DE60317049D1 - Verfahren zum nachweis der auswirkungen von störeffekten auf messdaten - Google Patents

Verfahren zum nachweis der auswirkungen von störeffekten auf messdaten

Info

Publication number
DE60317049D1
DE60317049D1 DE60317049T DE60317049T DE60317049D1 DE 60317049 D1 DE60317049 D1 DE 60317049D1 DE 60317049 T DE60317049 T DE 60317049T DE 60317049 T DE60317049 T DE 60317049T DE 60317049 D1 DE60317049 D1 DE 60317049D1
Authority
DE
Germany
Prior art keywords
data
interference
impact
detecting
impacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60317049T
Other languages
English (en)
Other versions
DE60317049T2 (de
Inventor
Christian Eggeling
Kaupo Palo
Nicolas Fay
Maciej Hoffman-Wecker
Pierre Ilouga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Evotec OAI AG
Original Assignee
Evotec OAI AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Evotec OAI AG filed Critical Evotec OAI AG
Publication of DE60317049D1 publication Critical patent/DE60317049D1/de
Application granted granted Critical
Publication of DE60317049T2 publication Critical patent/DE60317049T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N2021/6432—Quenching

Landscapes

  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DE60317049T 2002-03-04 2003-03-04 Verfahren zum nachweis der auswirkungen von störeffekten auf messdaten Expired - Lifetime DE60317049T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP02004899 2002-03-04
EP02004899A EP1343001A1 (de) 2002-03-04 2002-03-04 Verfahren zur Identifizierung der Auswirkungen von Störeffekten auf sekundäre Lichtemissionsdaten
PCT/EP2003/002206 WO2003074994A2 (en) 2002-03-04 2003-03-04 A method for detecting the impacts of interfering effects on experimental data

Publications (2)

Publication Number Publication Date
DE60317049D1 true DE60317049D1 (de) 2007-12-06
DE60317049T2 DE60317049T2 (de) 2008-07-31

Family

ID=27741125

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60317049T Expired - Lifetime DE60317049T2 (de) 2002-03-04 2003-03-04 Verfahren zum nachweis der auswirkungen von störeffekten auf messdaten

Country Status (5)

Country Link
EP (2) EP1343001A1 (de)
AT (1) ATE376668T1 (de)
AU (1) AU2003212303A1 (de)
DE (1) DE60317049T2 (de)
WO (1) WO2003074994A2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010047237B4 (de) 2010-08-13 2021-07-01 Leica Microsystems Cms Gmbh Verfahren zum Trennen von Detektionssignalen im Strahlengang einer optischen Einrichtung
EP3990186A4 (de) * 2019-06-27 2023-07-26 Emulate, Inc. Verteilung einer verbindung in mikrofluidischen vorrichtungen

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5733721A (en) * 1992-11-20 1998-03-31 The Board Of Regents Of The University Of Oklahoma Cell analysis method using quantitative fluorescence image analysis
US5757022A (en) * 1995-10-19 1998-05-26 Fuji Photo Film Co., Ltd. Image processing apparatus
GB9621122D0 (en) * 1996-10-10 1996-11-27 Cambridge Imaging Ltd Improvements in and relating to methods and apparatus for assay analysis
WO2001007896A1 (en) * 1999-07-21 2001-02-01 Tropix, Inc. Luminescence detection workstation

Also Published As

Publication number Publication date
EP1481236A2 (de) 2004-12-01
WO2003074994A2 (en) 2003-09-12
AU2003212303A1 (en) 2003-09-16
ATE376668T1 (de) 2007-11-15
EP1481236B1 (de) 2007-10-24
WO2003074994A3 (en) 2003-12-24
EP1343001A1 (de) 2003-09-10
DE60317049T2 (de) 2008-07-31

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DE60317049D1 (de) Verfahren zum nachweis der auswirkungen von störeffekten auf messdaten

Legal Events

Date Code Title Description
8364 No opposition during term of opposition