DE60321677D1 - Vorrichtung und verfahren zur dickenkontrolle von lackierungen mithilfe einer optoakustischen technik - Google Patents

Vorrichtung und verfahren zur dickenkontrolle von lackierungen mithilfe einer optoakustischen technik

Info

Publication number
DE60321677D1
DE60321677D1 DE60321677T DE60321677T DE60321677D1 DE 60321677 D1 DE60321677 D1 DE 60321677D1 DE 60321677 T DE60321677 T DE 60321677T DE 60321677 T DE60321677 T DE 60321677T DE 60321677 D1 DE60321677 D1 DE 60321677D1
Authority
DE
Germany
Prior art keywords
optoautical
paintings
technique
thickness control
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60321677T
Other languages
English (en)
Inventor
Thomas E Drake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lockheed Martin Corp
Original Assignee
Lockheed Corp
Lockheed Martin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp, Lockheed Martin Corp filed Critical Lockheed Corp
Application granted granted Critical
Publication of DE60321677D1 publication Critical patent/DE60321677D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4418—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a model, e.g. best-fit, regression analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0666—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using an exciting beam and a detection beam including surface acoustic waves [SAW]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G01B17/025—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/22—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/22—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects
    • G01K11/26—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects of resonant frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/32—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/32—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise
    • G01N29/326—Arrangements for suppressing undesired influences, e.g. temperature or pressure variations, compensating for signal noise compensating for temperature variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4454—Signal recognition, e.g. specific values or portions, signal events, signatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/50—Processing the detected response signal, e.g. electronic circuits specially adapted therefor using auto-correlation techniques or cross-correlation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1917—Control of temperature characterised by the use of electric means using digital means
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/27—Control of temperature characterised by the use of electric means with sensing element responsive to radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0231—Composite or layered materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0237—Thin materials, e.g. paper, membranes, thin films
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02827—Elastic parameters, strength or force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02881—Temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0426—Bulk waves, e.g. quartz crystal microbalance, torsional waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/26—Oils; Viscous liquids; Paints; Inks
    • G01N33/32—Paints; Inks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
DE60321677T 2002-05-09 2003-04-29 Vorrichtung und verfahren zur dickenkontrolle von lackierungen mithilfe einer optoakustischen technik Expired - Lifetime DE60321677D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/142,071 US7342665B2 (en) 1998-06-30 2002-05-09 System and method for control of paint thickness
PCT/US2003/013244 WO2003095942A2 (en) 2002-05-09 2003-04-29 System and method for control of paint thickness by using an optoacoustic technique

Publications (1)

Publication Number Publication Date
DE60321677D1 true DE60321677D1 (de) 2008-07-31

Family

ID=29418420

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60321677T Expired - Lifetime DE60321677D1 (de) 2002-05-09 2003-04-29 Vorrichtung und verfahren zur dickenkontrolle von lackierungen mithilfe einer optoakustischen technik

Country Status (5)

