensation or bridge circuit with the photoelectric cell. The instrument in this case serves as a so-called zero instrument. Both yellow ones are used as luminescent foils like blue or differently shining light strips in question.
Zur Vermeidung von Ermüdungserscheinungen der lichtelektrischen Zellen durch die Einwirkung von Röntgenstrahlen und um Photoströme, die direkt von Röntgenstrahlen in den Zellen hervorgerufen werden auszuschließen, ist es von Vorteil, zwischen lichtelektrischer Zeile und Leuchtschirm noch Bleiglas als Filter anzubringen, das die Zelle vor der Einwirkung der Röntgenstrahlen Das neue Verfahren läßt sich nicht nur in der medizinischen Rötgentechnik, sondern auch bei Metalluntersuchungen mit Hilfe von Röntgenstrahlen anwenden. To avoid signs of fatigue in the photoelectric cells by exposure to X-rays and to photocurrents generated directly by X-rays to exclude are evoked in the cells, it is beneficial between photoelectric line and luminescent screen to attach lead glass as a filter the cell before the action of the X-rays The new procedure does not work only in medical x-ray technology, but also in metal examinations Apply the help of X-rays.
Claims (2)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEI52583D DE682931C (en) | 1935-06-20 | 1935-06-20 | Method for measuring the X-ray hardness with short exposure times |
GB17082/36A GB482354A (en) | 1935-06-20 | 1936-06-19 | Apparatus for measuring roentgen rays |
FR807433D FR807433A (en) | 1935-06-20 | 1936-06-20 | Device for measuring roentgen rays |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEI52583D DE682931C (en) | 1935-06-20 | 1935-06-20 | Method for measuring the X-ray hardness with short exposure times |
Publications (1)
Publication Number | Publication Date |
---|---|
DE682931C true DE682931C (en) | 1939-10-25 |
Family
ID=7193382
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DEI52583D Expired DE682931C (en) | 1935-06-20 | 1935-06-20 | Method for measuring the X-ray hardness with short exposure times |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE682931C (en) |
FR (1) | FR807433A (en) |
GB (1) | GB482354A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2688702A (en) * | 1944-11-01 | 1954-09-07 | X Ray Electronic Corp | X-ray testing and measuring method and apparatus |
US2666856A (en) * | 1946-10-08 | 1954-01-19 | X Ray Electronic Corp | X-ray fluorescent response intensifier |
US2485418A (en) * | 1947-05-28 | 1949-10-18 | Gen Electric | Meter for measurement of ultraviolet radiation |
US2557868A (en) * | 1948-03-12 | 1951-06-19 | X Ray Electronic Corp | Measuring and testing methods and apparatus employing x-rays |
US2582981A (en) * | 1949-06-16 | 1952-01-22 | Fua Frederic Albert | Method and apparatus for the employment of radiation from radioactive material in gauging |
-
1935
- 1935-06-20 DE DEI52583D patent/DE682931C/en not_active Expired
-
1936
- 1936-06-19 GB GB17082/36A patent/GB482354A/en not_active Expired
- 1936-06-20 FR FR807433D patent/FR807433A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR807433A (en) | 1937-01-12 |
GB482354A (en) | 1938-03-28 |
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