DE60236925D1 - Vorrichtung zur abtastung eines elektrischen hochfrequenzsignals - Google Patents

Vorrichtung zur abtastung eines elektrischen hochfrequenzsignals

Info

Publication number
DE60236925D1
DE60236925D1 DE60236925T DE60236925T DE60236925D1 DE 60236925 D1 DE60236925 D1 DE 60236925D1 DE 60236925 T DE60236925 T DE 60236925T DE 60236925 T DE60236925 T DE 60236925T DE 60236925 D1 DE60236925 D1 DE 60236925D1
Authority
DE
Germany
Prior art keywords
testing
frequency signal
electric high
electric
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60236925T
Other languages
English (en)
Inventor
Anne Ghis
Patrice Ouvrier-Buffet
Nathalie Rolland
Aziz Benlarbi-Delai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE60236925D1 publication Critical patent/DE60236925D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0053—Noise discrimination; Analog sampling; Measuring transients

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
DE60236925T 2001-05-15 2002-05-13 Vorrichtung zur abtastung eines elektrischen hochfrequenzsignals Expired - Lifetime DE60236925D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0106365A FR2824969B1 (fr) 2001-05-15 2001-05-15 Dispositif d'echantillonnage de signal electrique haute frequence
PCT/FR2002/001597 WO2002093182A1 (fr) 2001-05-15 2002-05-13 Dispositif d'echantillonnage de signal electrique haute frequence

Publications (1)

Publication Number Publication Date
DE60236925D1 true DE60236925D1 (de) 2010-08-19

Family

ID=8863276

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60236925T Expired - Lifetime DE60236925D1 (de) 2001-05-15 2002-05-13 Vorrichtung zur abtastung eines elektrischen hochfrequenzsignals

Country Status (5)

Country Link
US (1) US6954087B2 (de)
EP (1) EP1390769B1 (de)
DE (1) DE60236925D1 (de)
FR (1) FR2824969B1 (de)
WO (1) WO2002093182A1 (de)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2157519A (en) * 1984-04-14 1985-10-23 Coorosh Sabet A sample and hold circuit
US4825103A (en) * 1987-04-14 1989-04-25 Hewlett-Packard Company Sample-and-hold circuit
EP0522578A3 (en) * 1991-07-12 1993-06-16 Pioneer Electronic Corporation Noise removing circuit
JPH05182489A (ja) * 1991-12-26 1993-07-23 Nippon Telegr & Teleph Corp <Ntt> フォトコンダクティブ・サンプル・ホールド回路
US5471162A (en) * 1992-09-08 1995-11-28 The Regents Of The University Of California High speed transient sampler
US5481212A (en) * 1993-03-12 1996-01-02 Kabushiki Kaisha Toshiba Sample-and-hold circuit device
FR2764070B1 (fr) 1997-05-28 1999-07-02 Commissariat Energie Atomique Echantillonneur electrique monocoup pour impulsions courtes
US6654469B1 (en) * 1999-06-28 2003-11-25 Lucent Technologies Inc. Methods and devices for reducing sampling noise in analog signals using linear interpolation
US6529049B2 (en) * 2001-05-10 2003-03-04 National Semiconductor Corporation Pre-charged sample and hold

Also Published As

Publication number Publication date
WO2002093182A1 (fr) 2002-11-21
EP1390769B1 (de) 2010-07-07
FR2824969A1 (fr) 2002-11-22
FR2824969B1 (fr) 2004-04-02
EP1390769A1 (de) 2004-02-25
US20040145391A1 (en) 2004-07-29
US6954087B2 (en) 2005-10-11

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