Country Link
US (1) US7342665B2 (de)
EP (1) EP1506370B1 (de)
AU (1) AU2003228747A1 (de)
DE (1) DE60321677D1 (de)
WO (1) WO2003095942A2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7561281B2 (en) * 1998-06-30 2009-07-14 Lockheed Martin Corporation System and method for controlling tube thickness
JP5254612B2 (ja) * 2004-05-21 2013-08-07 プレスコ テクノロジー インコーポレーテッド グラフィック再検査ユーザ設定インタフェース
DE102006025756A1 (de) * 2006-05-31 2007-12-06 Somalingam, Somakanthan, Dr. Ultraschall-Diagnose Einrichtung
DE102007030566A1 (de) * 2007-03-28 2008-10-02 Man Roland Druckmaschinen Ag Zerstörungsfreie Prüfverfahren der Aushärtungs- oder Trocknungsgrades von Farben und Lacken
GB0724366D0 (en) * 2007-12-14 2008-01-23 Univ York Environment modelling
US8243280B2 (en) * 2008-05-20 2012-08-14 Iphoton Solutions, Llc Laser ultrasonic measurement system with movable beam delivery
WO2012019189A2 (en) 2010-08-06 2012-02-09 Par Systems, Inc. Containerized systems
KR102069500B1 (ko) 2013-12-10 2020-01-23 한국전자통신연구원 파장선택형 도막 두께 측정 장치
CN104990980A (zh) * 2015-06-19 2015-10-21 西安理工大学 一种基于超声导波的钢轨损伤判断方法
GB2545271A (en) * 2015-12-11 2017-06-14 Airbus Operations Ltd Determining physical characteristics of a structure
GB2545704A (en) 2015-12-22 2017-06-28 Univ Sheffield Continuous wave ultrasound for analysis of a surface
CN106525971A (zh) * 2016-11-16 2017-03-22 西安理工大学 便携式自动超声波无损探伤定位仪及其检测轨道的方法
US11022429B2 (en) * 2017-12-18 2021-06-01 Triad National Security, Llc Method for real-time inspection of structural components
US10323932B1 (en) 2017-12-28 2019-06-18 Ford Motor Company System for inspecting vehicle bodies
US11692930B2 (en) 2019-08-06 2023-07-04 Triad National Security, Llc Standoff inspection using geometry-informed full-wavefield response measurements

