DE60236337D1 - System zur Messung von Phasendifferenzen von reflektierten Lichtsignalen - Google Patents

System zur Messung von Phasendifferenzen von reflektierten Lichtsignalen

Info

Publication number
DE60236337D1
DE60236337D1 DE60236337T DE60236337T DE60236337D1 DE 60236337 D1 DE60236337 D1 DE 60236337D1 DE 60236337 T DE60236337 T DE 60236337T DE 60236337 T DE60236337 T DE 60236337T DE 60236337 D1 DE60236337 D1 DE 60236337D1
Authority
DE
Germany
Prior art keywords
reflected light
light signals
phase differences
measuring phase
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60236337T
Other languages
German (de)
English (en)
Inventor
Steve W Meeks
Rusmin Kudinar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CANDELA INSTR FREMONT
Original Assignee
CANDELA INSTR FREMONT
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/818,199 external-priority patent/US20020015146A1/en
Priority claimed from US09/861,280 external-priority patent/US6757056B1/en
Application filed by CANDELA INSTR FREMONT filed Critical CANDELA INSTR FREMONT
Application granted granted Critical
Publication of DE60236337D1 publication Critical patent/DE60236337D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
    • H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
DE60236337T 2001-03-26 2002-03-25 System zur Messung von Phasendifferenzen von reflektierten Lichtsignalen Expired - Lifetime DE60236337D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/818,199 US20020015146A1 (en) 1997-09-22 2001-03-26 Combined high speed optical profilometer and ellipsometer
US09/861,280 US6757056B1 (en) 2001-03-26 2001-05-18 Combined high speed optical profilometer and ellipsometer

Publications (1)

Publication Number Publication Date
DE60236337D1 true DE60236337D1 (de) 2010-06-24

Family

ID=27124244

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60236337T Expired - Lifetime DE60236337D1 (de) 2001-03-26 2002-03-25 System zur Messung von Phasendifferenzen von reflektierten Lichtsignalen

Country Status (4)

Country Link
EP (1) EP1245922B1 (https=)
JP (1) JP4008730B2 (https=)
AT (1) ATE467810T1 (https=)
DE (1) DE60236337D1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6798512B2 (en) 2001-08-09 2004-09-28 Therma-Wave, Inc. Multiple beam ellipsometer
US7224471B2 (en) * 2003-10-28 2007-05-29 Timbre Technologies, Inc. Azimuthal scanning of a structure formed on a semiconductor wafer
SE525206C2 (sv) * 2003-11-17 2004-12-28 Optonova Ab Förfarande och anordning för beröringsfri avsyning och inmätning av ytegenskaper och ytdefekter på en materialyta
JP4748353B2 (ja) * 2005-08-04 2011-08-17 大日本印刷株式会社 異物検査装置
DE102007043937B4 (de) * 2006-09-13 2010-10-07 Innovent E.V. Verfahren zur Bestimmung der Dicke und des Brechungsindex von optisch transparenten Schichten auf optisch transparenten planparallelen Substraten
SG152187A1 (en) 2007-10-25 2009-05-29 Asml Netherlands Bv Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
CN102192882B (zh) * 2011-03-11 2013-01-09 山东大学 利用锁相放大器进行磁光椭偏测量的测量方法
US12416580B2 (en) 2018-05-07 2025-09-16 Unm Rainforest Innovations Method and system for in-line optical scatterometry
US11473901B2 (en) 2018-05-29 2022-10-18 Hitachi High-Tech Corporation Height measurement device in which optical paths projected on the sample at different incidence angles
US11043239B2 (en) 2019-03-20 2021-06-22 Kla Corporation Magneto-optic Kerr effect metrology systems
US12399120B2 (en) 2019-11-01 2025-08-26 Unm Rainforest Innovations In-line angular optical multi-point scatterometry for nanomanufacturing systems
CN115388765B (zh) * 2022-08-10 2023-10-24 睿励科学仪器（上海）有限公司 用于椭偏量测系统的自动聚焦装置
JP2025044916A (ja) * 2023-09-20 2025-04-02 株式会社Ｓｃｒｅｅｎホールディングス 観察装置、観察方法および基板処理装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4585348A (en) * 1981-09-28 1986-04-29 International Business Machines Corporation Ultra-fast photometric instrument
US4674875A (en) 1983-12-09 1987-06-23 Hitachi, Ltd. Method and apparatus for inspecting surface defects on the magnetic disk file memories
US4906844A (en) * 1988-08-12 1990-03-06 Rockwell International Corporation Phase sensitive optical monitor for thin film deposition
JP3140664B2 (ja) 1995-06-30 2001-03-05 松下電器産業株式会社 異物検査方法及び装置
US5694214A (en) 1996-01-08 1997-12-02 Hitachi Electronics Engineering Co., Ltd. Surface inspection method and apparatus
NL1006016C2 (nl) * 1997-05-09 1998-11-10 Univ Delft Tech Ellipsometer met twee lasers.
JPH112512A (ja) 1997-06-11 1999-01-06 Super Silicon Kenkyusho:Kk ウェーハの光学式形状測定器
US6134011A (en) 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
US6157444A (en) 1997-11-28 2000-12-05 Hitachi, Ltd. Defect inspection apparatus for silicon wafer

Also Published As

Publication number Publication date
EP1245922A1 (en) 2002-10-02
ATE467810T1 (de) 2010-05-15
JP2002365232A (ja) 2002-12-18
JP4008730B2 (ja) 2007-11-14
EP1245922B1 (en) 2010-05-12

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