DE60237329D1 - Temperaturkompensierte Änderungsgeschwindigkeits-Steuerschaltung - Google Patents

Temperaturkompensierte Änderungsgeschwindigkeits-Steuerschaltung

Info

Publication number
DE60237329D1
DE60237329D1 DE60237329T DE60237329T DE60237329D1 DE 60237329 D1 DE60237329 D1 DE 60237329D1 DE 60237329 T DE60237329 T DE 60237329T DE 60237329 T DE60237329 T DE 60237329T DE 60237329 D1 DE60237329 D1 DE 60237329D1
Authority
DE
Germany
Prior art keywords
control circuit
change control
temperature compensated
compensated rate
rate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60237329T
Other languages
English (en)
Inventor
Steven J Tinsley
Julie A Hwang
Mark W Morgan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE60237329D1 publication Critical patent/DE60237329D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
  • Amplifiers (AREA)
DE60237329T 2001-03-27 2002-03-26 Temperaturkompensierte Änderungsgeschwindigkeits-Steuerschaltung Expired - Lifetime DE60237329D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/818,111 US6437622B1 (en) 2001-03-27 2001-03-27 Temperature compensated slew rate control circuit

Publications (1)

Publication Number Publication Date
DE60237329D1 true DE60237329D1 (de) 2010-09-30

Family

ID=25224696

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60237329T Expired - Lifetime DE60237329D1 (de) 2001-03-27 2002-03-26 Temperaturkompensierte Änderungsgeschwindigkeits-Steuerschaltung

Country Status (4)

Country Link
US (1) US6437622B1 (de)
EP (1) EP1246366B1 (de)
JP (1) JP2002353803A (de)
DE (1) DE60237329D1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6809568B2 (en) * 2002-03-12 2004-10-26 Delphi Technologies, Inc. Dynamic on chip slew rate control for MOS integrated drivers
US6903588B2 (en) * 2003-04-15 2005-06-07 Broadcom Corporation Slew rate controlled output buffer
US6756826B1 (en) * 2003-06-12 2004-06-29 Fairchild Semiconductor Corporation Method of reducing the propagation delay and process and temperature effects on a buffer
US7521975B2 (en) * 2005-01-20 2009-04-21 Advanced Micro Devices, Inc. Output buffer with slew rate control utilizing an inverse process dependent current reference
JP4876553B2 (ja) * 2005-11-30 2012-02-15 富士通セミコンダクター株式会社 出力回路
WO2007094790A1 (en) * 2006-02-16 2007-08-23 Agere Systems Inc. Systems and methods for reduction of cross coupling in proximate signal lines
US8350416B2 (en) * 2009-06-30 2013-01-08 Schanin David J Transition-rate control for phase-controlled AC power delivery system
CN102034540B (zh) * 2009-09-27 2013-09-18 上海宏力半导体制造有限公司 压摆率控制装置及其控制方法
US8373496B2 (en) 2010-07-08 2013-02-12 Texas Instruments Incorporated Temperature compensated current source
US10234881B1 (en) 2017-11-07 2019-03-19 Nxp B.V. Digitally-assisted capless voltage regulator
US10338619B2 (en) 2017-11-07 2019-07-02 Nxp B.V. Voltage regulator with performance compensation
US10181852B1 (en) 2018-06-19 2019-01-15 Nxp B.V. Voltage translator with output slew rate control
CN110091360B (zh) * 2019-05-07 2021-06-01 珠海市一微半导体有限公司 一种悬崖检测装置、移动机器人及检测控制方法
US11405037B2 (en) 2020-12-18 2022-08-02 Nxp B.V. Driver circuit of voltage translator
CN114978132B (zh) * 2022-08-01 2022-11-04 深圳芯能半导体技术有限公司 一种具有温度补偿功能的栅极驱动开启电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161916A (ja) * 1987-12-18 1989-06-26 Toshiba Corp 半導体集積回路
US5021684A (en) * 1989-11-09 1991-06-04 Intel Corporation Process, supply, temperature compensating CMOS output buffer
US5168178A (en) * 1991-08-30 1992-12-01 Intel Corporation High speed NOR'ing inverting, MUX'ing and latching circuit with temperature compensated output noise control
US5640122A (en) * 1994-12-16 1997-06-17 Sgs-Thomson Microelectronics, Inc. Circuit for providing a bias voltage compensated for p-channel transistor variations
EP0765037A3 (de) * 1995-09-20 1998-01-14 Texas Instruments Incorporated Puffer für integrierte Speicherschaltungen
US5856753A (en) * 1996-03-29 1999-01-05 Cypress Semiconductor Corp. Output circuit for 3V/5V clock chip duty cycle adjustments
US5838191A (en) * 1997-02-21 1998-11-17 National Semiconductor Corporation Bias circuit for switched capacitor applications

Also Published As

Publication number Publication date
EP1246366A2 (de) 2002-10-02
US6437622B1 (en) 2002-08-20
EP1246366A3 (de) 2002-10-16
JP2002353803A (ja) 2002-12-06
EP1246366B1 (de) 2010-08-18

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