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992627A (en) 1973-01-06 1976-11-16 Rolls-Royce (1971) Limited Diagnostic apparatus
US3911733A (en) 1974-04-01 1975-10-14 Trw Inc Optical signature method and apparatus for structural integrity verification
FR2402956A1 (fr) * 1977-09-08 1979-04-06 Comp Generale Electricite Chaine d'amplification laser
US4349112A (en) 1980-03-31 1982-09-14 The United States Of America As Represented By The United States Department Of Energy Pellet inspection apparatus
US4393711A (en) 1980-11-13 1983-07-19 Electric Power Research Institute, Inc. Apparatus and method for ultrasonic detection of flaws in power plant piping systems
JPS5892811A (ja) 1980-12-08 1983-06-02 Teitsuu Denshi Kenkyusho:Kk 超音波式厚さ測定方法
US4355538A (en) 1981-02-26 1982-10-26 Chromalloy American Corporation Exo-electron non-destructive test device and method
US4422177A (en) 1982-06-16 1983-12-20 American Science And Engineering, Inc. CT Slice proximity rotary table and elevator for examining large objects
CA1224935A (en) 1984-11-28 1987-08-04 Her Majesty The Queen, In Right Of Canada, As Represented By The Ministe R Of The National Research Council And The Minister Of Energy, Mines And Resources Optical interferometric reception of ultrasonic energy
US4809308A (en) 1986-02-20 1989-02-28 Irt Corporation Method and apparatus for performing automated circuit board solder quality inspections
US4803639A (en) 1986-02-25 1989-02-07 General Electric Company X-ray inspection system
US4841460A (en) 1987-09-08 1989-06-20 Perceptron, Inc. Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
FR2644886B1 (fr) 1989-03-24 1993-12-10 Celette Sa Dispositif de controle de la position de differents points d'un vehicule
US5295073A (en) 1989-03-24 1994-03-15 Celette S.A. Device for checking the position of various points of a vehicle
US5014293A (en) 1989-10-04 1991-05-07 Imatron, Inc. Computerized tomographic x-ray scanner system and gantry assembly
US5065630A (en) 1990-06-12 1991-11-19 Grumman Aerospace Corporation Integrated system for aircraft crack detection
US5113079A (en) 1990-09-05 1992-05-12 Matulka Robert D Non-destructive testing of aircraft for structural integrity using holographic moire patterns
US5122672A (en) 1990-09-07 1992-06-16 Ford Motor Company Surface quality analyzer apparatus and method
US5119408A (en) 1990-10-31 1992-06-02 General Electric Company Rotate/rotate method and apparatus for computed tomography x-ray inspection of large objects
US5286313A (en) 1991-10-31 1994-02-15 Surface Combustion, Inc. Process control system using polarizing interferometer
US5384717A (en) 1992-11-23 1995-01-24 Ford Motor Company Non-contact method of obtaining dimensional information about an object
US5319567A (en) 1992-11-23 1994-06-07 Ford Motor Company Non-contact method of obtaining dimensional information about a reference feature of an object
US5442572A (en) 1992-11-23 1995-08-15 Ford Motor Company Method and system for comparing free-form geometries using high density point data models
US5552984A (en) 1993-09-16 1996-09-03 Trw Inc. Diagnostic system for complex systems using virtual components
US5541856A (en) 1993-11-08 1996-07-30 Imaging Systems International X-ray inspection system
US5490195A (en) 1994-05-18 1996-02-06 Fatigue Management Associates Llc Method for measuring and extending the service life of fatigue-limited metal components
US5672830A (en) 1994-10-04 1997-09-30 Massachusetts Institute Of Technology Measuring anisotropic mechanical properties of thin films
US5637812A (en) 1994-11-14 1997-06-10 Screening Systems, Inc. Variable volume test chamber
US5574226A (en) 1995-04-06 1996-11-12 Ford Motor Company Transportable environmental test facility
US5846115A (en) * 1995-12-22 1998-12-08 Feng; Pan-Chang Pao Animated stuffed toy
US5724138A (en) * 1996-04-18 1998-03-03 Textron Systems Corporation Wavelet analysis for laser ultrasonic measurement of material properties
WO1998022814A1 (en) 1996-11-22 1998-05-28 Autospect, Inc. Method and system for processing measurement signals to obtain a value for a physical parameter
US6128081A (en) * 1996-11-22 2000-10-03 Perceptron, Inc. Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use therein
US6175415B1 (en) 1997-02-19 2001-01-16 United Technologies Corporation Optical profile sensor
US5848115A (en) 1997-05-02 1998-12-08 General Electric Company Computed tomography metrology
US6065348A (en) 1998-06-04 2000-05-23 Profile Technologies, Inc. Method of detecting corrosion in pipelines and the like by comparative pulse propagation analysis
US6016202A (en) * 1997-06-30 2000-01-18 U.S. Philips Corporation Method and apparatus for measuring material properties using transient-grating spectroscopy
US5982482A (en) 1997-07-31 1999-11-09 Massachusetts Institute Of Technology Determining the presence of defects in thin film structures
US6047041A (en) 1997-09-08 2000-04-04 Scientific Measurement System Apparatus and method for comparison
US6220099B1 (en) 1998-02-17 2001-04-24 Ce Nuclear Power Llc Apparatus and method for performing non-destructive inspections of large area aircraft structures
FI116075B (fi) 1998-02-23 2005-09-15 Metso Paper Inc Paperikoneen säätöjärjestelmä
US6108087A (en) 1998-02-24 2000-08-22 Kla-Tencor Corporation Non-contact system for measuring film thickness
US6023985A (en) 1998-03-16 2000-02-15 Hewlett-Packard Company Controller for an environmental test chamber
US6122060A (en) * 1998-06-30 2000-09-19 Lockheed Martin Corporation Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
US6571008B1 (en) 1998-08-07 2003-05-27 Washington State University Research Foundation Reverse engineering of polymeric solid models by refractive index matching
US6078397A (en) 1999-04-20 2000-06-20 National Research Council Method and apparatus for mapping the wall thickness of tubes during production
US6360621B1 (en) 1999-06-25 2002-03-26 Venturedyne, Ltd. Environmental testing chamber
US6466643B1 (en) 2000-01-07 2002-10-15 General Electric Company High speed digital radiographic inspection of aircraft fuselages
US6378387B1 (en) 2000-08-25 2002-04-30 Aerobotics, Inc. Non-destructive inspection, testing and evaluation system for intact aircraft and components and method therefore

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US7342665B2 (en) 2008-03-11
EP1506370B1 (de) 2008-06-18
AU2003228747A1 (en) 2003-11-11
EP1506370A2 (de) 2005-02-16
US20020186379A1 (en) 2002-12-12

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