DE60222086D1 - Bildsensormatrix für zur Korrektion krummliniger Verzerrung eines Kamera-Linsensystems und dessen Verfahren zur Herstellung - Google Patents

Bildsensormatrix für zur Korrektion krummliniger Verzerrung eines Kamera-Linsensystems und dessen Verfahren zur Herstellung

Info

Publication number
DE60222086D1
DE60222086D1 DE60222086T DE60222086T DE60222086D1 DE 60222086 D1 DE60222086 D1 DE 60222086D1 DE 60222086 T DE60222086 T DE 60222086T DE 60222086 T DE60222086 T DE 60222086T DE 60222086 D1 DE60222086 D1 DE 60222086D1
Authority
DE
Germany
Prior art keywords
correcting
manufacture
image sensor
lens system
camera lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60222086T
Other languages
English (en)
Other versions
DE60222086T2 (de
Inventor
Gary B Gordon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aptina Imaging Corp
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60222086D1 publication Critical patent/DE60222086D1/de
Application granted granted Critical
Publication of DE60222086T2 publication Critical patent/DE60222086T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14806—Structural or functional details thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/61—Noise processing, e.g. detecting, correcting, reducing or removing noise the noise originating only from the lens unit, e.g. flare, shading, vignetting or "cos4"
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/702—SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE60222086T 2002-01-31 2002-09-25 Bildsensormatrix für zur Korrektion krummliniger Verzerrung eines Kamera-Linsensystems und dessen Verfahren zur Herstellung Expired - Lifetime DE60222086T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/062,695 US20030141433A1 (en) 2002-01-31 2002-01-31 Solid state image sensor array for correcting curvilinear distortion of a camera lens system and method for fabricating the image sensor array
US62695 2002-01-31

Publications (2)

Publication Number Publication Date
DE60222086D1 true DE60222086D1 (de) 2007-10-11
DE60222086T2 DE60222086T2 (de) 2008-04-30

Family

ID=22044198

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60222086T Expired - Lifetime DE60222086T2 (de) 2002-01-31 2002-09-25 Bildsensormatrix für zur Korrektion krummliniger Verzerrung eines Kamera-Linsensystems und dessen Verfahren zur Herstellung

Country Status (5)

Country Link
US (1) US20030141433A1 (de)
EP (1) EP1333498B1 (de)
JP (1) JP4811625B2 (de)
DE (1) DE60222086T2 (de)
TW (1) TW595216B (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW576088B (en) * 2002-07-12 2004-02-11 Veutron Corp Optical sensor device for receiving light signal
US8681224B2 (en) 2007-06-26 2014-03-25 Dublin City University Method for high precision lens distortion calibration and removal
US8077235B2 (en) * 2008-01-22 2011-12-13 Palo Alto Research Center Incorporated Addressing of a three-dimensional, curved sensor or display back plane
US20090278977A1 (en) * 2008-05-12 2009-11-12 Jin Li Method and apparatus providing pre-distorted solid state image sensors for lens distortion compensation
US8654215B2 (en) 2009-02-23 2014-02-18 Gary Edwin Sutton Mobile communicator with curved sensor camera
US8836805B2 (en) * 2012-07-17 2014-09-16 Gary Edwin Sutton Curved sensor system
US8248499B2 (en) * 2009-02-23 2012-08-21 Gary Edwin Sutton Curvilinear sensor system
JP2010278295A (ja) * 2009-05-29 2010-12-09 Nec Toshiba Space Systems Ltd 撮像装置及び撮像素子の配置方法
PT2742484T (pt) 2011-07-25 2017-01-02 Univ De Coimbra Método para alinhamento e rastreamento de regiões de pontos em imagens com distorção radial, que produz parâmetros de modelo de movimento, calibração de distorção e variação de zoom
ITTO20130683A1 (it) 2013-08-08 2015-02-09 Sisvel Technology Srl Apparato e metodo per la correzione delle deformazioni prospettiche delle immagini
CN105245765A (zh) * 2015-07-20 2016-01-13 联想(北京)有限公司 图像传感阵列及其排布方法、图像采集部件、电子设备
JP7297412B2 (ja) * 2018-06-13 2023-06-26 キヤノン株式会社 画像処理装置、画像処理方法、およびレンズ装置
CN115782180A (zh) * 2023-01-20 2023-03-14 杭州爱新凯科技有限公司 一种线阵激光打印图像变形矫正方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01119178A (ja) * 1987-10-30 1989-05-11 Nikon Corp 撮像装置
JPH07240877A (ja) * 1994-02-28 1995-09-12 Mitsubishi Electric Corp 固体撮像装置
US5489940A (en) * 1994-12-08 1996-02-06 Motorola, Inc. Electronic imaging system and sensor for correcting the distortion in a wide-angle lens
US5786804A (en) * 1995-10-06 1998-07-28 Hewlett-Packard Company Method and system for tracking attitude
EP0786814A1 (de) * 1996-01-26 1997-07-30 Hewlett-Packard Company Photodetektor-Matrix mit Kompensation von Abbildungsfehlern und ungleichmässiger Beleuchtung
JP3461275B2 (ja) * 1997-12-25 2003-10-27 キヤノン株式会社 光電変換装置及びこれを用いたカメラ
US6563101B1 (en) * 2000-01-19 2003-05-13 Barclay J. Tullis Non-rectilinear sensor arrays for tracking an image
JP3728217B2 (ja) * 2000-04-27 2005-12-21 キヤノン株式会社 荷電粒子線露光装置およびデバイス製造方法
US20040012698A1 (en) * 2001-03-05 2004-01-22 Yasuo Suda Image pickup model and image pickup device

Also Published As

Publication number Publication date
JP2003229563A (ja) 2003-08-15
EP1333498A3 (de) 2005-05-04
TW595216B (en) 2004-06-21
DE60222086T2 (de) 2008-04-30
JP4811625B2 (ja) 2011-11-09
EP1333498B1 (de) 2007-08-29
US20030141433A1 (en) 2003-07-31
EP1333498A2 (de) 2003-08-06

Similar Documents

Publication Publication Date Title
DE60222086D1 (de) Bildsensormatrix für zur Korrektion krummliniger Verzerrung eines Kamera-Linsensystems und dessen Verfahren zur Herstellung
DE502005004871D1 (de) Bildaufnehmermodul sowie Verfahren zum Zusammenbauen eines Bildaufnehmermoduls
DE60308739D1 (de) Technik zur automatischen Bildqualitätsbewertung und -korrektion
AU2003237354A1 (en) Method and apparatus for real time identification and correction of pixel defects for image sensor arrays
DE69938708D1 (de) Verfahren zur Kompensation der Bildfarbe bei Kontrasteinstellung eines digitalen Farbbildes
DE60323401D1 (de) Verfahren zur anzeige eines digital erfassten bildes
DE602005021088D1 (de) Verfahren zur herstellung eines quartz-sensorsystems
DE60334275D1 (de) Methode und System zur Einteilung eines Schaltkreises für optische Näherungseffektkorrekturen
DE60229206D1 (de) Verfahren und Vorrichtung zur Bild- und Videoanzeige
DE59912614D1 (de) Verfahren zur Korrektur nichtrotationssymmetrischer Bildfehler
DE60330524D1 (de) Verfahren zur Korrektur von satellitenerfassten Bildern
DE50007700D1 (de) Verfahren zur korrektur eines winkelfehlers eines absolutwinkelgebers
DE60201368D1 (de) Bildaufnahmegerät und Verfahren zu dessen Herstellung
DE60321510D1 (de) Vorrichtung zur Kompensation nonlinearer Verzerrung
DE60319678D1 (de) Festkörper-Bildaufnahmevorrichtung und Verfahren zu dessen Herstellung
AU2003212309A8 (en) Moire method and measuring system for measuring the distortion of an optical imaging system
DE60320461D1 (de) Haftklebeband und verfahren zur linsenformbearbeitung
DE60302388D1 (de) Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
DE60319095D1 (de) Verfahren zur Verzerrungskorrektur von Multifokus-Bilderstapeln
DE602004022482D1 (de) Vorrichtung und Verfahren zur Bildfehlerkorrektur
DE69501432D1 (de) Verfahren zur Herstellung eines Festkörperbildsensors
DE602004030101D1 (de) Verfahren zur herstellung eines kompakten optischen abbildungssystem mit grossem blickfeld
DE602006011645D1 (de) Verfahren und einrichtung zur codierung eines videobildes
DE60226552D1 (de) Verfahren zur Herstellung eines Bildanzeigegeräts
DE50015118D1 (de) Verfahren zur Farbanpassung eines Röntgenbildes

Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US

8328 Change in the person/name/address of the agent

Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER & ZINKLER, 82049 P

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY